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5990-3764EN_femtocell_final
5990-3764EN_femtocell_final.pdf

Présentation de séminaire 2009-04-29

PDF PDF 519 KB
5DX AXI versus x6000 AXI Performance – Matt Vandiver, Flextronics

Matériel de formation 2007-11-13

PDF PDF 1.23 MB
5DX Image Interpretation Training
Interpreting X-ray images and defect calls can be tricky, especially for operators who are new to automated X-ray inspection (AXI) technology.

Formation en classe

5DX Operator Training
The Agilent 5DX is one of the most advanced test systems on the planet. Here's where you'll get the baseline skills you need to use it productively.

Formation en classe

5DX Series 5000 - Archived Event and Seminar Material

Webcast - enregistré

5DX Test Developer
Lecture and Lab

Formation en classe

5DX Version 8.0 Incremental Training
Version 8.0 software for the 5DX contains many new features and introduces significant changes to the use model for programming. This class will help you get up and running quickly.

Matériel de formation 2001-05-21

PDF PDF 871 KB
60 GHz Power Amplifier Design for Wireless HDMI
Originally broadcast Oct 13, 2009 - Access the .pdf file of the presentation

Webcast - enregistré

60 GHz Power Amplifier Design for Wireless HDMI (WPAN)
IMS 2010 MicroApps presentation by Michael Thompson, Agilent Technologies and Ken Mays, TriQuint Semiconductor.

Présentation de séminaire 2010-05-26

PDF PDF 2.15 MB
60GHz Power Amplifier Design for Wireless HDMI
Recorded webcast presented by Michael Thompson, Applications Engineer, Agilent Technologies.

Présentation de séminaire 2009-10-13

802.11ac WLAN - Channel bandwidth power measurement application using Agilent 8990B PPA
This web seminar shows you how the Agilent 8990B peak power analyzer can be used for 802.11ac testing WLAN transmitter testing.

Webcast - enregistré

86100C/83496B and E5052B SSA-J Phase Noise e-Seminar
You've Measured The Jitter, Now How Do You Reduce It? (1 hour, recorded April 26, 2007)

Présentation de séminaire 2007-04-26

89600 Series Vector Signal Analyzer Basics
This is a complete course on the theory and operation of the 89600 series Vector Signal Analyzer (VSA), including an understanding of frequency, time, and modulation domain measurements.

Formation en classe

89600 Vector Signal Analyzer Course
This course is recommended to first-time users of the 89600 Vector Signal Analyzer.

Formation en classe

8x8 MIMO and Carrier Aggregation Test Challenges for LTE Webcast
Original broadcast April 25, 2013

Webcast - enregistré

8x8 MIMO and Carrier Aggregation Test Challenges for LTE Webcast Slides
Slides from the April 25, 2013 webcast

Présentation de séminaire 2013-04-25

PDF PDF 1.62 MB
A Design-to-Test Methodology for SDR and Cognitive Radio
This presentation discusses how to mitigate risks inherent in SDR development and improve the design and test process by combining FPGAs and RF, in order to take full advantage of an SDR's flexibility.

Présentation de séminaire 2010-10-14

PDF PDF 2.79 MB
A Faster and Effective RF Module/LTCC Design Flow with AMC
This Presentation details why Electro-Magnetic (EM) Simulation for RF Module/LTCC is required and usage of Advanced Model Composer (AMC) for faster and effective RF Module/LTCC Design Flow.

Présentation de séminaire 2007-11-15

PDF PDF 3.07 MB
A Model-Based Approach for System-Level RFIC Verification
A new approach for verifying system-level behavior of a modern RFIC.

Présentation de séminaire 2011-07-07

PDF PDF 1.70 MB
A Multi-Level Conductor Surface Roughness Model
IMS 2011 MicroApps paper presented by Yunhui Chu, Amalok Badesha, Jing-Jiang Yu and Sammy Hindi.

Présentation de séminaire 2011-06-05

PDF PDF 664 KB
A New Circuit Design Methodology for CMOS Transceiver LSI Designs, using Agilent GoldenGate
A Toshiba Case Study from the Agilent EDA Forum 2008.

Présentation de séminaire 2008-12-18

PDF PDF 1.89 MB
A Practical Approach to Verifying RFICs with Fast Mismatch Analysis
Originally broadcast October 28, 2010

Webcast - enregistré

A Practical Approach to Verifying RFICs with Fast Mismatch Analysis
IMS 2011 presentation on eliminating traditional simulation bottlenecks while gaining new insights.

Présentation de séminaire 2011-05-24

PDF PDF 476 KB
A Scalable Model Generation Methodology of Bipolar Transistors for RF IC Design
This paper was presented at the 2001 IEEE Bipolar/BICMOS Circuits and Technology Meeting, Minneapolis, Minnesota, USA, 2 October 2001 presents a scalable Model Generation methodology of Bipolar Transistors.

Présentation de séminaire 2001-10-01

A Simplified Extension of X-parameters to Describe Memory Effects for Wideband Modulated Signals
IMS 2010 MicroApps presentation by Jan Verspecht, Jason Horn and David E. Root.

Présentation de séminaire 2010-05-26

PDF PDF 618 KB

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