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26-50 of 85
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Improving Test Efficiency of MEMS Electrostatic Actuator using the E4980A
This application brief describes how the Agilent E4980A can greatly improve the test efficiency of MEMS electrostatic actuators.
Application Note 2007-04-12 |
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206 KB
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Accurate Evaluation of MEMS Piezoelectric Sensor and Actuator using the 4294A
This application brief describes the benefits of using the Agilent 4294A for device characterization of MEMS piezoelectric sensors and actuators, along with its wide variety of analysis functions and features and how it improves design efficiency.
Application Note 2007-04-06 |
PDF
201 KB
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Characterizing Electromagnetic MEMS Optical Switch Actuator using the E4980A
This application brief describes how the Agilent E4980A improves the test efficiency of electromagnetic MEMS optical switch actuators.
Application Note 2007-04-04 |
PDF
121 KB
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Characterizing Electromagnetic MEMS Optical Scanner using the E4980A
This application brief describes how the Agilent E4980A can greatly improve the test efficiency of electromagnetic MEMS optical scanners.
Application Note 2007-04-04 |
PDF
202 KB
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Characterizing MEMS Magneto-Impedance Sensor using the Agilent Impedance Analyzer
This application brief describes the benefits of using Agilent impedance analyzers for device characterization of MEMS Magneto-Impedance (MI) sensors.
Application Note 2007-03-31 |
PDF
235 KB
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16196A/B/C/D Correlating RF Impedance Measurements When Using SMD Test Fixtures
This Product Note explains that the ability to verify the correlation of impedance measurement results is dependent on the variety of factors.
Application Note 2007-03-06 |
PDF
516 KB
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Spectrum Analyzer Basics (AN 150)
Fundamentals of spectrum analyzer measurements
Application Note 2006-08-02 |
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Improve Electronic Product Quality and Performance with Agilent Precision LCR Meters (AN 369-9)
This note describes the general application of passive component measurements in incoming inspection and R&D and shows the benefits of Agilent's Precision LCR Meter family; the 4284A and the 4285A 30 MHz LCR meters with digital Q capability.
Application Note 2006-06-26 |
PDF
168 KB
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Evaluation of MOS Capacitor Gate Oxide C-V Characteristics Using the Agilent 4294A(PN4294-3)
As a result of extremely high integration of logic LSIs, MOS FETs with gate lengths of 0.1 mm or less have been produced recently. A consequence of this miniaturization has been the need for very thin gate oxide layers.
Application Note 2003-06-26 |
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1.01 MB
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How to Characterize CATV Amplifiers Effectively (AN 1288-4)
This application note shows you how to effectively evaluate CATV amplifier performance using the 4396B Network/ Spectrum/Impedance Analyzer.
Application Note 2002-12-12 |
PDF
463 KB
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Network, Spectrum, and Impedance Evaluation of Electronic Circuits and Components (AN 1308-1)
This Application Note describes how the Agilent 4395A/96B can be used to contribute fast cycle time for electronic circuit/component development.
Application Note 2001-12-19 |
PDF
666 KB
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Highly Accurate Evaluation of Chip Capacitors using the 4291B (AN 1300-1)
The evaluation of chip capacitors is particularly important because they are used in a wide range of applications (including oscillation circuits and LC filters).
Application Note 2001-11-09 |
PDF
1019 KB
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Effective Multitap Transformer Testing Using a Scanner (AN 1224-5)
This Application Note shows an effective multi-tap transformer measurement using a scanner and the Agilent 4263B LCR Meter.
Application Note 2001-11-05 |
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945 KB
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High Accuracy and Fast RF Inductor Testing (AN 369-10)
This Application Note describes solutions offered by the Agilent 4285A Precision LCR Meter for realizing these requirements. Information for accurate and fast RF inductor testing, and for practical simple test systems are discussed.
Application Note 2001-10-25 |
PDF
471 KB
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Configuring the Agilent 4396B for O/E Testing (AN 1288-2)
The recent trend in cable television (CATV) is the need for more selections, or channels, and the possibility of having interactive TV services such as On-Line-Banking and Movies-0n-Demand. These requirements are pushing the limits of the copper...
Application Note 2001-09-07 |
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444 KB
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Reliable Electronic Component Evaluation and Circuit Design with the 4294A(PN4294-1)
Application Note 2001-08-31 |
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406 KB
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Combining Network and Spectrum Analyses and IBASIC (AN 1288-1)
Active components (and now even some passive components like crystal filters require analysis to characterize linear parameters (gain/loss, phase and group delay or S-parameters) as well as non-linear performance. Non-linear analysis is typically related to measuring signal distortion generated...
Application Note 2001-08-30 |
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352 KB
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Accurate Impedance Measurement with Cascade Microtech Probe System(AN1369-3)
This 12 page application note explains how to make on-wafer or on-substrate 1-port impedance measurements using a probe station.The E4991A (1 M-3 GHz) and 4294A (40-110 MHz) solutions are discussed.
Application Note 2001-07-31 |
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2.25 MB
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Advanced impedance measurement capability of the RF I-V method (AN 1369-2)
This application note describes the difference between the network analyzer and impedance analyzer for the measurement principle and actual measurement performance.
Application Note 2001-07-26 |
PDF
753 KB
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New Generation Analyzer Offers Exceptional and Powerful Analysis Functions for RF...(PN E4991A-1)
This Product Note describes the key technology of RF impedance measurement, today's RF component evaluation methodologies and advanced features of the E4991A product.
Application Note 2001-05-24 |
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1.35 MB
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Fundamentals of RF and Microwave Power Measurements (AN 64-1C)
This Application Note is for information only. Agilent no longer sells or supports these products.
Application Note 2001-04-16 |
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2.21 MB
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Cable Impedance and Structural Return Loss Measurement Methodologies
introduces exact definitions for cable impedance and structural return loss along with several measurement methodologies.
Application Note 2001-03-23 |
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Evaluating Temperature Characteristics using a Temperature Chamber and the Agilent 4291B (PN 4291-2)
This note introduces an efficient and highly reliable method for evaluating temperature characteristics using a combination of the 4291B RF Impedance/Material Analyzer and a Tabai Espec temperature chamber.
Application Note 2000-11-01 |
PDF
378 KB
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Swtching Power Supply Evaluation with Agilent 4395A (PN 4395-2)
This Product Note describes how designers evaluate the switching power supply for various reasons, such as performance evaluation, regulation evaluation and component selection. Evaluation parameters are loop gain, output impedance, ripple and switching noise, EMC evaluation and component...
Application Note 2000-11-01 |
PDF
332 KB
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Electronic Characterization of Impedance Analyzer (AN 1300-5)
This application note describes in broad terms how to use the 4291B RF Impedance/Material Analyzer in determining the impedance characteristics of IC packages up to 1.8 GHz. This information is useful for high speed digital designers, component...
Application Note 2000-11-01 |
PDF
512 KB
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