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Electronic Measurement

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USB 3.0 SuperSpeed Design and Testing Challenges
This webcast will discuss some of the major questions SuperSpeed USB 3.0 product developers may have regarding USB 3.0 design and testing challenges. Common compliance testing pitfalls will also be reviewed.

Webcast - recorded

Innovations in EDA: X-Parameter* Case Study: GaN High Power Amplifier (HPA) Design
Originally broadcast Jan 11, 2011

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Conquering the High Power Source-Sink Test Challenge Webcast
Original broadcast June 18, 2014

Webcast - recorded

Innovations in EDA Webcast: RF System Architecture - Techniques for Optimal Design
Original broadcast Jan 12, 2012

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Fundamentals of Semiconductor Capacitance Measurement Webcast
Original broadcast October 29, 2013

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How to Verify Your LTE MAC and RF Interactions
Original broadcast Nov 16, 2011

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Overcome LTE-A UE Design Test Challenges with Agilent’s New UXM
Original broadcast February 13, 2014

Webcast - recorded

Debugging automotive serial buses using an Agilent InfiniiVision Series oscilloscope (Italiano)
We will give an overview of the timing and protocol structure of the LIN, CAN and FlexRay buses. We will show Agilent’s Hardware based decoding to capture random errors and time-correlate data transfer information with the physical layer.

Webcast - recorded

Simultaneous Switching Noise Analysis in DDR4 applications using Power-Aware IBIS Models Webcast
Original broadcast May 22, 2014

Webcast - recorded

The road to 4G IMT-Advanced and LTE-Advanced
The road to 4G IMT-Advanced and LTE-Advanced

Webcast - recorded

Integrated Electro-Thermal Solution Delivers Thermally Aware Circuit Simulation
Original broadcast October 4, 2012

Webcast - recorded

Debug Digital Designs Faster with Advanced Parametric Triggering
Advanced parametric triggering can help synchronize oscilloscope acquisitions and display complex signal activity. Find signal parametric violation conditions such as setup & hold, edge speed, pulse amplitude (runts), pulse width violations, etc.

Webcast - recorded

FieldFox Webcast Series: Precision Validation of Radar System Performance in the Field
Original broadcast January 14, 2014

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Multi-Signal, Multi-Format Analysis with the 89600 VSA
Original broadcast Apr 25, 2012

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Assembled PCB Inspection: SJ Family - Archived Event and Seminar Material

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Beyond CMOS vs. GaAs – Finding the Best Technology Mix for a Handset PA Webcast
Original broadcast June 13, 2013

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Moving forward to LTE-Advanced with Heterogeneous Networks
Original broadcast on January 24, 2013

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Eliminate the need for cumbersome multi-instruments setups for stress testing devices
EMEA web seminar - Eliminate the need for cumbersome multi-instruments setups for stress testing devices

Webcast - recorded

Simulating Power Transients and Noise
Original broadcast Jun 21, 2012

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Innovations in EDA: Applying the Latest Technologies to MMIC Design
Original broadcast Nov 11, 2010

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Navigating Compliance Standards Panel Discussion
Original broadcast July 17, 2013

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IEEE 802.11ad PHY Layer Testing
This web seminar will start with a brief tutorial introduction to the IEEE 802.11ad PHY layer. We will then review a variety of modulation analysis measurements and consider what can each of them tell us about the device under test.

Webcast - recorded

Debugging Serial Buses using an InfiniiVision Series Oscilloscope
EMEA Web seminar - Debugging Serial Buses using an InfiniiVision Series Oscilloscope

Webcast - recorded

Millimeter Signal Measurements: Best Practices, Solutions, and Accuracy Webcast
Original broadcast Jan 26, 2012

Webcast - recorded

Techniques for Troubleshooting with a Logic Analyzer Webcast Series
Live Broadcasts various dates 2011

Webcast - recorded

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