Technical Support

Test & Measurement

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Increasing Manufacturing Throughput of Automotive Controllers - Application Note This application note describes how automotive manufacturers can boost throughput using the Agilent TS-5400 Series 3 high performance PXI function test system for multiple devices under test. Application Note 2013-04-18	PDF 783 KB
Overvoltage Protection in Power Supplies - Application Note This application brief describes over-voltage protection as a useful feature to protect your DUTs in some commonly used applications Application Note 2013-04-18	PDF 832 KB
How to Read Your DC Power Supply's Data Sheet - Application Note Understanding how to sort through key power supply specifications in a data sheet can simplify product selection. Application Note 2013-04-16	PDF 325 KB
Achieve Accurate Two Wire Resistance Measurements with the Agilent 34923A and 34924A Multiplexers - This application note provides an overview of how to make an accurate two-wire resistance measurement with the Agilent 34980A and a multiplexer. Application Note 2013-04-16	PDF 472 KB
Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note Noise figure is a key performance parameter in many RF systems. This application note covers many topics related to noise figure measurements including the Y-factor method. Application Note 2013-04-12	PDF 1.36 MB
Radar Distance Test to Airborne Planes - Application Note Agilent pulse pattern generators are used for testing military radar communication systems, and as demonstrated in this publication, the aviation industry. Application Note 2013-04-11	PDF 904 KB
Tensile Testing of Fibers using Agilent T150 UTM Quasi-static Tensile Test The Agilent T150 UTM is a specifically designed instrument to measure the tensile properties of wide range of fibers with small cross-sectional diameters. this application note discussed testing of various fibers Application Note 2013-04-08	PDF 188 KB
PXI and AXIe Modular Instrumentation, Tested Computer List - Technical Note This personal computer and controller selection guide has been prepared to provide the system designer with a list of tested computers that are compatible with Agilent's PXI and AXIe chassis Application Note 2013-04-08	PDF 736 KB
Multichannel Measurements in MIMO 802.11ac Baseband IQ Simulation, Design and Test - Application Not This solution brief will show Agilent Technologies' complete, end-to-end solution for multichannel measurements of 802.11ac BBIQ simulation, design and test. Application Note 2013-04-05	PDF 748 KB
Basics of Measuring the Dielectric Properties of Materials - Application Note The dielectric properties that will be discussed here are permittivity and permeability. Resistivity is another material property which will not be discussed here. Application Note 2013-04-03	PDF 3.60 MB Languages English \| 2013-04-03 \| PDF 3.60 MB 日本語 \| 2012-05-14 \| PDF 725 KB
Power Essentials Resource Kit A collection of technical content and tools to help you get the most out of your bench or system power supply. Application Note 2013-04-03
Oscilloscope Selection Tip 3: Acquisition Memory Tip 3: Select a scope that has sufficient acquisition memory to capture your most complex signals with high resolution. Application Note 2013-04-02	PDF 682 KB Languages English \| 2013-04-02 \| PDF 682 KB 中文（简体） \| 2012-02-01 \| PDF 37 KB
Oscilloscope Selection Tip 8: Serial Bus Applications - Application Note Tip 8: Select a scope that can trigger on and decode serial buses to help you debug your designs faster. Application Note 2013-04-02	PDF 881 KB
Electronic System-Level (ESL) Applications Center Electronic System-Level application examples highlighting Agilent’s broad range of ESL applications, design functions and product areas. Application Note 2013-04-02
Choosing System DC Power Supplies to Optimize System Integration and Performance - Application note Your power supply choice affects the assembly, performance and longevity of your test system. Lower integration costs, faster throughput, better DUT protection, better test integrity and longer system. Application Note 2013-04-01	PDF 476 KB
CAN Eye-diagram Mask Testing - Application Note InfiniiVision X-Series scopes can trigger, decode, and perform eye-diagram mask test measurements on differential CAN bus signals, as well as perform analysis on other serial bus standards. Application Note 2013-04-01	PDF 2.64 MB
Viewing Graphical Results on a DMM Display - Application Note The 34461A offers a way to get insight into your measurement data without transferring your data to a PC. Application Note 2013-03-30	PDF 437 KB
Making Reflection Measurements - Application Note The N9322C supports to measure characteristics of antenna, RFID tags, or RF Tx modules, such as their return loss, insertion loss, and VSWR with a tracking generator and reflection measurement. Application Note 2013-03-29	PDF 3.40 MB
Using SystemVue for Integrating Wireless PHY Design, Validation, and Test Agilent SystemVue integrates system-level design tasks such as DSP modeling and Algorithm development with Validation and Test to create a unique new design flow for communications physical layer. Application Note 2013-03-28	PDF 8.17 MB
Time-Saving Features in Economy Oscilloscopes Streamline Test - Application Note Features like integrated function generators, large displays, fast update rates and mixed signal capabilities are now available in oscilloscopes to save valuable time in the design and debug process. Application Note 2013-03-27	PDF 1.48 MB
Using Oscilloscope Segmented Memory for Serial Bus Applications - Application Note For signals with long idle times between low duty cycle pulses or bursts of signal activity, a scope with segmented memory can extend the amount of time and number of serial packets captured Application Note 2013-03-27	PDF 2.63 MB
Oscilloscope Measurement Tools to Help Debug Automotive Serial Buses Faster - Application Note Agilent's InfiniiVision oscilloscopes offer some unique measurement capabilities for debugging and characterizing the physical layer of automotive serial buses. Application Note 2013-03-27	PDF 1.28 MB
Oscilloscope Selection Tip 9: Measurements & Analysis - Application Note One of the major advantages of today's digital storage oscilloscopes (DSOs) over older analog scope technology is that they have the ability to perform various automatic measurements and analysis on digitized waveforms. Application Note 2013-03-27	PDF 1.67 MB
MOI for DisplayPort PHY CTS 1.2b Sink Tests This document is provided "AS IS" and without any warranty of any kind, including, without limitation, any express or implied warranty of non-infringement, merchantability or fitness for a particular purpose. In no event shall VESA™ or any member of VESA be liable for any direct, indirect, special, exemplary, punitive, or consequential damages, including, without limitation, lost profits, even if advised of the possibility of such damages. This material is provided for reference only. VESA does not endorse any vendor’s equipment including equipment outlined in this document. Application Note 2013-03-21	PDF 7.99 MB
MOI for DisplayPort PHY CTS 1.2b Source Testing This document is provided "AS IS" and without any warranty of any kind, including, without limitation, any expressed or implied warranty of non-infringement, merchantability or fitness for a particular purpose. In no event shall VESA™ or any member of VESA be liable for any direct, indirect, special, exemplary, punitive, or consequential damages, including, without limitation, lost profits, even if advised of the possibility of such damages. This material is provided for reference only. VESA does not endorse any vendor’s equipment, including equipment outlined in this document. Application Note 2013-03-21	PDF 5.63 MB

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