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Inphi Delivers Memory Interface Chip for DDR3-1600 Using Advanced Design System This Success Story details how Inphi delivered memory interface chip for DDR3-1600 using Agilent’s Advance Design System (ADS). 사례연구 2009-03-12	PDF 196 KB
In-Circuit Test Channel Partner Interview Series: Everett Charles Technology The channel partners series began with an exploration of programming houses. It is not that we venture into the Fixture house side of the business. Please enjoy this extension of the article series. 특집 기사 2009-03-10	PDF 94 KB
In-Circuit Test Channel Partner Interview Series: QXQ, Inc. This article is continues to educate on fixture houses in relation to in-circuit test as the article series explores fixturing houses that Agilent works regularly with. This article features QXQ, Inc. 특집 기사 2009-03-04	PDF 94 KB
In-Circuit Test Channel Partner Interview Series: TestingHouse Inc. his article is the fourth in the series of education pieces relating to in-circuit test programming houses that Agilent works regularly with. This article features TestingHouse Inc., from a programming house perspective. 특집 기사 2009-03-03	PDF 95 KB
In-Circuit Test Channel Partner Interview Series: Circuit Check, Inc. Circuit Check, Inc. provides comment in the editorial series serving to educate our in-circuit test contacts about the variety of fixture houses that Agilent has partnerships with. 특집 기사 2009-02-28	PDF 91 KB
Addressing the Design and Verification Challenges of LTE Wireless Design magazine article on testing LTE. 기사 2009-02-25	PDF 4.59 MB
Agilent Division Delivers Early Test Solutions for LTE User Equipment Agilent SystemVue greatly accelerates time-to-market for LTE products. 사례연구 2009-02-20	PDF 282 KB
EDN - Simulation gets speed, capacity boost Electronic Design, Strategy, News (EDN) feature story by Rick Nelson. 사례연구 2009-01-22
Volumetric Paste Measurement using Solder Paste Inspection (SPI) Written by : Jeff Bishop, Product Marketing Engineer, Agilent Technologies. The online recording discusses the techniques used for 3D paste analysis, accuracy of the measurements, and how these tools can be integrated into production affectively. 특집 기사 2009-01-20
The Fifth Harmonic: Tradeoffs Between Sampling and Real-Time Oscilloscopes When determining the required system bandwidth some vendors will use a “fifth harmonic” rule of thumb; however it is important to understand typical conditions at the receiver to accurately determine the amount of bandwidth you will need. 기사 2009-01-19
Improving DQPSK Receiver Design for Satcom Apps Reprint of technical article in Comms Design, 1/2003 기사 2009-01-16
Offering Merges Design and Test Agilent featured in Wireless Systems Design magazine article 기사 2009-01-16
What Every RF Engineer Should Know: Power Amplifiers Feature story by Janine Love. 기사 2009-01-12
Concepts of Orthogonal Frequency Domain Modulation (OFDM) 기사 2009-01-07
Eye-Diagram Analysis Speeds DDR SDRAM Validation 기사 2009-01-06
Validating the Physical and Protocol Layers in DDR Memory Interfaces 기사 2009-01-06
A Year in Wireless (WDD) From the Wireless Design & Development Board Member's Point of View: What Caught Them by Surprise in 2008 and the Changes to Come in 2009. 사례연구 2009-01-02
Electronic Products - 2008 Product of the Year Award Analyzer changes fundamental way communications networks are designed 기사 2009-01-01
Is the 5th Harmonic Still Useful for Predicting Data Signal Bandwidth? This article, published in High Frequency Electronics, compares using the 5th harmonic to using the system rise/fall times to determine the required bandwidth for your system. The article begins on page 18. 기사 2009-01-01
Testing LTE Design simulation can be useful in addressing LTE design and verification challenges but requires consideration in selecting the appropriate model abstraction for the given phase of the design cycle. 사례연구 2008-12-31
Testing Challenges of SDR's A new modeling methodology combines FPGAs and detailed circuit-level modeling in a design-to-test flow. 사례연구 2008-12-31
What Every RF Engineer Should Know: OFDM & WiMax Feature story by Janine Love. 사례연구 2008-12-27
In-Circuit Test Channel Partner Interview Series: Masterpiece Engineering This article is the third in the series of education pieces relating to in-circuit test programming houses that Agilent works regularly with. This article features Masterpiece Engineering, from a programming house perspective. 특집 기사 2008-12-16	PDF 106 KB
The Value Of Traceable S-Parameter Characterization Of Electro-Optical Components' 기사 2008-12-01
Article - The Evolution of Optical Transceiver Test 기사 2008-12-01

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