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Solar Cell and Module Testing
This application note describes how to decrease costs and increase flexibility for solar cell and module testing with Agilent products and solutions.

Application Note 2009-12-07

PDF PDF 1.04 MB
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I-V Curve Characterization in High-Power Solar Cells and Modules
This unique application note discusses capturing the I-V curve of a high power solar cell or module under illuminated conditions and offers the ability to characterize the dark or reverse bias region of the cell or module under test.

Application Note 2009-09-30

PDF PDF 378 KB
10 Practical Tips You Need to Know about Your Power Products
Learn ten simple ways to improve your testing capabilities with your power supplies and electronic loads.

Application Note 2007-09-21

PDF PDF 708 KB
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Increase DC-input Battery Adapter Test Throughput by Several-fold (AN 1506)

Application Note 2004-10-22

PDF PDF 80 KB
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How to capture, save, and reproduce arbitrary waveforms
This 6-page application note provides techniques for capturing, saving and reproducing current waveforms and profiles.

Application Note 2003-11-21

PDF PDF 82 KB
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Differences between Model N330xA Electronic Loads and 6050xA Electronic Loads
This technical note describes some of the performance, programming, and physical differences between the model series N3300xA and 6050xA Electronic Loads

Application Note 2003-06-20

Optimizing Power Product Usage to Speed Design Validation Testing (AN 1434)
This 15-page application note presents methods and techniques to decrease setup time and test time.

Application Note 2002-11-22

PDF PDF 130 KB
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Comparing N3300A Series Electronic Loads with Earlier Models
The Agilent N3300A Series Electronic Loads are compatible in many ways with the previous 605x series and this document highlights the differences.

Application Note 2002-04-04

Power Supply Testing (AN 372-1)
An electronic load offers a broad range of operating modes, providing versatile loading configurations needed for characterizing and verifying DC power supply design specifications.

Application Note 2002-02-22

PDF PDF 510 KB
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Battery Testing (AN 372-2)
This Application Note shows how an electronic load can be used to discharge batteries of various chemistries to determine actual capacity, capacity retention and impedance.

Application Note 2002-02-22

PDF PDF 483 KB
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Making Fuel Cell ac Impedance Measurements Utilizing Agilent N3300A Series Electronic Loads (PN...
This 12-page product note discusses making ac impedance measurements on fuel cells that can help identify problems with the fuel cell components and help identify deviations in the fuel cell assembly process.

Application Note 2002-02-15

PDF PDF 320 KB
Zero Volt Electronic Load
Increasing demand for lower voltage power supplies is pressuring test system designers to identify electronic load test equipment designed to adequately perform at these lower voltages. In this Product Note read about how to configure Agilent DC Electronic Loads, with option J04, to perform...

Application Note 2001-06-07

PDF PDF 141 KB
Cable Impedance and Structural Return Loss Measurement Methodologies
introduces exact definitions for cable impedance and structural return loss along with several measurement methodologies.

Application Note 2001-03-23

Pulsed Characterization of Power Semiconductors Using Electronic Loads (AN 1246)
This Application Note explains how Electronic loads improve power semiconductor measurements by eliminating the self-heating problems associated with measuring the on-state voltage drop and transconductance or current gain of power semiconductors.

Application Note 2000-09-01

PDF PDF 135 KB
Increasing dc Power Supply Test System Throughput
This Product Note describes some of the ways this new family of electronic loads can be used to achieve maximum throughput for your dc power supply test system.

Application Note 2000-05-01

PDF PDF 157 KB
10 Hints for Using Your Power Supply to Decrease Test Time
Learn how to get the most from your power products by reading this 12-page booklet. When you're trying to boost throughput in time-critical production test systems, a small change in the way you operate or program a supply can have a surprising impact on test speeds. Specifically, the booklet...

Application Note 1999-10-12

PDF PDF 3.18 MB
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