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Master Your MIPI M-PHY Receiver Tests - Application Brief
Validating MIPI M-PHY spec conformance of ASICs and modules with a focus on high-speed jitter tolerance test.

Application Note 2014-04-17

PDF PDF 2.49 MB
Selecting the Right Scope for Protocol Analysis Applications - Application Note
When evaluating a new oscilloscope that will include serial protocol applications you should consider the six questions discussed in this application note.

Application Note 2014-04-17

PDF PDF 3.10 MB
Understanding and Applying Probability of Intercept In Real-Time Spectrum Analysis- Application Note
This document describes six major factors that determine the POI value and relative amplitude: sampling rate, time-record length, windowing function, window size, overlap processing, and noise floor.

Application Note 2014-04-17

PDF PDF 2.79 MB
Evaluating Oscilloscopes for Low-Power Measurements - Application Note
The Infiniium 9000 Series oscilloscope is three instruments in one: scope, logic analyzer, and protocol analyzer, and it offers the widest range of debug and compliance application software.

Application Note 2014-04-16

FlexRay Physical Layer Eye-diagram Mask Testing - Application Note
Agilent provides seven different FlexRay mask files based on FlexRay physical layer standards/specifications for use with InfiniiVision 5000, 6000, and 7000 Series oscilloscopes (DSO or MSO)from Agilent.

Application Note 2014-04-16

Evaluating Current Probe Technologies for Low-Power Measurements - Application Note
This application note will evaluate oscilloscope current probes for their usefulness in making low power measurements and demonstrate a type of probe available from Agilent.

Application Note 2014-04-16

Evaluating Oscilloscope Signal Integrity - Application Note
This application note articulates key signal integrity attributes and uses Agilent Infiniium S-Series oscilloscopes for examples in the 500 MHz to 8 GHz bandwidth ranges.

Application Note 2014-04-15

U3606B versus U3606A Digital Multimeter|DC Power Supply - Application Note
In the test and measurement world, we need a source to do testing on device under test (DUT) and most frequently being used is the power supply. And for the power measurement we need a multimeter.

Application Note 2014-04-15

PDF PDF 784 KB
Debug Automotive Designs Faster with CAN-dbc Symbolic Trigger and Decode - Application Note
Learn about CAN-dbc symbolic triggering and how to improve debug of your automotive designs using an oscilloscope.

Application Note 2014-04-14

MIL-STD 1553 Eye-diagram Mask Testing - Application Note
Learn about how eye-diagram testing can be performed on differential MIL-STD 1553 signals using an oscilloscope.

Application Note 2014-04-14

PDF PDF 1.86 MB
Switch Mode Power Supply Measurements - Application Note
Oscilloscope power measurement options provide a quick and easy way to analyze the reliability and efficiency of switching power supplies.

Application Note 2014-04-14

Evaluating Oscilloscopes to Debug Mixed-Signal Designs - Application Note
Discusses the number of channels, bandwidth, sample rates and triggering required to effectively monitor various analog and digital I/O signals in typical MCU/DSP-based embedded designs.

Application Note 2014-04-11

Physical Layer Testing of the USB 2.0 Serial Bus - Application Note
This application note discussed measurement requirements for the USB 2.0 serial bus and how both Agilent’s 6000 X-Series and Infiniium Series oscilloscopes address those challenges.

Application Note 2014-04-11

Using Oscilloscope Segmented Memory for Serial Bus Applications - Application Note
Learn how to use an oscilloscope's segmented memory to capture a longer time span and more serial packets while still digitizing at a high sample rate.

Application Note 2014-04-11

PDF PDF 1.90 MB
Download latest J-BERT M8020A application notes to master your designs
Submit the form to begin downloading the application briefs

Application Note 2014-04-09

Oscilloscope Measurement Tools to Help Debug Automotive Serial Buses Faster - Application Note
Agilent's InfiniiVision Series oscilloscopes offer some unique measurement capabilities for debugging and characterizing the physical layer of automotive serial buses.

Application Note 2014-04-09

PDF PDF 3.03 MB
Signal generation enables cost-effective testing

Application Note 2014-04-07

Oscilloscope Mask Testing for Six Sigma Quality Standards - Application Note
Learn about the QA process and Six Sigma efficiency, and explore the benefits mask testing brings to the QA process for electronic signals and achieving Six Sigma quality in as little as 1.1 seconds.

Application Note 2014-04-03

Solutions for WLAN 802.11ac Manufacturing Test - Application Note
This “Solutions for WLAN 802.11ac Manufacturing Test” app note gives insight into testing 802.11ac client and infrastructure devices using fast, flexible, cost-effective calibration and non-signaling.

Application Note 2014-04-02

Essentials of Coherent Optical Data Transmission - Application Note
The Application Note explains how complex modulated optical signals can maximize bit transfer efficiency in fiber optical data transmission.

Application Note 2014-04-02

PDF PDF 3.03 MB
Techniques for Time Domain Measurements - Application Note
This application note will introduce time domain and DTF measurement techniques for identifying the location and relative amplitudes of discontinuities while operating in the field.

Application Note 2014-03-26

Testing Automotive Fuse Boxes with i1000D SFP In-Circuit Test System - Application Note
The i1000D small footprint in-circuit tester provides excellent test coverage for automotive fuse boxes, which contain vital connections to a vehicle's various electrical systems.

Application Note 2014-03-26

Radar Test Measurements - Application Note
This application note focuses on the fundamentals of measuring basic pulsed radars and measurements for more complex or modulated pulsed radar systems.

Application Note 2014-03-25

PDF PDF 3.68 MB
Average Power Sensor Measurement Uncertainty Calculator - Application Note
Measurement Uncertainty Calculator for the Average Power Sensors (N8481A, N8482A, N8485A, N8481A-CFT, N8482A-CFT, N8485A-CFT, 8481D, 8485D, 8487D, R8486D, Q8486D, E4412A, E4413A, E9300A, E9301A, E9304A, E9300B, E9301B, E9300H, E9301H)

Application Note 2014-03-25

XLS XLS 82 KB
Testplan Development on CVI Labwindows with TS-5400 PXI Series - Application Note
This application note provides set-up guidelines to start developing your testplan on CVI Labwindows using the Agilent U8972A TS-5400 PXI Series functional test system.

Application Note 2014-03-25

PDF PDF 5.09 MB

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