Hable con un experto

Technical Support

Agilent EEsof EDA Software

Find by Product Model Number: Examples: 34401A, E4440A

1-25 of 724

Sort:
Agilent EEsof EDA Newsletter - Product and Application News
Keep tabs on the latest product and application news and review the archives of the Agilent EEsof EDA Newsletter.

Newsletter 2014-07-09

Genesys 2014.03 Release Notes
Genesys 2014.03 Product Release Notes.

Release Notes 2014-07-08

HTML HTML
MQA 2014.04 Release Notes
Model Quality Assurance (MQA) 2014.04 product release notes.

Release Notes 2014-06-30

MQA 2014.04 Documentation
Model Quality Assurance (MQA) 2014.04 Product Documentation.

Reference Guide 2014-06-30

New ADS DDR4 Compliance Test Bench for Solving the Simulation-Measurement Correlation Challenge
Agilent introduces Advanced Design System DDR4 Compliance Test Bench, which enables a complete workflow for DDR4 engineers from simulation of a candidate design through measurement of the finished prototype. The solution is ideal for semiconductor companies developing DDR controller IP; those developing DRAM chips and DIMMs; and OEMs integrating the controller and DIMM into a system using PCB technology.

Press Materials 2014-06-30

MBP 2014.04 Documentation
Model Builder Program (MBP) 2014.04 Product Documentation

Reference Guide 2014-06-26

IC-CAP 2014.04 Release Notes
IC-CAP 2014.04 Product Release Notes.

Release Notes 2014-06-26

MBP 2014.04 Release Notes
Model Builder Program (MBP) 2014.04 product release notes.

Release Notes 2014-06-26

Quickly Validate Designs for DOCSIS 3.1 Compliance - Application Brief
This “DOCSIS 3.1 Test Solution" app brief gives insight into Agilent solutions that can be used for testing DOCSIS 3.1 transmitters, receivers and components.

Application Note 2014-06-24

PDF PDF 746 KB
SystemVue W1905 Radar Model Library
The W1905 Radar Model Library is a simulation reference library for designing and testing Radar and electronic warfare (EW) systems. It is available as an option to the SystemVue system-level modeling software.

Data Sheet 2014-06-23

PDF PDF 1.14 MB
Advanced Modeling Solutions for Nanoscale 3D FinFETs and High-Frequency/High-Power GaN HEMTs
Agilent announces several innovations for the 2014 release of its industry-leading suite of device modeling and characterization software tools. The suite comprises IC-CAP, MBP, and MQA.

Press Materials 2014-06-18

Model Quality Assurance (MQA)
MQA provides the complete solution and framework to fabless design companies, IDMs, and foundries for SPICE model library validation, comparison, and documentation.

Brochure 2014-06-18

PDF PDF 1.08 MB
Model Builder Program (MBP)
MBP is a one-stop solution that provides both automation and flexibility for silicon device modeling.

Brochure 2014-06-18

PDF PDF 1.47 MB
Agilent Technologies Introduces Advanced Open FPGA Design Flow and Real-Time Measurement Solution
Agilent announces that the Agilent EEsof EDA W1462 SystemVue FPGA Architect now supports on-board FPGA design and simulation with the Agilent M9703A AXIe wideband digital receiver/digitizer.

Press Materials 2014-06-17

Agilent Technologies Announces Portfolio of DOCSIS 3.1 Test Solutions
Agilent announces a portfolio of Data Over Cable Service Interface Specification (DOCSIS) hardware and software test solutions for generating and analyzing signals up to a bandwidth of 192 MHz. The test solutions are used by R&D engineers to test transmitters, receivers and components against the requirements set forth in the DOCSIS 3.1 specification.

Press Materials 2014-06-12

Wafer-level Measurement Solutions – Cascade Microtech
Accurate and Repeatable Wafer-level Measurements from Cascade Microtech and Agilent.

Solution Brief 2014-06-03

Agilent Technologies and Cascade Microtech Announce Alliance to Streamline Wafer-Level Measurements
Agilent Technologies and Cascade Microtech announce a strategic alliance to provide fully configured and validated RF measurement solutions that streamline wafer-level semiconductor measurements while delivering guaranteed configuration, installation and support.

Press Materials 2014-06-03

Genesys 2014 Delivers Breakthrough Modulated RF Analysis for Circuit, System Design
Agilent announces the latest release of Genesys 2014.

Press Materials 2014-06-02

Agilent Technologies Introduces Advanced 4G Design and Validation Support
Agilent announces that the Agilent EEsof EDA W1918 LTE-Advanced baseband verification library has added support for key 4G technologies, such as Adaptive Modulation and Coding (AMC) and Coordinated Multi-Point (CoMP).

Press Materials 2014-06-02

IC-CAP Platform Support Roadmap
Agilent EEsof EDA Integrated Circuit Characterization and Analysis Program (IC-CAP) platform support roadmap.

Selection Guide 2014-05-28

PDF PDF 83 KB
W1918 LTE-Advanced Baseband Verification Library
The W1918 LTE-Advanced Baseband Verification Library saves time, reduces engineering effort and accelerates the maturity of baseband PHY designs.

Data Sheet 2014-05-27

PDF PDF 1.80 MB
Agilent Technologies to Attend IMS with Leading-Edge RF/Microwave Design and Measurement Solutions
Agilent announces it will attend the IEEE MTT-S International Microwave Symposium 2014 (Booth 1133), June 1-6, in Tampa, Fla. The company will demonstrate over 20 of its newest design and measurement solutions.

Press Materials 2014-05-21

Software Versions, Computer Platforms, and Operating Systems
Agilent EEsof EDA software versions, computer platforms, and operating systems support.

Selection Guide 2014-05-20

WaferPro Express
WaferPro Express software is an efficient and powerful automated measurement test platform for wafer-level characterization.

Brochure 2014-05-20

PDF PDF 2.44 MB
Agilent Technologies Introduces Modeling, Verification Platform for Radar, Electronic Warfare
Agilent announces that the W1905 radar model library has been enhanced to simulate moving 3-D radar scenarios as well as phased-array adaptive beamforming.

Press Materials 2014-05-19

1 2 3 4 5 6 7 8 9 10 ... Next