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5DX Operator Training
The Agilent 5DX is one of the most advanced test systems on the planet. Here's where you'll get the baseline skills you need to use it productively.

Classroom Training

5DX Series 5000 - Archived Event and Seminar Material

Webcast - recorded

5DX Test Developer
Lecture and Lab

Classroom Training

5DX Version 8.0 Incremental Training
Version 8.0 software for the 5DX contains many new features and introduces significant changes to the use model for programming. This class will help you get up and running quickly.

Training Materials 2001-05-21

PDF PDF 871 KB
60 GHz Power Amplifier Design for Wireless HDMI
Originally broadcast Oct 13, 2009 - Access the .pdf file of the presentation

Webcast - recorded

60 GHz Power Amplifier Design for Wireless HDMI (WPAN)
IMS 2010 MicroApps presentation by Michael Thompson, Agilent Technologies and Ken Mays, TriQuint Semiconductor.

Seminar Materials 2010-05-26

PDF PDF 2.15 MB
60GHz Power Amplifier Design for Wireless HDMI
Recorded webcast presented by Michael Thompson, Applications Engineer, Agilent Technologies.

Seminar Materials 2009-10-13

802.11ac WLAN - Channel bandwidth power measurement application using Agilent 8990B PPA
This web seminar shows you how the Agilent 8990B peak power analyzer can be used for 802.11ac testing WLAN transmitter testing.

Webcast - recorded

86100C/83496B and E5052B SSA-J Phase Noise e-Seminar
You've Measured The Jitter, Now How Do You Reduce It? (1 hour, recorded April 26, 2007)

Seminar Materials 2007-04-26

89600 Series Vector Signal Analyzer Basics
This is a complete course on the theory and operation of the 89600 series Vector Signal Analyzer (VSA), including an understanding of frequency, time, and modulation domain measurements.

Classroom Training

89600 Vector Signal Analyzer Course
This course is recommended to first-time users of the 89600 Vector Signal Analyzer.

Classroom Training

8x8 MIMO and Carrier Aggregation Test Challenges for LTE Webcast
Original broadcast April 25, 2013

Webcast - recorded

8x8 MIMO and Carrier Aggregation Test Challenges for LTE Webcast Slides
Slides from the April 25, 2013 webcast

Seminar Materials 2013-04-25

PDF PDF 1.62 MB
A Design-to-Test Methodology for SDR and Cognitive Radio
This presentation discusses how to mitigate risks inherent in SDR development and improve the design and test process by combining FPGAs and RF, in order to take full advantage of an SDR's flexibility.

Seminar Materials 2010-10-14

PDF PDF 2.79 MB
A Faster and Effective RF Module/LTCC Design Flow with AMC
This Presentation details why Electro-Magnetic (EM) Simulation for RF Module/LTCC is required and usage of Advanced Model Composer (AMC) for faster and effective RF Module/LTCC Design Flow.

Seminar Materials 2007-11-15

PDF PDF 3.07 MB
A Model-Based Approach for System-Level RFIC Verification
A new approach for verifying system-level behavior of a modern RFIC.

Seminar Materials 2011-07-07

PDF PDF 1.70 MB
A Multi-Level Conductor Surface Roughness Model
IMS 2011 MicroApps paper presented by Yunhui Chu, Amalok Badesha, Jing-Jiang Yu and Sammy Hindi.

Seminar Materials 2011-06-05

PDF PDF 664 KB
A New Circuit Design Methodology for CMOS Transceiver LSI Designs, using Agilent GoldenGate
A Toshiba Case Study from the Agilent EDA Forum 2008.

Seminar Materials 2008-12-18

PDF PDF 1.89 MB
A Practical Approach to Verifying RFICs with Fast Mismatch Analysis
Originally broadcast October 28, 2010

Webcast - recorded

A Practical Approach to Verifying RFICs with Fast Mismatch Analysis
IMS 2011 presentation on eliminating traditional simulation bottlenecks while gaining new insights.

Seminar Materials 2011-05-24

PDF PDF 476 KB
A Scalable Model Generation Methodology of Bipolar Transistors for RF IC Design
This paper was presented at the 2001 IEEE Bipolar/BICMOS Circuits and Technology Meeting, Minneapolis, Minnesota, USA, 2 October 2001 presents a scalable Model Generation methodology of Bipolar Transistors.

Seminar Materials 2001-10-01

A Simplified Extension of X-parameters to Describe Memory Effects for Wideband Modulated Signals
IMS 2010 MicroApps presentation by Jan Verspecht, Jason Horn and David E. Root.

Seminar Materials 2010-05-26

PDF PDF 618 KB
A Survey of Load Pull Simulation Capabilities
IMS 2010 MicroApps presentation that describes how load pull simulation can help you design power amplifiers.

Seminar Materials 2010-05-19

PDF PDF 663 KB
A User Bead Probe Experience and Evaluation with a Flying Probe Tester – Shuichi Kameyama, Fujitsu

Training Materials 2008-09-16

PDF PDF 1.08 MB
Abstract of paper 1 - Value of Vector
Abstract of paper 1 - Value of Vector

Seminar Materials 2005-03-14

PDF PDF 75 KB

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