Technical Support

Test & Measurement

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InfiniiVision 4000 X-Series Videos on YouTube InfiniiVision 4000 X-Series Videos on YouTube Demo 2012-10-25	Languages English \| 2012-10-25 中文（简体）
InfiniiVision 2000 X-Series Videos on YouTube InfiniiVision 2000 X-Series Videos on YouTube Demo 2012-10-23	Languages English \| 2012-10-23 中文（简体）
FieldFox Handheld RF Analyzers – YouTube Playlist FieldFox Handheld RF Analyzers – YouTube Playlist Demo 2012-10-23	Languages English 中文（简体）
E8257D, E8267D PSG Signal Generator Demo Videos on YouTube Explore YouTube for videos on the E8257D and E8267D PSG signal generators. Demo 2012-10-21	Languages English 中文（简体）
High Speed Digital Videos - PCIe Agilent engineers are experts in test and focus on developing equipment and systems ahead of the technology wave. Demo 2012-10-19
Calibration Services & Repair Videos on YouTube Explore YouTube for videos on Agilent's Calibration Services & Repair. Demo 2012-10-19	Languages English 中文（简体）
High Speed Digital Videos - Memory (DDR, LPDDR, Flash) Agilent engineers are experts in test and focus on developing equipment and systems ahead of the technology wave. Demo 2012-10-19
Demo_DLL files Demo_dll, BT-Basic testplan, database files Demo 2012-10-18	ZIP 36 KB
High Speed Digital Videos Agilent engineers are experts in test and focus on developing equipment and systems ahead of the technology wave. Demo 2012-10-18
External DLL Demos External DLL Demos Demo 2012-10-18	EXE 252 KB
IQ Baseband Builder for the Agilent 33522A, 33522B, 33512B This downloadable demo shows you how to generate ideal as well as non-ideal IQ baseband signals for Agilent 33512B, 33522A, and 33522B Waveform Generators Demo 2012-10-15
ENA Series Video Demos Demo 2012-10-15
Memory industry update series: Video 4 – Signal and Packaging Revolutions This fourth video in the series of 6 provides an overview of the signaling and packaging revolutions. It discusses the impact on packaging and interconnect, deployment of chip stacks in new memory, the impact on wide IO, the impact on computing architecture and more. Demo 2012-10-09
Revolutionize Memory Debug and Validation with Bus Level Signal Integrity Insight Video Compare eye scans from the U4154A logic analyzer to all systems being scanned, relative to each other and to the system, to gain bus-level insight and save time in the debug and validation cycle. Demo 2012-10-09
Overcome Signal Integrity Challenges This video will explore the early stages of high speed digital design flow, focusing on IC model generation and pre-layout with channel simulation design and analysis. The video was produced at the 2012 DesignCon conference and expo in Santa Clara, CA. Demo 2012-10-09	MP4 144 MB
Memory industry update series: Video 1 – Introduction This first video in the series of 6 introduces what’s next for memory designs in 2012 and gives an overview of the current memory technology. Demo 2012-10-09
DDR3 Debug and Validation This video speaks to DDR3 debug and validation techniques and introduces two new techniques of bus level signal integrity insight from a logic analyzer, and real time DDR3 violation detection. This video was produced at the 2012 DesignCon conference and expo in Santa Clara, CA. Demo 2012-10-09	MP4 125 MB
Saving time with the DDR setup assistant Video DDR setup assistant walks you through setting up your DDR measurements. Demo 2012-10-09
Using Burst Trigger to Capture DDR3 Burst Data Video Triggering on sequential bursts of data at data rates up to 2.5Gb/s is made easy with powerful new triggering on the U4154A. Demo 2012-10-09
Achieving Standard Compliance for RX Testing This video explores achieving standard compliance for receivers on PCI3 cards; using PCIe3 as the example due to the added complexity of PCIe3. This video was produced at the 2012 DesignCon conference and expo in Santa Clara, CA. Demo 2012-10-09
DDR3 Signal Integrity Insight from a Logic Analyzer Video HW accelerated, colorized Eye scan on the U4154A provides Signal Integrity insight. Demo 2012-10-09
Advanced Signal Integrity Measurement This video introduces some trends in the high speed serial standards market, specifically focusing on stressed eye diagrams for interconnects and impedance measurements of active devices in the operating conditions or hot TDR measurements. This video was produced at the 2012 DesignCon conference and expo in Santa Clara, CA. Demo 2012-10-09
Memory industry update series: Video 5 – Design and Test Revolutions This fifth video in the series of 6 discusses design and test revolutions focusing on embedded, mobile and flash memory and its impact. Demo 2012-10-09
Test Methodologies for Optimizing Design This video speaks to DDR3 debug and validation techniques and introduces two new techniques of bus level signal integrity insight from a logic analyzer, and real time DDR3 violation detection. This video was produced at the 2012 DesignCon conference and expo in Santa Clara, CA. Demo 2012-10-09
Memory industry update series: Video 2 – Current Memory Technologies This second video in the series of 6 provides a current memory technology update and go through the memory technology types in depth. Demo 2012-10-09

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