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Test et mesure électronique
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Moving forward to LTE-Advanced with Heterogeneous Networks
Original broadcast on January 24, 2013
Webcast - enregistré |
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Moving to non-signaling manufacturing test for wireless devices
This web seminar discusses the requirements to effectively implement non-signaling test.
Webcast - enregistré |
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Moving to Non-Signaling Manufacturing Test for Wireless Devices Webcast
Original broadcast Feb 23, 2012
Webcast - enregistré |
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MSR Base Station Introduction and Measurement Challenges
Original broadcast June 28, 2012
Webcast - enregistré |
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Multi-Signal, Multi-Format Analysis with the 89600 VSA
Original broadcast Apr 25, 2012
Webcast - enregistré |
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N9038A MXE EMI Receiver - Expand Beyond Compliance Testing Webcast
Original broadcast Sept 28, 2011
Webcast - enregistré |
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N9038A MXE EMI Receiver – Expand beyond compliance testing
The new Agilent N9038A MXE is more than just a CISPR-compliant EMI receiver (CISPR 16-1-1 2010) up to 26.5GHz—it’s an X-Series signal analyzer that can run a variety of measurement applications and evolve as technology changes.
Webcast - enregistré |
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New Benchtop SMUs with Color GUI Meet Difficult Component Test Challenges
The B2900A series of SMU's provide a new high speed, cost effective measurement solution that significantly reduces test time and test cost.
Webcast - enregistré |
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New Benchtop SMUs with Color GUI Meet Difficult Component Test Challenges Webcast
Originally broadcast June 16, 2011
Webcast - enregistré |
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New challenges for UE Developers with Voice transport over LTE Webcast
Original broadcast Jan 24, 2012
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New High Speed DDR Probing and Analysis Tool
EMEA session - New High Speed DDR Probing and Analysis Tool
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New impedance measurement solutions & apps using 5 Hz to 3 GHz VNA
Originally broadcast April 19, 2011
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New impedance measurement solutions and applications using a Vector Network Analyzer - Web Seminar
This webcast focuses on impedance measurements, and presents what's new with and how to use the Vector Network Analyzer. We’ll provide tips for evaluating passive components used in electronic circuits / equipments, and characterizing power…
Webcast - enregistré |
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New Oscilloscope Capabilities for Upper-level EE Labs Webcast
Originally broadcast May 24, 2011
Webcast - enregistré |
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New Power Device Measurement Solutions (1500 A / 10 kV)
Original broadcast June 19, 2012
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Next Generation 802.11ac WLAN MIMO Design & Test Challenges
Original broadcast May 10, 2012
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NFC Test Challenges for Mobile Device Developers Webcast
Original broadcast February 26, 2013
Webcast - enregistré |
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Nonlinear characterisation and modeling through pulsed IV/S-parameters
This web seminar will put examples and discuss the design flow from Pulsed IV and Pulsed S-Parameters to Compact Transistor Models.
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Nonlinear Characterization and Modeling Through Pulsed IV/S-Parameters
Original broadcast Mar 27, 2012
Webcast - enregistré |
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Optimise UE design for greater battery run-time
This web seminar will discuss the challenges of verifying battery consumption during different UE operating modes and the tools available to measure the effects in power consumption.
Webcast - enregistré |
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Optimize Wireless Device Battery Run-time: Two Part Webcast Series
Original roadcasts Aug 22 & Sept 19, 2012
Webcast - enregistré |
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Optimizing Battery Operating Time of Wireless Devices
Original broadcast Aug 10, 2011
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Optimizing Battery Operating Time of Wireless Devices
This webcast will go on to discuss an Agilent exclusive feature called "seamless measurement ranging" which overcomes the limitations of traditional techniques for battery current drain testing.
Webcast - enregistré |
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Optimizing PXI Modular Functional Test System Throughput Webcast
Originally broadcast April 27, 2011
Webcast - enregistré |
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Oscilloscope Techniques for Precisely Measuring Small Signals Webcast
Original broadcast February 13, 2013
Webcast - enregistré |
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