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1-9 of 9
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EXT Wireless Communications Test Set Non-signaling Test Overview
This application note explains how non-signaling test methods make it possible for manufacturers to reduce both test times and test equipment costs across a range of wireless technologies
Application Note 2012-08-01 |
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Testing Handovers Between LTE and 3G cdma2000/1xEV-DO Cellular Networks
This application note explains test handovers between LTE and third generation cdma2000/1xEV-DO cellular networks as well as network evolution.
Application Note 2011-06-15 |
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Applications Testing with the Agilent 8960 Series 10 Wireless Test Set (R&D only)
The 8960 (E5515C) and Agilent lab applications help you throroughly test to current technology standards.
Application Note 2006-03-27 |
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How Digitally Generated Faded Signals Reduce Cost of Test (R&D only)
Reduce cost of test, simplify testing and be assured of accuracy using digitally integrated, calibrated noise and fading patterns.
Application Note 2005-08-15 |
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Understanding Measurement of 1xEV-DO Access Terminals (AN 1414)
Basic concepts of 1xEV-DO, Forward link receiver measurements, Reverse link, and more...
Application Note 2004-12-10 |
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E4438C Signal Studio for 1xEV-DO Application Note
This application note is a self-guided tutorial describing the test signals that can be created with Signal Studio for 1xEV-DO.
Application Note 2003-06-13 |
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Forward Link Measurements for 1XEV-DO Access Networks (AN 1398)
Application Note 2002-11-11 |
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E443xB Signal Studio for 1xEV-DO Product Overview
This 2-page product overview contains the main features, benefits, and ordering information for Option 404 for the E443xB.
Application Note 2002-01-31 |
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E443xB Signal Studio for 1xEV-DO Application Note
This application note is a self-guided tutorial describing the test signals that can be created with Signal Studio for 1xEV-DO.
Application Note 2002-01-31 |
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