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Graphene Studies: Utilization of Atomic Force Microscopy for Nanoscale Investigations of Graphene

Application Note 2013-03-04

PDF PDF 738 KB
Exploring Phase Noise Measurement Methods and Techniques - Application Note
This note provides a heuristic overview of phase noise fundamentals before describing the three most common measurement techniques and where they apply.

Application Note 2013-03-04

PDF PDF 1.50 MB
DVB-T and DVB-T2 Transmitter Test Challenges - Application Note
This application note presents a discussion of the DVB-T and DVB-T2 systems and the measurement challenges facing developers of transmitters for these systems.

Application Note 2013-02-27

PDF PDF 986 KB
Make High Sensitivity, Wide Dynamic Range Current Measurement - Application Note
The new N2820A Series high-sensitivity current probes from Agilent Technologies address the need for high-sensitivity current measurements with a wide dynamic range.

Application Note 2013-02-26

PDF PDF 623 KB
Jitter Measurements on Long Patterns Using 86100DU-401 Advanced Waveform Analysis - Application Note
To overcome pattern length limitations found in many of today’s jitter analysis tools, Agilent developed a Microsoft Office Excel-based application called 86100DU Option 401 Advanced Waveform Analysis

Application Note 2013-02-21

PDF PDF 3.47 MB
Quality Measures for Complex Modulated Signals Reaching for Standardization - Application Note
Complex modulation is now being broadly accepted in optical data transmission. The app note investigates if the quality parameters are ready to be standardized and to replace traditional parameters.

Application Note 2013-02-19

Agilent Method of Implementation (MOI) for DisplayPort Cable-Connector Assembly Compliance Test
Agilent Method of Implementation (MOI) for DisplayPort Cable-Connector Assembly Compliance Test Using Agilent E5071C ENA Network Analyzer Option TDR

Application Note 2013-02-18

PDF PDF 1.29 MB
Pulse Parameter Definitions - Application Note
Here you find the pulse parameter definitions of terms used in the instrument specifications of Pulse Pattern Generators. Model Nos: 81110A, 81111A, 81112A, 81150A, 81160A, 81130A, 81131A, 81132A, 81133A, 81134A, 81180B, M8190A

Application Note 2013-02-14

PDF PDF 793 KB
Agilent Method of Implementation (MOI) for MHL Cables Compliance Tests
Agilent Method of Implementation (MOI) for MHL Cable Compliance Tests Using Agilent E5071C ENA Network Analyzer Option TDR

Application Note 2013-02-14

Achieve High Speed, Multichannel Data Acquisition with the M9703A AXIe Digitizer apnote
This application note describes the measurement and analysis of cross channel skew in multichannel high speed digitizers.

Application Note 2013-02-11

Techniques for Precise Interference Measurements in the Field - Application Note
This app note discusses the different types of interference in current and new systems and methods to measure a variety of interference types using spectrum analyzers such the FieldFox Series.

Application Note 2013-02-08

Techniques for Precise Measurement Calibrations in the Field - Application Note
This application note discusses recent advances in VNA calibration and compares measurements made on a FieldFox analyzer using different calibration types for a variety of RF and microwave devices.

Application Note 2013-02-08

Equivalent Circuit Based Models For Surface Mount RLC Components
Modelithics white paper on understanding S-parameter versus equivalent circuit-based models for surface mount RFC components.

Application Note 2013-02-06

Testing DVB-T and DVB-T2 Receivers - Application Note
This application note presents a discussion of the DVB-T and DVB-T2 systems and the measurement challenges facing developers of receivers such as set-top-boxes.

Application Note 2013-02-02

PDF PDF 716 KB
7 Reasons to Upgrade from Your 8753x to an ENA Network Analyzer - Application Note
Many 8753x users have replaced their analyzers with the ENA since its introduction in November 2001. Although the reasons for making this change to some extent depend on the customer's particular situation, it is easy to highlight the ENA features that are most highly valued by our customers. This document tries to help 8753x users understand how the ENA can improve their network measurement environment, especially in applications related to RF component production tests.

Application Note 2013-01-31

High-Accuracy Noise Figure Measurements Using the PNA-X Series Network Analyzer – App Note 1408-20
This application note discusses the unique challenges involved in minimizing noise figure.

Application Note 2013-01-31

PDF PDF 2.54 MB
Optimize burn-in test with the Agilent 34980A multifunction switch/measure unit apnote overview
This application overview will discuss the complexities of burn-in test based on the Agilent 340980A switch/measure unit

Application Note 2013-01-31

PDF PDF 440 KB
Simple Scalar Network Analysis of Frequency Converter Devices - Application Note
This application note shows the way to make easy scalar network analysis or power measurement using the Agilent U2000 series USB power sensor with the ENA network analyzers.

Application Note 2013-01-28

PDF PDF 606 KB
Paperless Calibration - White Paper
Discusses the benefits of storing calibration records electronically rather than on paper in filing cabinets and explains why having a hard copy of these files is not necessary.

Application Note 2013-01-25

PDF PDF 1.97 MB
DDR4 TdiVW/VdiVW Bit Error Rate Measurement or Understanding Bit Error Rate
Importance of making BER measurement calculations to form a statistical measurement of total jitter to understand the design's data valid window result and design error rates.

Application Note 2013-01-24

PDF PDF 1.65 MB
Characterizing Hi-speed USB 2.0 Serial Buses in Embedded Designs - Application Note
The USB 2.0 serial interface has been rapidly replacing older RS-232 serial interfaces in embedded designs.

Application Note 2013-01-24

Diode Evaluation Using the Agilent B2911A
This technical overview shows how the Agilent B2900A Series Precision SMU allows you to accurately and easily measure the basic IV parameters and characteristics of diodes.

Application Note 2013-01-22

Tips and Tricks for Using the 34450A 5 1/2 Digit Bench Top Digital Multimeter - Application Note
This application note provides some useful tips on some of the key features of the 34450A digital multimeter.

Application Note 2013-01-18

Addressing the Challenges of Deploying Single Frequency Networks DVB-T & DVB-T2 - Application Note
This application addresses the challenges of deploying SFN systems for digital video broadcasting and describe's Agilent's solutions for meeting these challenges.

Application Note 2013-01-17

PDF PDF 1.58 MB
Seeing is Believing:Video integration for Agilent UTM T150 - Application Note
Overview of features and benefits using video integration on the T150 UTM

Application Note 2013-01-16

PDF PDF 202 KB

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