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Reducing Load Time for Loaderless Systems
For Series 2L systems, it may be possible to reduce the time it takes to load a panel.

Application Note 1999-12-01

Printed Circuit Board Split-Pad Test Method and Design
This application note describes the split-pad concept for use with a bed of nails style test fixture.

Application Note 1999-06-01

PDF PDF 50 KB
Test Strategy for Complex Printed Circuit Board Assemblies
This paper proposes a new test strategy for complex boards since the trend in Printed Circuit Board Assembly (PCBA) technology is towards higher complexity.

Application Note 1999-02-22

PDF PDF 195 KB
Discreet Analog Device Testing
The Agilent 3070 series has quite a few built in features to make developing board tests easier, while protecting the operator, the board under test, and the 3070 itself from harm.

Application Note 1998-10-29

PDF PDF 26 KB
NDF and RTF - Hashed Names
There have been many questions about hashed directory names. This is a brief explanation of why they are, and how they are generated.

Application Note 1998-06-30

Boundary-Scan Technology, Justification, and Test Implementation for Designers
This paper provides practical insight for designers on the merits, design, and test implementation of Boundary-Scan Technology.

Application Note 1998-05-27

PDF PDF 29 KB
Effects of Lead Free Solders on Imaging Characteristics of the Agilent 5DX Laminographic X-ray Test
The electronics industry is under pressure to migrate solder processes away from the usage of eutectic tin-lead solder and towards utilization of lead-free compounds.

Application Note 1998-05-01

PDF PDF 83 KB
Boundary Scan Ground Bounce Suppression
Boundary-Scan circuitry, while in the process of testing interconnections, can set up and excite current surges on a board. This in turn can cause "ground bounce".

Application Note 1998-04-24

PDF PDF 14 KB
Fixture Interface Pin (MINT Pin) Maintenance
Fixture Interface Pins (MINT Pins) used in production testing will eventually get dirty enough to cause contact problems.

Application Note 1998-03-01

PDF PDF 20 KB
Use of the Test Results Command Processor
TRCMDPRO processes the results from the Agilent 5DX in a way that is specified by a command file. This file is TRCMDPRO.CMD. In addition to the software revisions named, the document applies to all 5DX software versions.

Application Note 1998-01-12

PDF PDF 20 KB
3070 Increasing Throughput
There are decisions one can make that causes an Agilent 3070 test program to be slower or faster than what Test Consultant generates automatically. This paper offers many tips about how to optimize your system's performance.

Application Note 1997-03-03

PDF PDF 41 KB
How To Float, or Series, Agilent 3070 DUT Supplies
The Agilent 3070 development software does an amazing job of calculating the wiring needed to build fixtures. Even so there are occasionally cases which require wiring that the standard Agilent 3070 software can not handle.

Application Note 1997-01-23

PDF PDF 34 KB
Selective Retrieval for Agilent 3070 Board Test Systems with UNIX Controllers
Most users are very diligent about backing-up their systems in the event of a catastrophic disk failure. Typically, you use SAM to set-up periodic automated backups or create a "crontab" entry to do this.

Application Note 1996-07-01

Using Pop-up Windows
There are occasions where the use of a pop-up window would be advantageous while testing boards on the Agilent 3070. This article is meant to highlight one method that can be used to obtain that end.

Application Note 1996-01-01

PDF PDF 18 KB
Essential Testability Guidelines for Current Technology
This paper addresses essential testability considerations, both electrical and mechanical, and focuses on new requirements of current technologies.

Application Note 1993-04-22

PDF PDF 55 KB

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