Technical Support: Test et mesure électronique

251-275 of 2669

Quantitative Surface Potential Measurement Using KFM Application Note 2012-04-20	PDF 433 KB
Compatibility of the U2000 Series USB Power Sensors with Agilent Instruments Application Note 2012-04-19	PDF 1.75 MB Langues English \| 2012-04-19 \| PDF 1.75 MB 日本語 \| 2012-09-05 \| PDF 2.72 MB
Optimizing Performance and Cost for Millimeter Wave Signal Analysis - Application Note This application note discusses recent advances in millimeter wave signal analysis and instrumentation that can be optimized for "just enough" performance versus cost. Application Note 2012-04-18	PDF 791 KB
Verify and Visualize Your TD-LTE Beamforming Signals This app note summarizes multi-antenna techniques, before introducing the concept of Beamforming, along with its advantages and specific use within the 3GPP TD-LTE wireless communication system. Application Note 2012-04-18	PDF 2.20 GB
Accelerate Program Development with Agilent Command Expert with Microsoft® Visual Studio® This application note describes how Agilent Command Expert with Microsoft Visual Studio can accelerate program development Application Note 2012-04-17	PDF 1.76 MB
Transition from 2G/3G to 3.9G/4G Base Station Receiver Conformance Test Application Note This application note will help you migrate from 2G/3G to 3.9G/4G BTS test. Various test requirements are explained as well as how to perform those tests using the new X-Series signal generators. Application Note 2012-04-16	PDF 611 KB
Oscilloscope Considerations for Multilane MIPI M-PHY Transmitter Validation To help improve your electrical validation, there are a few considerations in choosing the oscilloscope to validate your multilane M-PHY designs. Application Note 2012-04-09	PDF 1.10 MB
Which Electromagnetic Simulator Should I Use? This paper outlines three of the key EM simulation technologies, MoM, FEM, FDTD and attempt to compare and contrast the relative merits of each. Application Note 2012-04-06	PDF 3.21 MB
Simulating FPGA Power Integrity Using S-Parameter Models This application note describes how self-impedance (frequency) can easily be determined by simulating the frequency domain self-impedance profile of a Power Distribution Network (PDN). Application Note 2012-04-02	PDF 5.68 MB Langues English \| 2012-04-02 \| PDF 5.68 MB 日本語 \| 2012-06-25 \| PDF 1.40 MB
Rapid Mechanical Characterization Overview of Express Test on G200 used to perform an array of 40x40 indents in order to map the hardness and elastic modulus of a sectioned fiberglass computer board over a 40µm x 40µm area. The 1600 indents were completed in less than 26 minutes. Application Note 2012-04-02	PDF 258 KB
Tensile Deformation of Fibers Used in Textile Industry Discussion of UTM T150 used to test four different individual textile fibers — cotton, wool, polyester and rayon — under tensile loading. Application Note 2012-04-02	PDF 812 KB
Troubleshooting Load Cell Application with Agilent Wireless Remote Connectivity Solution - Applicati Case study on how to use Agilent U1177A IR-to-Bluetooth® adapter with an Android phone or tablet pc to troubleshooting load cell application. Application Note 2012-03-29	PDF 480 KB Langues English \| 2012-03-29 \| PDF 480 KB Português \| 2012-05-07 \| PDF 614 KB
All-states measurement method for PDL and PER with a synchronous polarization scrambler This synchronized all-states PDL method using the Agilent N7785B synchronous scrambler shortens total measurement time and removal of the polarization dependence of the setup from PDL and PER results. Application Note 2012-03-27	PDF 697 KB
Determination of Critical Tearing Energy of Polymer Films Overview of critical tearing energy for two commercially available polymer tapes that are measured from trouser-tear tests. The capability of measuring small loads, along with the high force resolution, enabled us to capture the variations in force during tearing of thin polymer films Application Note 2012-03-22	PDF 203 KB
E5072A ENA Series Network Analyzer for Basic Amplifier Measurements Application Note The application note describes how to make accurate measurements of amplifiers such as gain compression, harmonic distortion or pulsed-RF by useful features of the E5072A ENA series network analyzer. Application Note 2012-03-22	PDF 2.77 MB Langues English \| 2012-03-22 \| PDF 2.77 MB 中文（简体） \| 2012-08-13 \| PDF 1.57 MB
Rapid Characterization of Elastic Modulus Overview of Express Test Option for G200 NanoIndenter and how it increases instrument productivity by more than two orders of magnitude with ultra-fast indentation. Application Note 2012-03-22	PDF 146 KB
SINAD measurements Using the Agilent U8903A Audio Analyzer - Application Note This document covers the use of the Agilent U8903A audio analyzer in characterizing radio receiver sensitivity by means of measuring SINAD, an audio quality value that is usually used to specify the RF sensitivity. Application Note 2012-03-22	PDF 760 KB
Tensile Stress-Strain Response of Small Diameter Electrospun Fibers Overview of characterization of tensile stress-strain behavior of small diameter electrospun fibers of PCL using the Agilent UTM T150 Application Note 2012-03-20	PDF 211 KB
Simplify Complex High-speed Multichannel Acquisition Systems in Big Physics Experiments-Application This application note overview describes the use of Agilent modular products for high-speed multichannel acquisition systems in big physics experiments. Application Note 2012-03-19	PDF 651 KB Langues English \| 2012-03-19 \| PDF 651 KB 中文（简体） \| 2012-03-19 \| PDF 516 KB
USB 3.0 Protocol Testing with Active Error Insertion Application Note Speed up design and verification of USB designs using the U4612A Jammer Application Note 2012-03-19	PDF 3.51 MB
Thickness-dependent Electrical Properties of Single-layer Graphene and Few-layer Graphene Thickness-dependent Electrical Properties of Single-layer Graphene and Few-layer Graphene: a Kelvin Force Microscopy Study Application Note 2012-03-13	PDF 389 KB
Implementing Parallel Voltage Measurements in Functional Test of Automotive ECUs White Paper This paper examines the typical test system configuration of a conventional automotive ECU test method and compares that with parallel test methods. Application Note 2012-03-12	PDF 1.44 MB Langues English \| 2012-03-12 \| PDF 1.44 MB 中文（简体） \| 2012-04-30 \| PDF 710 KB
S-parameter Series: Using De-embedding Tools for Virtual Probing Application Note Discusses using de-embedding tools to gain virtual access to difficult measurement points Application Note 2012-03-11	PDF 2.09 MB Langues English \| 2012-03-11 \| PDF 2.09 MB 中文（简体） \| 2012-03-11 \| PDF 2.09 MB 한국어 \| 2012-03-11 \| PDF 2.09 MB
Accelerate interference detection and identification in wireless devices. This solution provides capture of transient errors in real RF environments; then the ability to investigate the nature and cause in a controlled lab environment. This is an application note overview. Application Note 2012-03-09	PDF 819 KB Langues English \| 2012-03-09 \| PDF 819 KB 中文（简体） \| 2012-03-09 \| PDF 458 KB 日本語 \| 2012-04-10 \| PDF 1.15 MB
PNA-X Network Analyzer 10 MHz to 26.5 GHz Application Note This application note describes accuracy considerations when using the Agilent PNA-X microwave network analyzer for two-tone intermodulation distortion measurements. Application Note 2012-03-05	PDF 3.38 MB Langues English \| 2012-03-05 \| PDF 3.38 MB 日本語 \| 2009-10-29 \| PDF 2.89 MB

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