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- Application Notes (184)
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- Demos (1)
- Articles & Case Studies (3)
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76-100 of 201
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Maximizing System Throughput and Optimizing System Deployment (AN 1465-7)
Application Note 2004-12-21 |
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Choosing Your Test System Software Architecture (AN 1465-4)
Application Note 2004-12-21 |
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Choosing Your Test-System Hardware Architecture & Instrumentation (AN 1465-5)
Application Note 2004-12-21 |
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Test-System Understanding Drivers and Direct I/O (AN 1465-3) - Application Note
This application note answers common questions
about the use of drivers and direct I/O to send commands from a PC application to the test instrument.
Application Note 2004-12-21 |
PDF
374 KB
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Understanding the Effects of Racking & System Interconnections (AN 1465-6)
Application Note 2004-12-21 |
PDF
235 KB
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Innovative Power Supplies Save Rack Space
In the past, many programmable system DC power supplies in the medium power range (500W to 2kW) have been packaged in 2U-high (2-EIA rack units) and even 3U, full rack width chassis...
Application Note 2004-12-16 |
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Using SCPI and Direct I/O vs. Drivers (AN 1465-13) - Application Note
Using SCPI and Direct I/O vs. Drivers,
the fifth note in the series, outlines
the relationship between input/output (I/O) software, application software and the ability to maximize instrument interchange and software reuse in present and future systems
Application Note 2004-12-13 |
PDF
408 KB
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Test-System Computer I/O Considerations (AN 1465-2) - Application Note
The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing
Application Note 2004-12-09 |
PDF
189 KB
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Testing FPGullwing Misalignment Across the Pad
A technique is described which enables detection of misalignment of gullwing joints across the joint using duplicate components and FPGullwing Misalignment.
Application Note 2004-12-08 |
PDF
1.58 MB
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Handling Surface Mapping with Varying Board Construction
This paper describes a method for dealing with lot-to-lot or supplier-to-supplier variations in board construction. Often the variations in board construction result in different color boards which otherwise cause problems with surface mapping.
Application Note 2004-12-02 |
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1.02 MB
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Understanding the PCAP Polarity Reject Signal
This paper describes the algorithm used to determine if polarized capacitors are properly oriented.
Application Note 2004-12-02 |
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1.09 MB
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How and Why: Confirmation and Adjustments
This paper describes the process of and reason for periodic adjustment of a 5DX system using the confirmation and adjustment panel.
Application Note 2004-12-01 |
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636 KB
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Understanding and Configuring the 5DX Selftest and Black/White Level Tests
This paper discusses the theory and practice of 5DX automatic compensation tools, Selftest and gray level correction.
Application Note 2004-12-01 |
PDF
158 KB
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Using USB in the Test and Measurement Environment (AN 1465-12) - Application Note
Simplify test integration with USB interface. Whether you’re setting up an ad hoc system on a lab bench or designing a permanent solution for a manufacturing line, the three best choices today
for connecting modern instrumentation to computers are GPIB, LAN, and USB.
Application Note 2004-11-19 |
PDF
194 KB
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Increase Automotive ECU Test Throughput (AN 1505)
Application Note 2004-10-22 |
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Simplify Multiple Bias Voltage Sequencing and Ramping for PC Motherboard Test (AN 1504)
Application Note 2004-10-22 |
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Increase DC-input Battery Adapter Test Throughput by Several-fold (AN 1506)
Application Note 2004-10-22 |
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System Developer Guide Using LAN in Test Systems - PC Configuration (AN 1465-11) - Application Note
Using LAN in Test Systems: PC
Configuration,the third note in
the series, describes the additional
capabilities required to enable communication between a PC and LAN-enabled instrumentation. This note is a companion to Application Notes 1465-9 and 1465-10.
Application Note 2004-10-19 |
PDF
204 KB
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Using LAN in Test Systems - Network Configuration (AN 1465-10) - Application Note
The decision to use LAN in a test system delivers important benefits to your company and your team.
From a business perspective, intense competition among equipment vendors has produced a wide selection of high quality, low-cost solutions for local area networking
Application Note 2004-09-14 |
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182 KB
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5DX Virus Protection Software Policy
Agilent recognizes that customers require data protection for their PC workstations and computer controlled manufacturing equipment such as the 5DX Test System and associated workstations.
Application Note 2004-08-26 |
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Instructions for Using One Confirmation and Adjustment Panel with Multiple Systems
Readjusting the thickness table setting for one machine, using the Confirmation and Adjustment Panel, and adjustment data for a second machine, improves the portability of applications between the two machines.
Application Note 2004-08-26 |
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The Importance of Test and Inspection When Implementing Lead-Free Manufacturing
Many papers, articles, and studies have been written about process issues, reliability issues, repair issues, and the merits of different alloys. This paper addresses the impacts on test and inspection when going lead-free.
Application Note 2004-08-20 |
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260 KB
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Using Lead-Free PCB Finishes at Manufacturing In-circuit Test Stage
The purpose of this document is to share experiences and educate engineers regarding different PCB surface finishes and the specific changes required in the PCB build process to allow for ICT.
Application Note 2004-08-08 |
PDF
102 KB
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How to use the Agilent N6700 Modular Power System to replace an Agilent 662xA (AN 1467)
This is a high-level overview to help current 662xA owners easily convert to an Agilent N6700.
Application Note 2004-08-02 |
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Using LAN in Test Systems - The Basics (AN 1465-9) - Application Note
The basic purpose of any test system is to characterize and validate the performance of electronic components, assemblies or products. The complexity of this task depends on variables such as the physical nature of the device under test (DUT), the number of tests to be performed, the number of signals to be measured and the desired time per test.
Application Note 2004-07-29 |
PDF
270 KB
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