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Protect Against Power-Related DUT Damage During Test - Application Note
This application note discusses choosing a power supply with extensive integrated protection features to avoid power-related damage.

Application Note 2013-08-23

Load-Cell Testing in Practice - Application Note
In this application note, you will discover the advantages of using one-box source-and-measure U3606B to perform load-cell testing.

Application Note 2013-08-21

Reducing Device-Failure Risk with a Black-Box Recorder - Application Note
A Black Box recorder can give you critical insight into DUT failures and can help you develop an effective test strategy.

Application Note 2013-08-21

Logic Analysis Fundamentals - Application Note
Mobile device internal FPGA signals are almost exclusively parallel bus. This application note examines parallel bus measurement basics, including functional and timing verification and debug.

Application Note 2013-08-21

PDF PDF 2.04 MB
Effect of Annealing on 50nm Gold Films - Application Note
Overview of Express Test used to evaluate the effect of annealing on 50nm gold films. The note proves that vacuum annealing for three hours (sub 300°C) causes the hardness to decrease by 4.3% – 6.7% with99.9% confidence

Application Note 2013-08-20

PDF PDF 192 KB
M9703A AXIe High-Speed Digitizer with Real-Time Digital Downconversion Capability - Application Note
This application note describes how to use the M9703A AXIe high-speed digitizer with real-time digital downconversion (DDC) capability to perform ultra-fast relative phase and gain measurements.

Application Note 2013-08-19

PDF PDF 5.48 MB
Basics of Measuring the Dielectric Properties of Materials - Application Note
The dielectric properties that will be discussed here are permittivity and permeability. Resistivity is another material property which will not be discussed here.

Application Note 2013-08-15

The Benefits of Updating Your 3499A/B/C Switching System to the 34980A Switch/Measure Unit
This application note will describe differences and advantages of the new 34980A as compared to the 3499A/B/C.

Application Note 2013-08-15

Creating and Optimizing 802.11ac Signals with the M8190A AWG - Application Note
Designs for 802.11ac WLAN devices require test equipment that can provide the best reference test signals and measurements. N7617B enables this type of signals to be generated with the M8190A AWG.

Application Note 2013-08-13

PDF PDF 606 KB
How to Test a MIPI M-PHY High-speed Receiver - Challenges and Agilent Solutions - Application Note
This application selectively describes critical parts of the MIPI M-Phy-specification and related receiver (RX) tests. It describes the main properties of the M-Phy interface.

Application Note 2013-08-06

PDF PDF 6.63 MB
Solutions and Measurement Tools for Use in Average Power and Envelope Tracking Design - Application
This app note provides an outline of the techniques involved and the solutions Agilent provides for RF, baseband and system developers.

Application Note 2013-08-05

Electromagnetic Simulations at the Nanoscale: EMPro Modeling and Comparison to SMM Experiments
In this application note, we describe electromagnetic (EM) simulations using Agilent Technologies’ EMPro software to support the interpretation of scanning microwave microscope (SMM) experiments.

Application Note 2013-07-30

PDF PDF 592 KB
Configuring Boundary Scan Chains on Agilent x1149 Boundary Scan Analyzer - Application Note
This application note provides the procedure for configuring the boundary scan chain of a board using the Agilent x1149 boundary scan analyzer.

Application Note 2013-07-30

PDF PDF 890 KB
Strain-Rate Sensitivity of Thin Metal Films by Instrumented Indentation - Application Note
A new technique for measuring strain-rate sensitivity by instrumented indentation is presented. This new technique is insensitive to thermal drift and can be used for thin films and other small volumes materials

Application Note 2013-07-30

PDF PDF 2.29 MB
Improving Throughput with your Power Supply - Hints 1 through 5 – Application Brief
This application compendium consists of 1 through 5 of the 10 hints on how to improve throughput with your power supply.

Application Note 2013-07-29

Solutions for Testing NFC Devices
Using an accurate, configurable and versatile test bench with qualified test tools to address test challenges throughout the NFC product development cycle

Application Note 2013-07-29

Debug Automotive Designs Faster with CAN-dbc Symbolic Trigger and Decode - Application Note
Learn how to perform CAN symbolic-level triggering and decode with these step-by-step instructions.

Application Note 2013-07-29

Merging boards on Agilent x1149 Boundary Scan Analyzer – Application Note
This application note shows how to connect two or more boards to form a single boundary scan chain using the Agilent x1149 boundary scan analyzer.

Application Note 2013-07-26

PDF PDF 1.85 MB
Oscilloscope Measurement Tools to Help Debug Automotive Serial Buses Faster - Application Note
Agilent's InfiniiVision Series oscilloscopes offer some unique measurement capabilities for debugging and characterizing the physical layer of automotive serial buses.

Application Note 2013-07-24

PDF PDF 3.03 MB
Oscilloscope Selection Tip 11: Probing - Application Note
Tip 11: Select an oscilloscope from a vendor that can also provide the variety of specialty probes that you may require.

Application Note 2013-07-24

PDF PDF 638 KB
Achieve Accurate Two Wire Resistance Measurements with the Agilent 34923A and 34924A Multiplexers -
This application note provides an overview of how to make an accurate two-wire resistance measurement with the Agilent 34980A and a multiplexer.

Application Note 2013-07-24

Measuring Agile Signals and Dynamic Signal Environments
Download this application note to learn real-time spectrum analysis techniques that will help you not only discover but make precise and selective measurements of complex and elusive signals.

Application Note 2013-07-23

Methods for Characterizing and Tuning DC Inrush Current - Application Brief
This application brief describes how a modern high-performance power supply with features such as measurement digitizers, fast adjustment turn-on voltage rates and advanced triggers make an ideal tool.

Application Note 2013-07-18

Overcome PCB Loss, Deliver a Clean Eye to Your DUT Using Multi-tap De-emphasis - Application Brief
This application brief describes how Agilent’s 32 Gb/s Pattern Generator with integrated 5-tap de-emphasis can overcome PCB and connector loss and deliver a clean eye to the DUT.

Application Note 2013-07-16

PDF PDF 2.23 MB
Achieve Accurate Resistance Measurements with the Agilent 34980A Multifunction Switch Measure Unite
This application note provides an overview of how to make an accurate 2-wire, 3-wire and 4-wire resistance measurements with the Agilent 34980A

Application Note 2013-07-10

PDF PDF 176 KB

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