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Agilent Technologies' All-in-One MIPI D-PHY Test Platform Selected by ST-NXP Wireless

Press Materials 2008-09-17

A Time-Saving Method for Analyzing Signal Integrity in DDR Memory Buses
This application note covers new tools and measurement techniques for characterizing and validating signal integrity of DDR (double data rate synchronous dynamic random access memory) signals.

Application Note 2008-09-10

Method of Implementation (MOI) for DisplayPort Sink Compliance Test - Application Note
Method of Implementation (MOI) for DisplayPort Sink Compliance Test

Application Note 2008-08-18

PDF PDF 1.87 MB
Solutions for MB-OFDM Ultra-Wideband (UWB) Application Note
Application note describes hardware and software for ultra wideband (UWB) testing.

Application Note 2008-08-10

Jitter Solutions for Telecom, Enterprise, and Digital Designs - Brochure
Complete solutions for characterization and test of jitter in high-speed digital transmission systems, high-speed I/O connections, and buses.

Brochure 2008-06-25

PDF PDF 3.49 MB
Agilent Technologies' DisplayPort Sink Test Platform Qualified by VESA

Press Materials 2008-06-02

10 Hints for Getting the Most from your Frequency Counter
Maximize the results you get from your frequency counter through 10 hints from better from understanding the architecture to making faster measurements.

Application Note 2008-04-18

Precision Waveform Analysis for High-Speed Digital Communications Technical Overview
his document will discuss the Agilent 86108A precision waveform analyzer plug-in module with the Agilent 86100C DCA-J sampling oscilloscope mainframe for accurate analysis of high-speed digital communications signals.

Application Note 2008-04-17

MIPI D-PHY Physical Layer Solution Configuration Guide
MIPI D-PHY Physical Layer Solution Configuration Guide

Configuration Guide 2008-04-15

PDF PDF 242 KB
Agilent DigRF v3 Products & Solutions

Press Materials 2008-03-03

Integrated Debugging-A New Approach to Troubleshooting Your Designs with Real-Time Oscilloscopes
Traditional debugging can be time consuming and inefficient. With Agilent Infiniium oscilloscopes, “integrated debugging” is a reality, and it leads you directly to the root cause of problems.

Application Note 2008-01-30

Exploring The Test Requirements For DisplayPort Receivers
Exploring The Test Requirements For DisplayPort Receivers

Article 2008-01-28

PDF PDF 543 Bytes
DDR 1, 2 and 3 solutions Video
Includes probing methods, read/write separation technique and automated JEDEC compliance measurements with Infiniium Series oscilloscopes.

Demo 2007-12-27

WMF WMF 52.75 KB
Agilent Technologies Improves Industry's First DisplayPort Source Compliance, Characterization Test

Press Materials 2007-12-05

10 Reasons to Upgrade to a 16800 or 16900 Series Logic Analyzer
10 Reasons to Upgrade to a 16800 or 16900 Series Logic Analyzer

Application Note 2007-12-03

Method of Implementation (MOI) for DisplayPort - Application Note
Agilent Method of Implementation (MOI) for DisplayPort Sink Compliance Tests

Application Note 2007-11-03

PDF PDF 1.99 MB
Agilent Technologies and Fujitsu Microelectronics Pacific Asia Ltd. to Deliver Chipset Test Solution

Press Materials 2007-10-24

Complete solutions for characterization, debug, compliance test of HDMI designs - Brochure
This brochure discusses test solutions for HDMI. Thorough characterization and validation of HDMI-based designs

Brochure 2007-10-19

PDF PDF 1.12 MB
Wireless USB RF compliance video demo
How to test your Wireless USB product using standardized tools

Demo 2007-08-31

WMF WMF 56.04 KB
How to characterize the Physical Layer of the Mobile Industry Processor Interface (MIPI D-PHY)
How to characterize the Physical Layer of the Mobile Industry Processor Interface (MIPI D-PHY)

Application Note 2007-07-30

PDF PDF 611 KB
Signal Integrity Analysis Series Part 3: The ABCs of De-Embedding
This Application Note focuses on Part 3: The ABCs of De-Embedding explaining different de-embedding techniques & shows how to minimize fixture effects for best results.

Application Note 2007-07-01

PDF PDF 2.44 MB
Using Receiver Tolerance Testing to Assess the Performance of High-Speed Devices - App Note
Using Receiver Tolerance Testing to Assess the Performance of High-Speed Devices

Application Note 2007-06-19

PDF PDF 214 KB
Agilent E2960B Series for PCI Express 1.0 & 2.0 - Brochure
Providing customers with the fastest time to insight with an integrated suite of analyzer and exerciser tools.

Brochure 2007-05-15

PDF PDF 326 KB
Precision Jitter Analysis Using the Agilent 86100C DCA-J (PN 86100C-1)
This product note provides a guide to making jitter measurements with the Agilent 86100C DCA-J.

Application Note 2007-03-07

Signal Integrity Analysis Series Part 2: 4-Port TDR/VNA/PLTS - Application Note
This Application Note focuses on part 2: those which use a 4-port TDR/VNA/PLTS.

Application Note 2007-02-21

PDF PDF 2.75 MB

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