전문가 상담

기술 지원

전자 측정

모델번호로 검색: 예제: 34401A, E4440A

1-25 / 81

정렬방식:
Power-Consumption Measurements for LTE User Equipment - Application Note
This application note focuses on determining how certain parameters affect a specific smartphone's power consumption and figure out how to adjust the parameters to improve battery life.

어플리케이션 노트 2014-06-06

PDF PDF 353 KB
IV Characterizations of Solar Cells Using the Agilent B2900A Series of SMUs - Technical Overview
The Agilent B2900A Series Precision SMU allows you to accurately and quickly make characterization of photovoltaic cells with its intuitive GUI and free PC-based application software.

어플리케이션 노트 2014-02-10

Ultra-Low Noise Filter Minimizes B2961A/62A Power Source Noise Density - Application Brief
This 2-page Application Brief introduces N1294A-021 Ultra Low Noise Filter which is suitable for the application requiring low noise power supply such as the evaluation of A/D Converter, Oscillator, Amplifiers.

어플리케이션 노트 2014-01-27

PDF PDF 698 KB
Low Noise Filter Improves B2961A/62A Power Source Noise Performance - Application Brief
This 2-page application brief introduces N1294A-022 Low Noise Filter which enables the B2961A/62A to source clean voltage equivalent to that of much costlier precision linear voltage/current source instruments.

어플리케이션 노트 2014-01-24

PDF PDF 543 KB
GaN Current Collapse Effect Evaluation Using the B1505A – Application Brief
This document outlines how the B1505A with the N1267A High Voltage Source Monitor Unit/High Current Source Monitor Unit Fast Switch can be used to solve GaN current collapse measurement challenges.

어플리케이션 노트 2013-09-30

DC-DC Converter Evaluation - Flyer
This 1-pager describes "Quick Bench-top Evaluation" of DC-DC converter and shows real measurement results of DC and transient tests made by B2900A series.

어플리케이션 노트 2013-08-29

PDF PDF 1.04 MB
LDO Linear Regulator Evaluation - Flyer
This 1-pager describes "Quick Bench-top Evaluation" of an LDO linear regulator and shows real measurement results made by B2900A series.

어플리케이션 노트 2013-06-14

PDF PDF 205 KB
SMU (Source/Measure Unit) for ICs and Electronic Components
This is introductory flyer for a series of "Quick Bench-top Evaluation" flyers scheduled to be developed every month until May or June 2012. B2900 series

어플리케이션 노트 2013-05-24

MEMS Accelerometer Evaluation
This 1-pager describes "Quick Bench-top Evaluation" of a MEMS accelerometer and shows real measurement results made by B2900A series.

어플리케이션 노트 2013-05-24

Optoelectronic IC/Component Evaluation
This 1-pager describes "Quick Bench-top Evaluation" of an optoelectronic component (optocoupler) and shows real measurement results made by B2900A series.

어플리케이션 노트 2013-05-23

PDF PDF 281 KB
Choosing System DC Power Supplies to Optimize System Integration and Performance - Application note
Your power supply choice affects the assembly, performance and longevity of your test system. Lower integration costs, faster throughput, better DUT protection, better test integrity and longer system.

어플리케이션 노트 2013-04-01

PDF PDF 476 KB
Diode Evaluation Using the Agilent B2911A
This technical overview shows how the Agilent B2900A Series Precision SMU allows you to accurately and easily measure the basic IV parameters and characteristics of diodes.

어플리케이션 노트 2013-01-22

Characterization of Bipolar Transistors Using the Agilent B2912A
This technical overview describes the characterization of Bipolar transistors using the B2900a precision source/measure units.

어플리케이션 노트 2013-01-07

IV characterization of OLEDs using the Agilent B2911A
This technical overview describes IV characterization of OLED's using the B2900 series precision source/measure units.

어플리케이션 노트 2013-01-07

Characterization of Field Effect Transistors Using the Agilent B2912A
The Agilent B2900A Series Precision SMU allows you to evaluate IV characteristics of FET accurately and quickly with its intuitive GUI and free PC-based application software.

어플리케이션 노트 2013-01-07

LIV Test of Laser Diode Using the Agilent B2912A
This application introduces features of B2900A Series as the best solution for LIV test of laser diode.

어플리케이션 노트 2013-01-07

Resistor Production Test Using the Agilent B2911A
This technical overview describes the use of the B2900 series of precision source/measure units for resistor production test.

어플리케이션 노트 2013-01-07

Varistor Production Test Using the Agilent B2911A
This technical overview describes the use of the B2900 series of precision source/measure units for varistor production test.

어플리케이션 노트 2013-01-07

Diode Production Test Using the Agilent B2911A
This technical overview shows how to use the Agilent B2900A Series Precision SMU for production diode test, in addition to the features that make it well-adapted for production test.

어플리케이션 노트 2013-01-07

Thermistor Production Test Using the Agilent B2911A
This technical overview shows how to use the Agilent B2900A Series Precision SMU for production thermistor test, in addition to the features that make it well-adapted for production test.

어플리케이션 노트 2013-01-07

Thermistor Evaluation Using the Agilent B2911A
This application introduces features of B2900A Series as the best solution for accurate characterization of thermistor and other two terminal devices.

어플리케이션 노트 2013-01-07

LED Production Test Using the Agilent B2911A
This technical overview describes LED production test using the B2900A series precision source/measure unit.

어플리케이션 노트 2013-01-07

LED IV Measurement Using the Agilent B2911A
This technical overview describes the use of LED IV measurements using the B2900 Series Precision source/measure unit.

어플리케이션 노트 2013-01-07

Fast fT-Ic Measurement Using the Agilent B2912A
This technical overview describes the use of the B2900 series to make Fast fT-Ic measurements

어플리케이션 노트 2013-01-07

Varistor Evaluation Using the Agilent B2900A Series
This application introduces features of B2900A Series as the best solution for accurate characterization of varistor and other two terminal devices.

어플리케이션 노트 2013-01-07

1 2 3 4 다음