Technical Support: Test & Measurement

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Achieve High Speed, Multichannel Data Acquisition with the M9703A AXIe Digitizer apnote This application note describes the measurement and analysis of cross channel skew in multichannel high speed digitizers. Application Note 2013-02-11	PDF 713 KB
Techniques for Precise Cable and Antenna Measurements in the Field - Application Note This app note introduces measurement and calibration techniques for cable and antenna testing using FieldFox handheld analyzers. Application Note 2013-02-08	PDF 5.93 MB Languages English \| 2013-02-08 \| PDF 5.93 MB 中文（简体） \| 2012-08-27 \| PDF 5.93 MB
Techniques for Precise Interference Measurements in the Field - Application Note This app note discusses the different types of interference in current and new systems and methods to measure a variety of interference types using spectrum analyzers such the FieldFox Series. Application Note 2013-02-08	PDF 883 KB Languages English \| 2013-02-08 \| PDF 883 KB 中文（简体） \| 2012-08-27 \| PDF 883 KB
Techniques for Precise Measurement Calibrations in the Field - Application Note This application note discusses recent advances in VNA calibration and compares measurements made on a FieldFox analyzer using different calibration types for a variety of RF and microwave devices. Application Note 2013-02-08	PDF 1.24 MB Languages English \| 2013-02-08 \| PDF 1.24 MB 中文（简体） \| 2012-08-29 \| PDF 1.27 MB
Equivalent Circuit Based Models For Surface Mount RLC Components Modelithics white paper on understanding S-parameter versus equivalent circuit-based models for surface mount RFC components. Application Note 2013-02-06
Testing DVB-T and DVB-T2 Receivers - Application Note This application note presents a discussion of the DVB-T and DVB-T2 systems and the measurement challenges facing developers of receivers such as set-top-boxes. Application Note 2013-02-02	PDF 716 KB
7 Reasons to Upgrade from Your 8753x to an ENA Network Analyzer - Application Note Many 8753x users have replaced their analyzers with the ENA since its introduction in November 2001. Although the reasons for making this change to some extent depend on the customer's particular situation, it is easy to highlight the ENA features that are most highly valued by our customers. This document tries to help 8753x users understand how the ENA can improve their network measurement environment, especially in applications related to RF component production tests. Application Note 2013-01-31	PDF 1.82 MB Languages English \| 2013-01-31 \| PDF 1.82 MB 中文（简体） \| 2006-08-01 \| PDF 3.04 MB 日本語 \| 2013-04-22 \| PDF 2.38 MB
High-Accuracy Noise Figure Measurements Using the PNA-X Series Network Analyzer – App Note 1408-20 This application note discusses the unique challenges involved in minimizing noise figure. Application Note 2013-01-31	PDF 2.54 MB
Optimize burn-in test with the Agilent 34980A multifunction switch/measure unit apnote overview This application overview will discuss the complexities of burn-in test based on the Agilent 340980A switch/measure unit Application Note 2013-01-31	PDF 440 KB
Increase Phased Array Antenna Test Throughput with the Agilent M9703A AXIe Digitizer Accelerate test throughput for phased array antennas while providing increased bandwidth for advanced future test requirements beyond single-tone measurements. Application Note 2013-01-30	PDF 478 KB Languages English \| 2013-01-30 \| PDF 478 KB 日本語 \| 2013-04-15 \| PDF 928 KB 中文（繁體） \| 2012-10-08 \| PDF 489 KB
Simple Scalar Network Analysis of Frequency Converter Devices - Application Note This application note shows the way to make easy scalar network analysis or power measurement using the Agilent U2000 series USB power sensor with the ENA network analyzers. Application Note 2013-01-28	PDF 606 KB
Paperless Calibration - White Paper Discusses the benefits of storing calibration records electronically rather than on paper in filing cabinets and explains why having a hard copy of these files is not necessary. Application Note 2013-01-25	PDF 1.97 MB
DDR4 TdiVW/VdiVW Bit Error Rate Measurement or Understanding Bit Error Rate Importance of making BER measurement calculations to form a statistical measurement of total jitter to understand the design's data valid window result and design error rates. Application Note 2013-01-24	PDF 1.65 MB
Characterizing Hi-speed USB 2.0 Serial Buses in Embedded Designs - Application Note The USB 2.0 serial interface has been rapidly replacing older RS-232 serial interfaces in embedded designs. Application Note 2013-01-24	PDF 1.52 MB Languages English \| 2013-01-24 \| PDF 1.52 MB 日本語 \| 2013-03-19 \| PDF 2.24 MB Português \| 2012-10-01 \| PDF 841 KB
Diode Evaluation Using the Agilent B2911A This technical overview shows how the Agilent B2900A Series Precision SMU allows you to accurately and easily measure the basic IV parameters and characteristics of diodes. Application Note 2013-01-22	PDF 2.83 MB Languages English \| 2013-01-22 \| PDF 2.83 MB 日本語 \| 2011-04-14 \| PDF 815 KB 中文（繁體） \| 2012-01-03 \| PDF 1.18 MB
Tips and Tricks for Using the 34450A 5 1/2 Digit Bench Top Digital Multimeter - Application Note This application note provides some useful tips on some of the key features of the 34450A digital multimeter. Application Note 2013-01-18	PDF 302 KB
Addressing the Challenges of Deploying Single Frequency Networks DVB-T & DVB-T2 - Application Note This application addresses the challenges of deploying SFN systems for digital video broadcasting and describe's Agilent's solutions for meeting these challenges. Application Note 2013-01-17	PDF 1.58 MB
Evolution of Dynamic Mechanical Properties of Nylon-PET Island-in-the-Sea Biocomponent Fibers Study of mechanical properties of individual nylon-PET bicomponent IS fibers, with two different PET molecular weights, were characterized using the Agilent T150 UTM. Application Note 2013-01-10	PDF 265 KB
Language of Specifications - White Paper This paper explains some of the arcane language used in describing a product's characteristics. Application Note 2013-01-08	PDF 508 KB
LED IV Measurement Using the Agilent B2911A This technical overview describes the use of LED IV measurements using the B2900 Series Precision source/measure unit. Application Note 2013-01-07	PDF 1.72 MB Languages English \| 2013-01-07 \| PDF 1.72 MB 日本語 \| 2011-10-27 \| PDF 678 KB 中文（繁體） \| 2011-07-11 \| PDF 836 KB
Resistor Production Test Using the Agilent B2911A This technical overview describes the use of the B2900 series of precision source/measure units for resistor production test. Application Note 2013-01-07	PDF 1.29 MB Languages English \| 2013-01-07 \| PDF 1.29 MB 日本語 \| 2011-10-27 \| PDF 629 KB
LED Production Test Using the Agilent B2911A This technical overview describes LED production test using the B2900A series precision source/measure unit. Application Note 2013-01-07	PDF 1.69 MB Languages English \| 2013-01-07 \| PDF 1.69 MB 日本語 \| 2011-10-27 \| PDF 626 KB
Thermistor Production Test Using the Agilent B2911A This technical overview shows how to use the Agilent B2900A Series Precision SMU for production thermistor test, in addition to the features that make it well-adapted for production test. Application Note 2013-01-07	PDF 1.33 MB Languages English \| 2013-01-07 \| PDF 1.33 MB 日本語 \| 2011-10-27 \| PDF 652 KB
Diode Production Test Using the Agilent B2911A This technical overview shows how to use the Agilent B2900A Series Precision SMU for production diode test, in addition to the features that make it well-adapted for production test. Application Note 2013-01-07	PDF 1.65 MB Languages English \| 2013-01-07 \| PDF 1.65 MB 日本語 \| 2011-04-14 \| PDF 1 MB
IV characterization of OLEDs using the Agilent B2911A This technical overview describes IV characterization of OLED's using the B2900 series precision source/measure units. Application Note 2013-01-07	PDF 1.81 MB Languages English \| 2013-01-07 \| PDF 1.81 MB 日本語 \| 2011-12-05 \| PDF 793 KB 中文（繁體） \| 2012-01-04 \| PDF 1.09 MB

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