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EM Insights Series
The EM Insights series is a collection of EM applications from Agilent EEsof EDA.

Notes d’application 2013-05-06

Electronic System-Level (ESL) Applications Center
Electronic System-Level application examples highlighting Agilent’s broad range of ESL applications, design functions and product areas.

Notes d’application 2013-04-02

Using SystemVue for Integrating Wireless PHY Design, Validation, and Test
Agilent SystemVue integrates system-level design tasks such as DSP modeling and Algorithm development with Validation and Test to create a unique new design flow for communications physical layer.

Notes d’application 2013-03-28

PDF PDF 8.17 MB
Equivalent Circuit Based Models For Surface Mount RLC Components
Modelithics white paper on understanding S-parameter versus equivalent circuit-based models for surface mount RFC components.

Notes d’application 2013-02-06

Simulating Envelope Tracking with Advanced Design System
This example applies envelope tracking to an example amplifier to show techniques of using Advanced Design System (ADS) for this type of design.

Notes d’application 2012-11-22

PDF PDF 2.30 MB
Creating C++ Algorithms in SystemVue Using Model Builder
The SystemVue C++ Model Builder interface provides a powerful mechanism for exploring signal processing algorithms for communications system design.

Notes d’application 2012-11-14

PDF PDF 1.53 MB
Frequency Domain Analysis of Jitter Amplification in Clock Channels
Clock channel jitter amplification factor in terms of transfer function or S-parameters is derived. Amplification is shown to arise from smaller attenuation in jitter lower sideband than in the fundamental. Amplification scaling with loss is obtained.

Notes d’application 2012-11-01

PDF PDF 257 KB
Wideband Digital Pre-Distortion with Agilent SystemVue and PXI Modular Instrument
Digital Pre-Distortion (DPD) is essential for wideband communications systems based on LTE-Advanced and 802.11ac. Overcome DPD challenges with trusted commercial measurement and modeling tools.

Notes d’application 2012-10-15

PDF PDF 1.03 MB
Langues 
Explore the SERDES Design Space Using the IBIS AMI Channel Simulation Flow
Simulation of modern chip-to-chip links requires you abandon the SPICE-based approach and adopt a new approach based on an IBIS AMI channel simulation flow.

Notes d’application 2012-09-21

PDF PDF 467 KB
Langues 
Virtual Flight Testing of Radar System Performance
Agilent SystemVue and AGI STK can be integrated to provide virtual flight testing of radar and electronic warfare algorithms, saving both time and money.

Notes d’application 2012-09-21

PDF PDF 633 KB
FPGA Prototyping Using Agilent SystemVue
This application note describes a top-down FPGA design flow using SystemVue for rapid prototyping of physical layer communications signal processing.

Notes d’application 2012-08-30

PDF PDF 3.37 MB
Testing New-generation Wireless LAN - Application Note
This application note introduces the new WLAN new-generation testing technology of 802.11ac. Agilent's 802.11ac software allows engineers to view and troubleshoot all 802.11ac modulation formats.

Notes d’application 2012-05-22

PDF PDF 881 KB
Which Electromagnetic Simulator Should I Use?
This paper outlines three of the key EM simulation technologies, MoM, FEM, FDTD and attempt to compare and contrast the relative merits of each.

Notes d’application 2012-04-06

PDF PDF 3.21 MB
Simulating FPGA Power Integrity Using S-Parameter Models
This application note describes how self-impedance (frequency) can easily be determined by simulating the frequency domain self-impedance profile of a Power Distribution Network (PDN).

Notes d’application 2012-04-02

PDF PDF 5.68 MB
Langues 
Mixed-Signal Integration Challenges in Complex Radar Systems
Using A Common Measurement Platform to Address the Mixed-Signal Integration Challenges in Complex Radar Systems presents an alternate design and test approach for today’s complex radar systems.

Notes d’application 2012-02-10

PDF PDF 1.99 MB
Using Agilent SystemVue to Create Realistic Scenarios for Radar and EW Applications
Shows how the combination of software and hardware capabilities makes it possible to create dynamic and realistic scenarios for both component testing and scenario simulation for system test.

Notes d’application 2012-01-24

PDF PDF 3.01 MB
Statistical Modeling in MBP
This application note introduces the statistical module in Model Builder Program (MBP). The module’s contents, including data format, plot configuration, Monte Carlo (MC) analysis, extraction flow, and IMV plot are covered. Knowledge Center login required.

Notes d’application 2011-12-01

Mismatch Modeling in MBP
This application note introduces the basic components of Model Builder Program’s (MBP’s) mismatch module. The steps to run the built-in extraction flow, and how to configure and plot an IMV graph in MBP are also demonstrated. Knowledge Center login required.

Notes d’application 2011-12-01

Simulating High-Speed Serial Channels with IBIS-AMI Models
This paper reviews some of the benefits and limitations of using IBIS models and introduces the new AMI extensions to the latest IBIS version 5.0 specification.

Notes d’application 2011-11-15

PDF PDF 327 KB
Langues 
Loading Multi-Die Data in MBP
This application note describes how to set up the script-based environment so that MBP can load and utilize ET data. Knowledge Center login required.

Notes d’application 2011-10-01

Load Pull + NVNA = Enhanced X-Parameters for PA Designs
With high mismatch and technology-independent large-signal device models.

Notes d’application 2011-09-08

Langues 
Lib Test in Model Quality Assurance
This application note describes how to run quick checking on the model libraries by using the Lib Test feature in Model Quality Assurance (MQA). Knowledge Center login required.

Notes d’application 2011-09-01

Optimization Weight Setting
This application note describes how to set weight in Model Builder Program (MBP). Knowledge Center login required.

Notes d’application 2011-08-01

TMI Aging Model Application
This application note describes how to implement a TSMC Modeling Interface (TMI) aging model in Model Builder Program (MBP). Knowledge Center login required.

Notes d’application 2011-08-01

Adding Additional Instance Parameters
This application note describes how to add additional instance parameters in Model Builder Program (MBP). Knowledge Center login required.

Notes d’application 2011-08-01

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