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Techniques for Precise Cable and Antenna Measurements in the Field - Application Note This app note introduces measurement and calibration techniques for cable and antenna testing using FieldFox handheld analyzers. 어플리케이션 노트 2013-02-08	PDF 5.93 MB 언어 English \| 2013-02-08 \| PDF 5.93 MB 中文（简体） \| 2012-08-27 \| PDF 5.93 MB
Techniques for Precise Interference Measurements in the Field - Application Note This app note discusses the different types of interference in current and new systems and methods to measure a variety of interference types using spectrum analyzers such the FieldFox Series. 어플리케이션 노트 2013-02-08	PDF 883 KB 언어 English \| 2013-02-08 \| PDF 883 KB 中文（简体） \| 2012-08-27 \| PDF 883 KB
Equivalent Circuit Based Models For Surface Mount RLC Components Modelithics white paper on understanding S-parameter versus equivalent circuit-based models for surface mount RFC components. 어플리케이션 노트 2013-02-06
Testing DVB-T and DVB-T2 Receivers - Application Note This application note presents a discussion of the DVB-T and DVB-T2 systems and the measurement challenges facing developers of receivers such as set-top-boxes. 어플리케이션 노트 2013-02-02	PDF 716 KB
Optimize burn-in test with the Agilent 34980A multifunction switch/measure unit apnote overview This application overview will discuss the complexities of burn-in test based on the Agilent 340980A switch/measure unit 어플리케이션 노트 2013-01-31	PDF 440 KB
High-Accuracy Noise Figure Measurements Using the PNA-X Series Network Analyzer – App Note 1408-20 This application note discusses the unique challenges involved in minimizing noise figure. 어플리케이션 노트 2013-01-31	PDF 2.54 MB
7 Reasons to Upgrade from Your 8753x to an ENA Network Analyzer - Application Note Many 8753x users have replaced their analyzers with the ENA since its introduction in November 2001. Although the reasons for making this change to some extent depend on the customer's particular situation, it is easy to highlight the ENA features that are most highly valued by our customers. This document tries to help 8753x users understand how the ENA can improve their network measurement environment, especially in applications related to RF component production tests. 어플리케이션 노트 2013-01-31	PDF 1.82 MB 언어 English \| 2013-01-31 \| PDF 1.82 MB 中文（简体） \| 2006-08-01 \| PDF 3.04 MB 日本語 \| 2013-04-22 \| PDF 2.38 MB
Simple Scalar Network Analysis of Frequency Converter Devices - Application Note This application note shows the way to make easy scalar network analysis or power measurement using the Agilent U2000 series USB power sensor with the ENA network analyzers. 어플리케이션 노트 2013-01-28	PDF 606 KB
Paperless Calibration - White Paper Discusses the benefits of storing calibration records electronically rather than on paper in filing cabinets and explains why having a hard copy of these files is not necessary. 어플리케이션 노트 2013-01-25	PDF 1.97 MB
DDR4 TdiVW/VdiVW Bit Error Rate Measurement or Understanding Bit Error Rate Importance of making BER measurement calculations to form a statistical measurement of total jitter to understand the design's data valid window result and design error rates. 어플리케이션 노트 2013-01-24	PDF 1.65 MB
Characterizing Hi-speed USB 2.0 Serial Buses in Embedded Designs - Application Note The USB 2.0 serial interface has been rapidly replacing older RS-232 serial interfaces in embedded designs. 어플리케이션 노트 2013-01-24	PDF 1.52 MB 언어 English \| 2013-01-24 \| PDF 1.52 MB 日本語 \| 2013-03-19 \| PDF 2.24 MB Português \| 2012-10-01 \| PDF 841 KB
Diode Evaluation Using the Agilent B2911A This technical overview shows how the Agilent B2900A Series Precision SMU allows you to accurately and easily measure the basic IV parameters and characteristics of diodes. 어플리케이션 노트 2013-01-22	PDF 2.83 MB 언어 English \| 2013-01-22 \| PDF 2.83 MB 日本語 \| 2011-04-14 \| PDF 815 KB 中文（繁體） \| 2012-01-03 \| PDF 1.18 MB
Tips and Tricks for Using the 34450A 5 1/2 Digit Bench Top Digital Multimeter - Application Note This application note provides some useful tips on some of the key features of the 34450A digital multimeter. 어플리케이션 노트 2013-01-18	PDF 302 KB
Addressing the Challenges of Deploying Single Frequency Networks DVB-T & DVB-T2 - Application Note This application addresses the challenges of deploying SFN systems for digital video broadcasting and describe's Agilent's solutions for meeting these challenges. 어플리케이션 노트 2013-01-17	PDF 1.58 MB
Evolution of Dynamic Mechanical Properties of Nylon-PET Island-in-the-Sea Biocomponent Fibers Study of mechanical properties of individual nylon-PET bicomponent IS fibers, with two different PET molecular weights, were characterized using the Agilent T150 UTM. 어플리케이션 노트 2013-01-10	PDF 265 KB
Language of Specifications - White Paper This paper explains some of the arcane language used in describing a product's characteristics. 어플리케이션 노트 2013-01-08	PDF 508 KB
Thermistor Evaluation Using the Agilent B2911A This application introduces features of B2900A Series as the best solution for accurate characterization of thermistor and other two terminal devices. 어플리케이션 노트 2013-01-07	PDF 1.80 MB 언어 English \| 2013-01-07 \| PDF 1.80 MB 日本語 \| 2011-10-27 \| PDF 702 KB 中文（繁體） \| 2012-01-10 \| PDF 2.84 MB
LIV Test of Laser Diode Using the Agilent B2912A This application introduces features of B2900A Series as the best solution for LIV test of laser diode. 어플리케이션 노트 2013-01-07	PDF 1.76 MB 언어 English \| 2013-01-07 \| PDF 1.76 MB 日本語 \| 2011-04-14 \| PDF 901 KB 中文（繁體） \| 2012-01-11 \| PDF 1023 KB
Thermistor Production Test Using the Agilent B2911A This technical overview shows how to use the Agilent B2900A Series Precision SMU for production thermistor test, in addition to the features that make it well-adapted for production test. 어플리케이션 노트 2013-01-07	PDF 1.33 MB 언어 English \| 2013-01-07 \| PDF 1.33 MB 日本語 \| 2011-10-27 \| PDF 652 KB
IV Characterizations of Solar/Photovoltaic Cells Using the Agilent B2911A The Agilent B2900A Series Precision SMU allows you to accurately and quickly make characterization of photovoltaic cells with its intuitive GUI and free PC-based application software. 어플리케이션 노트 2013-01-07	PDF 1.17 MB 언어 English \| 2013-01-07 \| PDF 1.17 MB 中文（繁體） \| 2011-07-11 \| PDF 784 KB
Resistor Production Test Using the Agilent B2911A This technical overview describes the use of the B2900 series of precision source/measure units for resistor production test. 어플리케이션 노트 2013-01-07	PDF 1.29 MB 언어 English \| 2013-01-07 \| PDF 1.29 MB 日本語 \| 2011-10-27 \| PDF 629 KB
Characterization of Field Effect Transistors Using the Agilent B2912A The Agilent B2900A Series Precision SMU allows you to evaluate IV characteristics of FET accurately and quickly with its intuitive GUI and free PC-based application software. 어플리케이션 노트 2013-01-07	PDF 1.79 MB 언어 English \| 2013-01-07 \| PDF 1.79 MB 日本語 \| 2011-04-11 \| PDF 1.13 MB 中文（繁體） \| 2012-01-04 \| PDF 912 KB
Fast fT-Ic Measurement Using the Agilent B2912A This technical overview describes the use of the B2900 series to make Fast fT-Ic measurements 어플리케이션 노트 2013-01-07	PDF 1.69 MB 언어 English \| 2013-01-07 \| PDF 1.69 MB 日本語 \| 2011-04-11 \| PDF 635 KB 中文（繁體） \| 2012-01-30 \| PDF 745 KB
Characterization of Bipolar Transistors Using the Agilent B2912A This technical overview describes the characterization of Bipolar transistors using the B2900a precision source/measure units. 어플리케이션 노트 2013-01-07	PDF 1.92 MB 언어 English \| 2013-01-07 \| PDF 1.92 MB 日本語 \| 2011-10-27 \| PDF 863 KB
IV characterization of OLEDs using the Agilent B2911A This technical overview describes IV characterization of OLED's using the B2900 series precision source/measure units. 어플리케이션 노트 2013-01-07	PDF 1.81 MB 언어 English \| 2013-01-07 \| PDF 1.81 MB 日本語 \| 2011-12-05 \| PDF 793 KB 中文（繁體） \| 2012-01-04 \| PDF 1.09 MB

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