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Agilent’s New X-Series Options Deliver Wider Bandwidth, Faster Speed, More Measurement Capabilities

Press Materials 2010-09-28

Agilent Technologies Begins Unveiling ADS 2011 for Multi-Technology
Agilent Technologies Inc. announces the highly anticipated next release of its Advanced Design System (ADS) flagship RF design software.

Press Materials 2010-09-22

Agilent | Agilent Technologies and Innofidei Announce Joint Development of RF Tests for TD-LTE Chips
The test development is based on the 3GPP LTE specifications, Innofidei’s TD-LTE test requirements, included Agilent’s N5182A signal generator and N9020A signal analyzer and followed the 3GPP LTE standard chapter 6 and 7 TX / RX characteristics.

Press Materials 2010-09-15

U7246A Press Release
U7246A Press Release

Press Materials 2010-09-14

Agilent E2980A ASI Protocol Exerciser/Analyzer - joins the ASI-SIG World Tour
Agilent E2980A ASI Protocol Exerciser/Analyzer – joins the ASI-SIG World Tour for an additional 4 stops

Press Materials 2010-09-09

Agilent Technologies Receives Global Award for Product Line Strategy in the Microwave Test Equipment
Agilent Technologies Inc. (NYSE: A) today announced it's being named the recipient of the Frost & Sullivan's 2010 Global Award for Product Line Strategy in the Microwave Test Equipment Market.

Press Materials 2010-09-08

Agilent Technologies' New LTE Base-Station Emulator Speeds Development and Verification of LTE User
Agilent Technologies Inc. (NYSE: A) today announced the PXT Wireless Communications Test Set, a powerful, common hardware test platform for use across the LTE development lifecycle.

Press Materials 2010-09-01

Agilent Technologies Launches Measurement Applications, Expands LTE Leadership
Agilent Technologies Inc. (NYSE: A) today introduced eight new measurement applications for its PXA X-Series signal analyzer.

Press Materials 2010-09-01

Agilent Press Releases

Press Materials 2010-08-31

Agilent Introduces IC-CAP WaferPro Software for Automating Complex Device Modeling Applications
IC-CAP WaferPro provides a multi-site, multi-wafer, automated DC and RF measurement solution for semiconductor device modeling applications.

Press Materials 2010-08-19

WIN Semiconductors Announces updated ADS Desktop DRC support in its PDKs for ADS
WIN Semiconductors Press Release

Press Materials 2010-08-13

Handheld Spectrum Analyzer Makes Infield Measurements Easier, Faster

Press Materials 2010-08-02

Agilent Introduces Industry's First Pre-compliance Test Solution to Reduce Test Margins

Press Materials 2010-07-16

Introduces Industry's First Pre-compliance Test Solution to Reduce Test Margins
Agilent Introduces Industry's First Pre-compliance Test Solution to Reduce Test Margins, Ensure Devices Meet Regulatory Limits

Press Materials 2010-07-15

Boundary Scan Press Releases

Press Materials 2010-07-14

Agilent Technologies Supports Percello's Femtocell SoCs Test with Chipset Software
Agilent Technologies Inc. (NYSE: A) announced its N7309A chipset software now supports high-volume manufacturing test for Percello's Aquilo Femtocell System-on-a-Chip (SoC) product line.

Press Materials 2010-06-16

Seattle University Revamps Engineering Lab
Why They Chose Agilent Oscilloscopes

Press Materials 2010-06-16

Agilent Offers Industry's First Automatic IBIS-AMI Model Generation Capability in an ESL Design Flow

Press Materials 2010-06-14

Agilent Software Enables Successful Development of Hua Hong NEC's RF Device Modeling Platform

Press Materials 2010-06-11

Agilent Technologies Chipset Software Supports picoChip Femtocell Test
Agilent Technologies Inc. (NYSE: A) and picoChip today announced a high-volume manufacturing test solution for 3G femtocell products.

Press Materials 2010-06-08

N7768A Press Releases

Press Materials 2010-06-07

81950A Press Releases

Press Materials 2010-06-07

N7711A Press Releases

Press Materials 2010-06-07

N7714A Press Releases

Press Materials 2010-06-07

N7766A Press Releases

Press Materials 2010-06-07

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