Contact an Expert

Technical Support


Find by Product Model Number: Examples: 34401A, E4440A

26-50 of 141

Agilent embraces GaN modeling in IC-CAP upgrade
EETimes Design Article highlights new capabilities in IC-CAP 2013.01.

Article 2013-01-09

Future Device Modeling Trends
Modeling the nonlinear device (basic nonlinear component) for circuit and system simulation downstream.

Article 2012-11-28

Enabling Fast Characterization of PA Performance with Modulated Signals
Microwave Product Digest (MPD) featured article written by Agilent Technologies' Andy Howard.

Journal 2012-10-15

Optimize Signal/Spectrum Analyzer Throughput for High-Volume Manufacturing Test
The Microwaves & RF article discusses how to obtain the highest throughput for the analyzers used in manufacturing test by creating a test plan that accounts for speed, repeatability, and dynamic range.

Article 2012-08-20

Testing Radar and EW Systems for the Real-World
The solutions described in this Microwave Journal article do more than address a wide range of present and future radar systems: They also help overcome organizational hurdles.

Article 2012-07-12

Product How To: Design a polar frequency discriminator
Polar frequency discriminators (PFD) are widely used in radar and direction-finding applications to determine the unknown frequency of incoming pulses. This article explains how to design the RF portion of a PFD, over a frequency range of 2 to 8 GHz, using Agilent’s ADS software.

Article 2012-06-08

How to design a high-performance scope: One team’s approach
EE Times Design Article on how an Agilent Technologies design team discovers some valuable lessons that could prove useful for any designer or design team looking for success on their next project.

Article 2012-06-07

Sorting Through EM Simulators
Matching an electromagnetic simulator to a particular application requires an understanding of the different simulation technologies at the heart of these software tools.

Article 2012-05-25

Addressable Test Structures for MOSFET Variability Analysis
This IEEE paper presents a 4-bit addressable array-based test structure with a centre reference transistor allowing evaluation of variability in advanced technologies.

Article 2012-03-19

Defining the 4G PHY Architecture Design Challenges
EE Times design article (Part 1) on defining the 4G PHY architecture design challenges.

Journal 2011-12-05

Using SystemVue to Overcome 4G Challenges
EE Times design article (Part 2) on using SystemVue to overcome 4G challenges.

Journal 2011-12-04

High-Speed Data Throughput Test
Ensure a quality user experience by fully testing the packet data performance of your wireless device early in the design cycle. The 8960 offers the highest 2G/3G/3.5G data rates and real-world testing to find issues sooner and resolve them faster!

Feature Story 2011-11-29

Accounting for Dynamic Behavior in FET Device Models
This application note shows that one of the easiest and most insightful ways of testing the large-signal high-frequency capabilities.

Article 2011-07-25

Integrated Solutions for Testing Wireless Communication Systems
IEEE Communications Magazine, Topics in Radio Communications article on SystemVue test solutions, June 2011.

Article 2011-06-02

The Coming of Age of the Software Communications Architecture
Microwave Jounral article reprint on Software Defined Radio (SDR) technology, development tools for complex waveforms and radio applications in aerospace/defense and commercial applications.

Article 2011-04-24

An Innovative and Integrated Approach to III-V Circuit Design
This article explains how to drive III-V circuit design improvement by unified modeling, Design of Experiments (DOE) simulation, and Pareto Analysis

Article 2011-01-10

AMI models: What, why and how?
EE Times Design Article written by Sanjeev Gupta, Jose Luis Pino and Amolak Badesha of Agilent EEsof EDA.

Article 2010-10-18

Real-World Battery Drain Analysis
Go beyond Talk Time Test! Test the battery life of your data device using realistic user scenarios to ensure real-world operation meets user expectations with the 8960, 14565B and IFT software.

Feature Story 2010-08-30

Solving the RFIC Design for Yield and Verification Dilemma
Microave Journal article on the role and evolution of simulation-based performance verification and yield for today’s highly integrated RFICs for digital wireless communications.

Journal 2010-07-15

X-parameters Aid MMIC Design
Microwaves & RF article on how models based X-parameters can provide insights into the linear and nonlinear behavior of key components in wireless systems, including power amplifiers and mixers.

Journal 2010-07-15

How Design Software Changed the World
Microwave Jounral articles on the history of the individuals, companies and products that helped define the development of design software from 1988 to present day.

Journal 2010-07-01

Electromagnetic Interference Meets Its Match
NVIDIA Summer 2010 article on how gaming-inspired 3D glasses and a GPU-accelerated simulation using Agilent's EMPro impact products we use every day.

Journal 2010-06-24

VEE Case Studies
VEE Case Studies

Case Study 2010-05-20

Mindspeed Technologies, Inc. "LTE and WiMAX™ Layer 1 Compliance using SystemVue"
Mindspeed, a leading IC provider to the wireless communications infrastructure market, uses Agilent SystemVue to bring measurement-grade verification inside the baseband design process.

Case Study 2010-04-14

Microwave Journal Cover Article: X-parameters Fundamentally Changing Nonlinear Microwave Design
Provides an overview of the invention and need for x-parameters to model the behavior of non-linear devices. This is an article reprint from Microwave Journal, Issue March 2010, Vol.53. No.3

Article 2010-03-25


Previous 1 2 3 4 5 6 Next