Contact an Expert

Technical Support

Electronic Measurement

Find by Product Model Number: Examples: 34401A, E4440A

Refine the List

remove all refinements

By Industry/Technology

By Type of Content

151-175 of 2788

Sort:
Reliable Temperature Chamber Testing with N2797A Extreme Temperature Active Probe - Application Note
Agilent’s N2797A extreme temperature active probe can operate over wide temperature ranges from -40 to 85 C, improving the accuracy of your temperature chamber measurements.

Application Note 2013-09-19

PDF PDF 903 KB
Gauging Temperature Accuracy Using the Agilent U3606B Multimeter | DC Power Supply- Application Note
In this application note, you will discover how the unique feature in Agilent U3606B that can be used to evaluate the functionality of a temperature controller board.

Application Note 2013-09-18

Enhancing Microwave Spectroscopy in Astrophysics Applications - Application Brief
The basic approach is to use spectroscopy to create a database of “fingerprints” from known gases and then compare the stored readings to those captured with a spectrometer and an AWG.

Application Note 2013-09-18

PDF PDF 1.84 MB
Measuring Jitter in Digital Systems (AN 1448-1) - Application Brief
This application note is for R&D designers and engineers working on high-speed digital designs. It addresses jitter measurements in digital circuits, how the different measurement techniques are best applied, and how these decisions may change as the data rates increase.

Application Note 2013-09-16

PDF PDF 1.78 MB
Vapor Annealing Effect on Copolymers Studied by 7500 AFM with Environmental Control-Application Note

Application Note 2013-09-16

PDF PDF 184 KB
Surface Potential Measurements Using the Agilent 7500 AFM - Application Note

Application Note 2013-09-13

PDF PDF 452 KB
The Revolutionary Impact of the Oliver and Pharr Technique on the Science of Hardness Testing
Explanation of the Oliver-Pharr method and how it can be used to obtain an equivalent Vickers hardness number

Application Note 2013-09-13

PDF PDF 120 KB
Magnetic Force Microscopy Studies Using the Agilent 7500 AFM - Application Note

Application Note 2013-09-12

PDF PDF 524 KB
7500 AFM Applications in Polymer Materials - Application Note

Application Note 2013-09-12

PDF PDF 274 KB
Current Sensing AFM Measurements Using 7500 AFM - Application Note

Application Note 2013-09-12

PDF PDF 122 KB
Humidity-dependent Surface Chemistry Studied by 7500 Atomic Force Microscopy - Application Note

Application Note 2013-09-12

PDF PDF 157 KB
Making Fast Pass/Fail Testing with Agilent N9320B Spectrum Analyzer - Application Note
This application note describes the advanced window limit feature in the N9320B spectrum analyzer and demonstrates how to use it to easily make the Pass/Fail determination on measurement results.

Application Note 2013-09-11

PDF PDF 2.40 MB
The Impedance Measurement Handbook-4th Edition - Application Note
This 140 page handbook is Agilent Technologies's most detailed information on the basics of impedance measurements using Agilent Technologies's LCR meters and impedance analysers. It provides the theory, test set-upinformation, error discussion, etc.

Application Note 2013-09-10

Enhancing Measurement Performance for the Testing of Wideband MIMO Signals - White Paper
This white paper describes a method for characterization and correction of channel frequency response for BBIQ measurements over large bandwidths when using the Agilent M9703A and 89600 VSA software.

Application Note 2013-09-10

PDF PDF 657 KB
Three Reasons to Complement Your Scope Investment with PC-based Analysis Software - Application note
PC-based oscilloscope analysis software enables engineers to work remote from the target system and scope, and it makes sharing and analyzing data an easier experience.

Application Note 2013-09-05

PDF PDF 803 KB
DC-DC Converter Evaluation - Flyer
This 1-pager describes "Quick Bench-top Evaluation" of DC-DC converter and shows real measurement results of DC and transient tests made by B2900A series.

Application Note 2013-08-29

PDF PDF 1.04 MB
Optimize Transceiver Test Throughput with the Agilent PXIe Vector Signal Analyzer and Generator
This application brief provides key issues and recommended solutions for increasing the speed of transceiver test.

Application Note 2013-08-27

PDF PDF 1.10 MB
FieldFox Remote Viewer - Application Brief
FieldFox remote viewer is a FREE iOS app, that allows you to view and control FieldFox from your iOS device. This brief describes three configurations to setup your FieldFox to your iOS device.

Application Note 2013-08-27

PDF PDF 1.93 MB
Protect Against Power-Related DUT Damage During Test - Application Note
This application note discusses choosing a power supply with extensive integrated protection features to avoid power-related damage.

Application Note 2013-08-23

Load-Cell Testing in Practice - Application Note
In this application note, you will discover the advantages of using one-box source-and-measure U3606B to perform load-cell testing.

Application Note 2013-08-21

Reducing Device-Failure Risk with a Black-Box Recorder - Application Note
A Black Box recorder can give you critical insight into DUT failures and can help you develop an effective test strategy.

Application Note 2013-08-21

Logic Analysis Fundamentals - Application Note
Mobile device internal FPGA signals are almost exclusively parallel bus. This application note examines parallel bus measurement basics, including functional and timing verification and debug.

Application Note 2013-08-21

PDF PDF 2.04 MB
Effect of Annealing on 50nm Gold Films - Application Note
Overview of Express Test used to evaluate the effect of annealing on 50nm gold films. The note proves that vacuum annealing for three hours (sub 300°C) causes the hardness to decrease by 4.3% – 6.7% with99.9% confidence

Application Note 2013-08-20

PDF PDF 192 KB
M9703A AXIe High-Speed Digitizer with Real-Time Digital Downconversion Capability - Application Note
This application note describes how to use the M9703A AXIe high-speed digitizer with real-time digital downconversion (DDC) capability to perform ultra-fast relative phase and gain measurements.

Application Note 2013-08-19

PDF PDF 5.48 MB
The Benefits of Updating Your 3499A/B/C Switching System to the 34980A Switch/Measure Unit
This application note will describe differences and advantages of the new 34980A as compared to the 3499A/B/C.

Application Note 2013-08-15

Previous 1 2 3 4 5 6 7 8 9 10 ... Next