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BenchVue Software Videos
Agilent BenchVue software for the PC accelerates your testing by providing intuitive, multiple instrument measurement visibility and data capture with no programming.

Demo 2014-02-18

Agilent Technologies and FIME to Deliver Advanced Test Tools for Mobile Payments
Agilent Technologies Inc. (NYSE: A) and FIME, an advanced secure-chip testing provider, have announced an agreement to work together to deliver pioneering testing solutions to the payments and telecommunications markets.

Press Materials 2014-02-18

Touchstone v2.0 SI/PI S-Parameter Models for Simultaneous Switching Noise (SSN) Analysis of DDR4
This paper presents a methodology to setup and analyze Simultaneous Switching Noise for DDR4 applications using Touchstone v2.0 models.

Article 2014-02-18

PDF PDF 8.07 MB
IBIS AMI Modeling of Retimer and Performance Analysis of Retimer based Active Serial Links
This paper presents a novel retimer modeling approach based on IBIS-AMI to capture the performance of a retimer that operates up to 15 Gbps.

Article 2014-02-18

PDF PDF 1.78 MB
LTE-Advanced Carrier Aggregation for High-Speed IP Data Throughput
LTE-A Carrier Aggregation is rapidly emerging as the technology that will bring about a significant improvement in the user experience by delivering a much higher level of data throughput performance.

Demo 2014-02-18

Tips and Advanced Techniques for Characterizing a 28 Gb/s Transceiver
This paper shows the right combination of measurement and simulation techniques, and how the previously existing barriers for using de-embedding have been eliminated.

Article 2014-02-18

PDF PDF 3.82 MB
Mechanism of Jitter Amplification in Clock Channels
In this paper. jitter amplification in clock channels is analyzed analytically using the techniques developed in "Frequency domain analysis of jitter amplification in clock channels."

Article 2014-02-18

PDF PDF 671 KB
LTE-A Carrier Aggregation Demonstrations
LTE-A Carrier Aggregation Demonstrations

Demo 2014-02-18

Rapid Mechanical Properties of Multi-layer Film Stacks - Application Note
In this note, we measure the mechanical properties of 50nm films with remarkable precision and accuracy. The precision is due to Express Test, which performs indentations at a rate of one per second, thereby allowing many indentations to be included in the final determination of modulus and hardness.

Application Note 2014-02-17

PDF PDF 2.29 MB
Agilent Medalist i3070 08.40p Software Release
Agilent Medalist i3070 08.40p software can be installed on testheads and test development stations with Windows 7 (32- bit and 64- bit) and Windows XP operating systems.

Release Notes 2014-02-17

Agilent Medalist i3070 08.40p Software Release notes
Release notes

Reference Guide 2014-02-17

PDF PDF 1.70 MB
E5061B Network Analyzer Data Sheet
This literature is a data sheet of the E5061B. It describes the technical specifications of the E5061B.

Data Sheet 2014-02-17

Infiniium MSOX90000 Series versus Tektronix MSO70000C/DX Series - Competitive Comparison
See a quick comparison of Agilent's Infiniium MSOX90000 Series against the Tektronix MSO70000C Series oscilloscopes.

Competitive Comparison 2014-02-15

PDF PDF 1015 KB
N9069A & W9069A Noise Figure X-Series Measurement Application - Technical Overview
An overview of the noise figure measurement application (N9069A & W9069A) for the X-Series signal analyzers and EMI receiver.

Technical Overview 2014-02-14

High performance Digitizers for RF Wideband Aerospace/Defense Measurements – Guzik Test & Measuremen
High performance Digitizers for RF Wideband Aerospace/Defense Measurements from Guzik Test & Measurement and Agilent

Solution Brief 2014-02-14

Noise Figure Selection Guide Minimizing the Uncertainties - Selection Guide
This selection guide, which includes a brief noise figure primer and our current product lineup, and is designed to help you find the best solution for your application.

Selection Guide 2014-02-14

U2020 X-Series USB Sensor Uncertainty Calculator - Application Note
Measurement Uncertainty Calculator for U2020 X-Series.

Application Note 2014-02-14

XLS XLS 22 KB
Solutions for Millimeter Wave Wireless Backhaul - Application Note
This “Solutions for Millimeter Wave Wireless Backhaul” app note gives insight into designing and testing E-band backhaul using effective network analysis, and signal generation and analysis solutions.

Application Note 2014-02-14

PCIe Gen3 Exerciser Software Release Notes (Version 8.72)
Release notes for the PCIe Gen3 exerciser software.

Release Notes 2014-02-14

PDF PDF 532 KB
NFA Series Noise Figure Analyzer - Configuration Guide
This configuration guide provides specifications for the NFA Series noise figure analyzers.

Configuration Guide 2014-02-14

PDF PDF 1.92 MB
V9060B IQ Analyzer User's and Programmer's Reference for E6640A
User's information for the IQ Analyzer mode of the Agilent E6640A EXM Wireless Test Set.

User Manual 2014-02-14

PDF PDF 5.33 MB
Release Note for 2.5.1351.6139
Release Note for 2.5.1351.6139

Release Notes 2014-02-14

TXT TXT 7 KB
U2000 and U8480 Series USB sensor measurement uncertainty calculator
Measurement Uncertainty Calculator for the U2000 series USB sensors (U2000A, U2001A, U2002A, U2004A, U2000B, U2000H, U2001B, U2001H, U2002H) and U8480 series USB sensors (U8481A, U8485A, U8487A, U8488A)

Application Note 2014-02-14

XLS XLS 93 KB
ESA-E Series Spectrum Analyzer - Data Sheet
The general-purpose ESA-E Series spectrum analyzer can be used for a wide range of applications from aerospace defense to the manufacturing line. Frequency, amplitude and general specs are provided.

Data Sheet 2014-02-14

PDF PDF 1002 KB
30 Things Only Infiniium Oscilloscopes Can Do - Brochure
Could your user interface use an upgrade? Discover the 30 things your oscilloscope user interface should be able to do.

Brochure 2014-02-14

PDF PDF 6.61 MB

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