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IBIS AMI Modeling of Retimer and Performance Analysis of Retimer based Active Serial Links
This paper presents a novel retimer modeling approach based on IBIS-AMI to capture the performance of a retimer that operates up to 15 Gbps.

Article 2014-02-18

PDF PDF 1.78 MB
Mechanism of Jitter Amplification in Clock Channels
In this paper. jitter amplification in clock channels is analyzed analytically using the techniques developed in "Frequency domain analysis of jitter amplification in clock channels."

Article 2014-02-18

PDF PDF 671 KB
Modeling, Extraction and Verification of VCSEL Model for Optical IBIS AMI
A technique of modeling and extraction of VCSEL devices for IBIS-AMI has been proposed.

Article 2014-02-18

PDF PDF 947 KB
Sanjay Gangal of EDACafé interviews Colin Warwick on New SI and EM Products at Designcon 2014
Sanjay Gangal, V.P. Sales & Marketing at EDACafé interviews Colin Warwick, Product Manager at Agilent Technologies, at Designcon 2014, .

Demo 2014-02-04

ADS Controlled Impedance Line Designer Solves Key Challenges in Designing Chip-to-Chip Links
Agilent introduces Agilent EEsof EDA’s Controlled Impedance Line Designer. The software product quickly and accurately optimizes stack up and line geometry for multigigabit-per-second chip-to-chip links, using the most relevant metric.

Press Materials 2014-01-27

High Precision Time Domain Reflectometry - Application Note
Time domain reflectometry (TDR) is a well-established technique for verifying the impedance and quality of signal pats in components, interconnects, and transmission lines.

Application Note 2014-01-23

Agilent Technologies to Exhibit Digital Design and Test Solutions at DesignCon 2014
Agilent announced it will exhibit its high-speed digital solutions shown at DesignCon 2014, Jan. 29-30, Booth 201, in Santa Clara. The products offer a wide range of essential tools to help engineers design, simulate, analyze, debug and achieve compliant designs while meeting the challenges of gigabit digital designs.

Press Materials 2014-01-22

Quick Start for Signal Integrity Design Using Advanced Design System (ADS)
This demo guide is a part of the high-speed digital design workflow for signal integrity engineers using Advanced Design System.

Technical Overview 2014-01-20

PDF PDF 3.80 MB
EDA Support Services
Agilent Support Services for EDA Products offers customers several benefits otherwise not available. This service is designed to help you get the most out of your software purchases.

Brochure 2013-11-09

PDF PDF 128 KB
Introducing Physics-Based VCSEL Model to Solve Challenges in Designing Rack-to-Rack Opto Links
Agilent introduces a physics-based model for its opto model library that quickly and accurately solves the challenges posed by signal distortion in vertical cavity surface emitting lasers (VCSELs) used in rack-to-rack opto links.

Press Materials 2013-10-23

Agilent RF and Microwave Industry-Ready Student Certification Program
This program confirms a student’s technical knowledge, design expertise, and hands-on measurement proficiency in the use of Agilent EEsof software design tools and Agilent instruments.

Brochure 2013-10-16

PDF PDF 640 KB
Agilent Technologies’ Advanced Design System Selected by Kamstrup to Develop Smart Metering System
Agilent announces that Kamstrup A/S, a provider of metering solutions for electricity, heat, water and natural gas, has selected Agilent's Advanced Design System (ADS).

Press Materials 2013-10-07

Agilent EEsof EDA Premier Communications Design Software
The Agilent EEsof EDA catalog provides an excellent overview of all of Agilent's Electronic Design Automation (EDA) tools.

Catalog 2013-10-07

PDF PDF 8.61 MB
Agilent EEsof EDA Product Overview
Agilent EEsof EDA premier communications design software product overview brochure.

Brochure 2013-09-30

PDF PDF 1.68 MB
Ethernet 100BASE-TX Cable Test - Test Solution Overview Using the ENA Option TDR
This describes how to make measurements of 100BASE-TX Ethernet Cable Tests by using the Agilent E5071C ENA Option TDR.

Technical Overview 2013-09-24

PDF PDF 1.98 MB
Agilent Method of Implementation (MOI) for 100BASE-TX Ethernet Cable Tests
Agilent Method of Implementation (MOI) for 100BASE-TX Cable Tests Using Agilent E5071C ENA Option TDR

Application Note 2013-09-24

PDF PDF 1.95 MB
Measuring Jitter in Digital Systems (AN 1448-1) - Application Brief
This application note is for R&D designers and engineers working on high-speed digital designs. It addresses jitter measurements in digital circuits, how the different measurement techniques are best applied, and how these decisions may change as the data rates increase.

Application Note 2013-09-16

PDF PDF 1.78 MB
U4301A PCI Express® 3.0 Analyzer Module - Data Sheet
Agilent's U4301A PCI Express® 3.0 analyzer module is a protocol analyzer supporting all PCIe applications from Gen1 - Gen3 and speeds from 2.5 GT/s (Gen1) - PCI 8 GT/s (Gen3), link widths X1-X16.

Data Sheet 2013-09-04

Agilent EEsof EDA Software and Modular Solutions for Universities
Agilent works in collaboration with universities to provide tools that enable education and research for the engineers of tomorrow. The brochure outlines available programs, software and hardware.

Brochure 2013-08-16

PDF PDF 3.80 MB
M9252A DigRF Host Adapter – Data Sheet
The M9252A DigRF Host Adapter provides the serial stimulus capabilities required for the MIPITM Alliance DigRF v4-based RFIC evaluation and characterization.

Data Sheet 2013-08-07

PDF PDF 565 KB
How to Test a MIPI M-PHY High-speed Receiver - Challenges and Agilent Solutions - Application Note
This application selectively describes critical parts of the MIPI M-Phy-specification and related receiver (RX) tests. It describes the main properties of the M-Phy interface.

Application Note 2013-08-06

PDF PDF 6.63 MB
Agilent Technologies to Demonstrate Products at EMC 2013
Agilent announce that it will demonstrate some of its key products at EMC 2013, the IEEE International Symposium on Electromagnetic Compatibility, Aug. 5-9 at the Denver Convention Center (Booth 830), in Denver, Colorado.

Press Materials 2013-07-29

Analysis of Test Coupon Structures for the Extraction of High Frequency PCB Material Properties
Exploration of the addition of Beatty series resonant impedance structures to improve the accuracy of extracting PCB material properties for the purpose of constructing 3D-EM simulations.

Application Note 2013-07-10

PDF PDF 520 KB
Wireless Videos - WLAN
View these videos to learn more about wireless from Agilent - test solutions from Agilent for MIMO, WiMAX(TM), RFID, WLAN, Bluetooth®, and more.

Demo 2013-07-09

Press Releases for N5990A
Press Releases for N5990A

Press Materials 2013-07-04

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