Technical Support

Test et mesure électronique

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Potential of Low Voltage Scanning Electron Microscopy Use in Archaeology and History of Art Application Note 2012-11-08	PDF 1.19 MB
Instrument Design Validation and Recommended Calibration Policy - White Paper Provides background information on the test philosophies and methods used when developing instrument verification and adjustment procedures. Application Note 2012-11-08	PDF 1.22 MB
Evaluating Oscilloscope Bandwidths for your Application This application note provides some helpful hints on how to select an oscilloscope with the appropriate bandwidth for analog and digital applications. Application Note 2012-11-08	PDF 2.80 MB Langues English \| 2012-11-08 \| PDF 2.80 MB 中文（简体） \| 2012-02-02 \| PDF 1.10 MB 日本語 \| 2008-04-22 \| PDF 2.14 MB 한국어 \| 2006-11-03 \| PDF 791 KB
Oscilloscope Mask Testing for Six Sigma Quality Standards - Application Note This application note discusses the statistical principles that apply to the QA process and the evolution of Six Sigma efficiency-defined as achieving a defect rate of 3.4 per million or less. Application Note 2012-11-07	PDF 2.20 MB Langues English \| 2012-11-07 \| PDF 2.20 MB 中文（简体） \| 2009-03-01 \| PDF 450 KB
FieldFox Microwave Analyzers - White Paper This white paper presents general suggestions and specific examples regarding the essential attributes of handheld analyzers that will be used in harsh conditions. Application Note 2012-11-01	PDF 1.56 MB
Frequency Domain Analysis of Jitter Amplification in Clock Channels Clock channel jitter amplification factor in terms of transfer function or S-parameters is derived. Amplification is shown to arise from smaller attenuation in jitter lower sideband than in the fundamental. Amplification scaling with loss is obtained. Application Note 2012-11-01	PDF 257 KB
ARINC 429 Eye-diagram and Pulse-shape Mask Testing - Application Note Eye-diagram and pulse-shape pass/fail mask testing can be performed on differential ARINC 429 signals using an Agilent 3000 X-Series oscilloscope licensed with the DSOX3AERO and DSOX3MASK options. Application Note 2012-10-31	PDF 2.69 MB
MIL-STD 1553 Eye-diagram Mask Testing - Application Note Eye-diagram mask testing can be performed on differential MIL-STD 1553 signals using an Agilent 3000 X-Series oscilloscope licensed with the DSOX3AERO and DSOX3MASK options. Application Note 2012-10-31	PDF 2.44 MB
Impedance and Network Analysis Application List Application Note This document provides the information of unique and new solutions for impedance and network analysis with using Agilent impedance analyzers, LCR meters and ENA series network analyzers. Application Note 2012-10-30	PDF 1.11 MB
Wideband MIMO PXI Vector Signal Analyzer Multichannel Wideband Configuration White Paper This white paper describes a wideband MIMO configuration of the Agilent PXI VSA with up to 8 synchronized channels of wideband capability at much higher speeds than oscilloscope based solutions. Application Note 2012-10-30	PDF 13 MB
Rapid Calibration of Area Function and Frame Stiffness with Express Test1 Overview of “frame-stiffness” and “area-function” calibrations using Express Test Application Note 2012-10-29	PDF 197 KB
Setting and Adjusting Instrument Calibration Intervals A well-defined calibration interval is one that balances the tradeoffs between the cost and inconvenience of the process and the need to keep test instruments performing within their specifications. Application Note 2012-10-29	PDF 643 KB
Oscilloscope Memory Architectures – Why All Acquisition Memory is Not Created Equal Depending on your oscilloscope architecture there may be very real tradeoffs in more acquisition memory. Application Note 2012-10-26	PDF 957 KB Langues English \| 2012-10-26 \| PDF 957 KB Português \| 2012-10-10 \| PDF 717 KB
Triggering on Infrequent Anomalies and Complex Signals using InfiniiScan Zone Trigger If you can see the problem signal, then you can trigger on it using InfiniiScan Zone Trigger, a feature of the 4000 X-Series oscilloscopes Application Note 2012-10-26	PDF 1.32 MB Langues English \| 2012-10-26 \| PDF 1.32 MB 中文（简体） \| 2012-10-21 \| PDF 2.86 MB 日本語 \| 2012-10-31 \| PDF 2.55 MB Português \| 2012-10-01 \| PDF 1.06 MB
Switch Mode Power Supply Measurements This app note gives instructions on how to perform a broad range of power analysis measurements on your SMPS and how to perform these measurements when using Measurements Training Kit as the DUT. Application Note 2012-10-26	PDF 2.67 MB Langues English \| 2012-10-26 \| PDF 2.67 MB 中文（简体） \| 2012-12-19 \| PDF 1.79 MB Português \| 2012-10-01 \| PDF 1.51 MB
Too Much Calibration? - White Paper This paper explains the variables at work in the world of calibration - how they can be used to find the elusive balance point between cost and confidence, or "too much" and "not enough" calibration. Application Note 2012-10-24	PDF 1.23 MB
The Metrological & Financial Implications of a Clogged Fan Filter - White Paper This article discussed the implications of having a clogged air filter and addresses solutions to helping in the prevention of clogged air filters. Application Note 2012-10-24	PDF 1.41 MB
The Six Axes Of Calibration - White Paper To help demonstrate the variances in the deliverables and value of calibration due to lack of regulation. They have been split into 6 axes. This document discusses each of these axes. Application Note 2012-10-24	PDF 1.43 MB
Connector Pin Recession and its Effect on Network Analyzer Accuracy - White Paper Outlines an experiment undertaken to assess the impact on the measurement of reflection coefficient when using 3.5 mm connectors. Application Note 2012-10-24	PDF 762 KB
U2020 X-Series USB Sensor Uncertainty Calculator Measurement Uncertainty Calculator for U2020 X-Series. Application Note 2012-10-22	XLS 18 KB
Designing, Verifying and Testing Stepped Frequency Radar Systems for Commercial and A/D Applications This note shows a simulation platform using SystemVue software that easily links measurement tools to enable the design, validation and test of SFR systems under different environments. Application Note 2012-10-18	PDF 688 KB
Noise Figure Uncertainty Calculator The noise figure uncertainty calculator has been created to aid your design work, from components through to systems, helping you meet the continued demand for higher system performance. Analysis Tool 2012-10-18
Agilent Method of Implementation (MOI) for PCI Express 3.0 PCB Differential Trace Impedance Test Agilent Method of Implementation (MOI) for PCI Express 3.0 PCB Differential Trace Impedance Test Using Agilent E5071C ENA Network Analyzer Option TDR Application Note 2012-10-16	PDF 1.62 MB
Wideband Digital Pre-Distortion with Agilent SystemVue and PXI Modular Instrument Digital Pre-Distortion (DPD) is essential for wideband communications systems based on LTE-Advanced and 802.11ac. Overcome DPD challenges with trusted commercial measurement and modeling tools. Application Note 2012-10-15	PDF 1.03 MB Langues English \| 2012-10-15 \| PDF 1.03 MB 中文（简体） \| 2011-09-14 \| PDF 1.03 MB
Sensitivity Analysis of One-port Characterized Devices in Vector Network Analyzer Calibrations Results of a study on the use of characterized devices in microwave vector network analyzer (VNA) calibrations and measurements. A review of the theory of one-port characterized device calibration. Application Note 2012-10-14	PDF 1.25 MB

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