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Understanding Phase Noise Needs and Choices in Signal Generation
This application note reviews the fundamentals of phase noise and takes a closer look at architectural choices and the effects of various functionality alternatives.

Application Note 2013-01-14

PDF PDF 468 KB
Evolution of Dynamic Mechanical Properties of Nylon-PET Island-in-the-Sea Biocomponent Fibers
Study of mechanical properties of individual nylon-PET bicomponent IS fibers, with two different PET molecular weights, were characterized using the Agilent T150 UTM.

Application Note 2013-01-10

PDF PDF 265 KB
Language of Specifications - White Paper
This paper explains some of the arcane language used in describing a product's characteristics.

Application Note 2013-01-08

PDF PDF 508 KB
Varistor Production Test Using the Agilent B2911A
This technical overview describes the use of the B2900 series of precision source/measure units for varistor production test.

Application Note 2013-01-07

LIV Test of Laser Diode Using the Agilent B2912A
This application introduces features of B2900A Series as the best solution for LIV test of laser diode.

Application Note 2013-01-07

LED Production Test Using the Agilent B2911A
This technical overview describes LED production test using the B2900A series precision source/measure unit.

Application Note 2013-01-07

Varistor Evaluation Using the Agilent B2900A Series
This application introduces features of B2900A Series as the best solution for accurate characterization of varistor and other two terminal devices.

Application Note 2013-01-07

Resistor Production Test Using the Agilent B2911A
This technical overview describes the use of the B2900 series of precision source/measure units for resistor production test.

Application Note 2013-01-07

Thermistor Evaluation Using the Agilent B2911A
This application introduces features of B2900A Series as the best solution for accurate characterization of thermistor and other two terminal devices.

Application Note 2013-01-07

Thermistor Production Test Using the Agilent B2911A
This technical overview shows how to use the Agilent B2900A Series Precision SMU for production thermistor test, in addition to the features that make it well-adapted for production test.

Application Note 2013-01-07

Characterization of Field Effect Transistors Using the Agilent B2912A
The Agilent B2900A Series Precision SMU allows you to evaluate IV characteristics of FET accurately and quickly with its intuitive GUI and free PC-based application software.

Application Note 2013-01-07

LED IV Measurement Using the Agilent B2911A
This technical overview describes the use of LED IV measurements using the B2900 Series Precision source/measure unit.

Application Note 2013-01-07

Fast fT-Ic Measurement Using the Agilent B2912A
This technical overview describes the use of the B2900 series to make Fast fT-Ic measurements

Application Note 2013-01-07

Characterization of Bipolar Transistors Using the Agilent B2912A
This technical overview describes the characterization of Bipolar transistors using the B2900a precision source/measure units.

Application Note 2013-01-07

IV characterization of OLEDs using the Agilent B2911A
This technical overview describes IV characterization of OLED's using the B2900 series precision source/measure units.

Application Note 2013-01-07

Diode Production Test Using the Agilent B2911A
This technical overview shows how to use the Agilent B2900A Series Precision SMU for production diode test, in addition to the features that make it well-adapted for production test.

Application Note 2013-01-07

USB Power Sensors Single/Multi-Channel Power Measurement - Application Note
In many of today's power measurement applications there is a need to make multiple power measurements simultaneously. Added complexities occur when the measurements need to be obtained from places where access is inconvenient, or when the distance to the measurement location exceeds the IEEE industry-specified USB cable length of 5 meters (16 feet).

Application Note 2013-01-03

PDF PDF 948 KB
Rapid Hardness of Nano-Structured Metals - Application Note
A method to radiply characterize copper-nickel multilayers wherein inindividual layers vary in thickness between 1nm and 100nm is demonstrated and discussed.

Application Note 2013-01-03

PDF PDF 174 KB
34980A Measurements Made Easy
This document includes examples with the few steps needed to make measurements using the 34980A's 1) front panel, 2) built-in web interface, and 3) Command Expert software.

Application Note 2012-12-26

PDF PDF 1.26 MB
Calibration of Time Base Oscillators - White Paper
As more accurate clocks were produced, new uses of time measurement were explored. As new uses were discovered, the need for even more accurate clocks became apparent.

Application Note 2012-12-21

PDF PDF 438 KB
Specifications Guidelines - White Paper
Agilent Technologies has definitions for its Test & Measurement product specifications and how they are presented. The following material is extracted from these manufacturing recommendations.

Application Note 2012-12-21

PDF PDF 1.80 MB
Crystal Oscillator Testing - White Paper
A policy concerning the testing of the reference oscillators contained within many instruments has been defined and adopted in Agilent's service centers worldwide.

Application Note 2012-12-21

PDF PDF 1.41 MB
Exploring Signal Interactions with Multi-Measurements in the 89600 VSA Software
This application note describes how to make multiple measurements simultaneously using 89600 VSA software with one or more measurement front ends.

Application Note 2012-12-20

PDF PDF 2.64 MB
Accelerate FPGA Debug using High Bandwidth Mixed Signal Oscilloscopes - Application Note
This application note discusses both digital and analog debug of state-of-the-art FPGAs using a high bandwidth mixed signal oscilloscope.

Application Note 2012-12-20

PDF PDF 2.36 MB
Agilent Frequency Counter Programming Comparison Guide
SCPI Programming comparison guide for the Agilent 53200 Series (53210A, 53220A, 53230A) and 531xxA Series (53131A, 53132A, 53181A) RF and Universal Frequency Counter/Timers.

Application Note 2012-12-17

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