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Measuring Propagation Delay with a Universal Counter Make a signal path delay measurement, understand precision available with counters and more. (Email address required) Article 2009-12-18
Understanding the Operation and Test of a Bluetooth Enhanced Data Rate Radio Helen Mills, Agilent Technologies, Microwave Journal Article 2009-12-16
Accelerating Advanced Node CMOS RFIC Design Microwave Journal article by David Vye Journal 2009-12-07
Device Characterization and Verification with the Agilent 81200 This Application Note originally was an article that appeared in the January issue of Microwave Product Digest. The Note shows you how to do device characterization and verification with the Agilent 81200 Data Generator/Analyzer Platform. Article 2009-11-25	PDF 282 KB
Evaluation Engineering (EE) Article, "CTL: The New Language of DFT" Find the answers to questions about CTL -- what is it, and why is it important to the semiconductor industry. Article 2009-11-20
1-GHz Digital Channel Multiplexer for Satellite Outdoor Unit Based on a 65-nm CMOS Transceiver STMicroelectronics needed to rapidly evaluate and prototype real-world effects on a high-performance wideband PHY architecture for satellite communications and used Agilent SystemVue from Agilent EEsof EDA. Étude de cas 2009-11-17	PDF 116 KB
Characterizing Non-Standard Impedance Channels with 50 Ohm In Article 2009-11-16	PDF 2.24 MB
Practical Analysis of Backplane Vias Article 2009-11-16	PDF 2.40 MB
VNA Characterization of Cable Assemblies for Supercomputer Applications Article 2009-11-16	PDF 2.48 MB
ISO9000 certified repair centers for ICT and imaging inspection systems ISO9000 certified repair centers for ICT and imaging inspection systems Dossier 2009-11-16
Making Digital Flat Panels Better Article 2009-10-27
WIN Semiconductors Announces New MMIC Tool Bar Personality for ADS Process Design Kits Bulletin d'information 2009-10-23
SP50 manuals get friendly Dossier 2009-10-12
X-Parameters: Commercial Implementations for the Latest Technology Enable Mainstream Applications This article reprint from Microwave Journal introduces advances in commercially available solutions for characterization, modeling, and design of nonlinear components and systems based on X-parameters Article 2009-10-09	PDF 1.92 GB
N2X to Support Leading Carrier Ethernet Vendors at Major Interoperability Demonstration Agilent Offers First-to-Market Synchronization Solution to Ensure Service Quality for Ethernet Networks; Tools to Simulate, Test Ethernet Operations, Maintenance Bulletin d'information 2009-09-29
Intellectual property and copyright protection on Agilent ICT products This letter advises areas of intellectual property and copyright protection to look out for when customers elect to purchase Agilent in-circuit test products from third party vendors. Dossier 2009-09-10	PDF 111 KB
Test Systems Using Agilent´s USB Modular Instruments Article published in IEEE Latin America and the Caribbean Newsletter Issue Number 63 on June 2009. Article 2009-09-07	PDF 74 KB
Agilent USB Modular Instruments – allies for educators and students Article published in IEEE Latin America and the Caribbean Newsletter Issue Number 64 on August 2009. Article 2009-09-07	PDF 158 KB
Transforming MIMO Test With Fast, Accurate Signal Creation, Signal Analysis, and Protocol Developmen Multiple-Input Multiple-Output (MIMO) is one of several forms of multiple antenna techniques available today designed to significantly improve communication performance. Bulletin d'information 2009-08-26
Accessing Service Notes for your Automated Test Systems Agilent Service Notes Bulletin d'information 2009-08-18
Latest CAMCAD Professional and RSI Exchange patches available Dossier 2009-08-11
Agilent Awards $1.275M Foundation Grants Bulletin d'information 2009-08-04
Agilent Announces Winner of Early Career Professor Award Bulletin d'information 2009-08-04
Microwaves and RF Cover Article: Nonlinear VNAs Extend to 50 GHz Article 2009-07-23
Security in the LTE-SAE Network Article 2009-07-23	PDF 688 KB

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