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High-Speed Digitizers and Systems [Discontinued]

Find by Product Model Number: Examples: 34401A, E4440A

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Data Converter Product - Selection Guide
The guide presents the Acqiris family of cards and modules currently available.

Technical Overview 2013-04-23

U10xx Series Digitizers Startup Guide
Startup Guide for the U10xx series of Agilent Acqiris Products. Provides information on unpacking, inspecting, installation (software and hardware), making instrument connections and verifying operation.

Quick Start Guide 2012-11-27

PDF PDF 4.14 MB
MD1 User Guide and Soft Front Panel Help System
Help system for the LabVIEW driver for MD1 digitizers. Includes detailed API documentation of all driver functions. (Extract this zipped file to a local drive.)

Help File 2012-11-15

CHM CHM 11.76 MB
AgMD1 LabVIEW Driver Help System
Help system for the Soft Front Panel (SFP) for MD1 series digitizers. Includes product introduction, tour of the SFP UI, and how-to procedures, and troubleshooting. (Extract this zipped file to a local drive.)

Help File 2012-11-13

CHM CHM 1.34 MB
AgMD1 IVI Driver Help System
Help system for the IVI driver for MD1 digitizers. Includes detailed API documentation of all driver functions. (Extract this zipped file to a local drive.)

Help File 2012-09-28

CHM CHM 1.71 MB
Research Papers: Academic publications on use of Agilent high-speed digitizers
Summary of scientific papers which provide a wide range of data on where and how Agilent high-speed digitizers are used in the advanced research experiments.

Selection Guide 2012-06-11

User Manual: Agilent Acqiris 10-bit Digitizers

User Manual 2012-05-01

PDF PDF 1.23 MB
Agilent Acqiris 8-bit Digitizers User's Manual
For use with U106xA, U1071A, U1084A & U1091A (DP and DC series) digitizers.

User Manual 2012-05-01

PDF PDF 1.75 MB
Agilent Acqiris Instruments Programmer’s Guide
Programmer’s Guide: Agilent Acqiris Instruments

Programming and Syntax Guide 2012-04-01

PDF PDF 1018 KB
Agilent Acqiris Instruments Programmer’s Reference Manual
Programmer’s Reference Manual: Agilent Acqiris Instruments

Programming and Syntax Guide 2012-04-01

PDF PDF 1.73 MB
Order your complimentary 2012/13 RF & Microwave Test Accessories Catalog
This comprehensive resource enables engineers to quickly and conveniently research the highest-quality RF and microwave test accessories in the industry.

Catalog 2011-09-20

cPCI High-Speed Digitizers, Security Features and Certificate of Volatility

User Manual 2011-06-01

PDF PDF 167 KB
PIAMS for On-Line Compound Analysis in Airborne Particles
This 1-pager explains a customer application and describes which solution is offer with the data converter products.

Brochure 2011-05-19

PDF PDF 111 KB
Multichannel Data Acquisition Systems for Physics Applications
This 1-pager explains a customer application and describes which solution is offer with the data converter products.

Brochure 2011-05-19

PDF PDF 130 KB
Using Digitizer Technology in Gamma Ray Telescopes

Brochure 2011-05-19

PDF PDF 105 KB
Revealing Waveform Characteristics up to a Digitizer's Full Bandwidth App Note
When working with fast repetitive signals, TTI-enabled RIS can reveal waveform characteristics up to the full analog bandwidth limit of the digitizer.

Application Note 2011-04-27

PDF PDF 1.02 MB
Lassen Sie das Genie für Sie arbeiten
To support the needs of original equipment manufacturers (OEMs), Agilent offer a range of hardware products, software elements and, for specific customer needs, development services.

Brochure 2011-03-11

PDF PDF 1.63 MB
High-speed digitizer modules capture details from single-shot events

Application Note 2010-11-17

PC oscilloscope systems leverage turnkey acquisition software

Application Note 2010-11-17

High-speed ADC chipsets set the pace in real-time monitoring and control

Application Note 2010-11-17

High-speed digitizer selection depends on more than banner specifications

Application Note 2010-11-15

High-speed ADC chipsets benefit from optimized components

Application Note 2010-11-15

FPGA-based averaging can improve measurement results

Application Note 2010-11-04

Signal generation enables cost-effective testing

Application Note 2010-10-28

Signal processing can reduce data bandwidth through peak detection

Application Note 2010-10-28

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