Parla con un Esperto

Technical Support

Electronic Measurement

Find by Product Model Number: Examples: 34401A, E4440A

Refine the List

remove all refinements

By Industry/Technology

By Type of Content

376-400 of 2777

Sort:
Virtual Flight Testing of Radar System Performance
Agilent SystemVue and AGI STK can be integrated to provide virtual flight testing of radar and electronic warfare algorithms, saving both time and money.

Application Note 2012-09-21

Explore the SERDES Design Space Using the IBIS AMI Channel Simulation Flow
Simulation of modern chip-to-chip links requires you abandon the SPICE-based approach and adopt a new approach based on an IBIS AMI channel simulation flow.

Application Note 2012-09-21

Connector Pin Recession and its Effect on Network Analyzer Accuracy
This article outlines an experiment undertaken to assess the impact on the measurement of reflection coefficient when using 3.5-mm connectors.

Application Note 2012-09-19

PDF PDF 773 KB
Are you getting everything from In-Circuit Test? White Paper
This white paper presents two case studies on how customers are successfully combining additional test features with ICT using Agilent i3070 Series 5 technology to maximize their ICT capabilities.

Application Note 2012-09-19

PDF PDF 7.41 MB
Redirector: Scope Tip of the Month September 2012
http://cp.literature.agilent.com/litweb/pdf/5991-0992EN.pdf

Application Note 2012-09-15

PDF PDF 200 KB
Monitoring and Controlling Particle Collisions at Nanometer Scale and with Picosecond Duration
The Large Hadron Collider (LHC) at CERN is the world's most powerful particle accelerator. Agilent digitizers are used to perform wideband beam monitoring and to monitor Forward & Rerverse RF signals.

Application Note 2012-09-10

PDF PDF 1.51 MB
FieldFox Microwave Analyzers - White Paper
This white paper describes the features, benefits, and applications of the FieldFox RF & microwave handheld analyzers.

Application Note 2012-09-06

PDF PDF 3.35 MB
Evaluating DC-DC Converters and PDN with the E5061B LF-RF Network Analyzer
This application note describes measurement methods for evaluating frequency domain characteristics of DC-DC converters and passive PDN components by using the E5061B LF-RF network analyzer.

Application Note 2012-09-03

Techniques for Precise Measurement Calibrations in the Field - Application Note
This app note discusses recent advances in VNA calibration and compares measurements made on a FieldFox analyzer using different calibration types for a variety of RF and microwave devices.

Application Note 2012-08-30

Techniques for Precise Cable and Antenna Measurements in the Field - Application Note
This app note introduces measurement and calibration techniques for cable and antenna testing using FieldFox handheld analyzers.

Application Note 2012-08-30

FPGA Prototyping Using Agilent SystemVue
This application note describes a top-down FPGA design flow using SystemVue for rapid prototyping of physical layer communications signal processing.

Application Note 2012-08-30

Techniques for Precise Interference Measurements in the Field - Application Note
This app note discusses the different types of interference in current and new systems and methods to measure a variety of interference types using spectrum analyzers such the FieldFox Series.

Application Note 2012-08-30

Optimizing Transceiver Test with the Agilent M9381A Vector Signal Generator
Accelerate transceiver test throughput with the fast Agilent M9381A PXIe Vector Signal Generator. Achieve cost reductions in test while maintaining high test quality.

Application Note 2012-08-29

On Characterization of Mechanical Deformation in Flexible Electronic Structures
Demonstrates how the Agilent T150 UTM has been successfully utilized to characterize nano/micro-mechanical failure in inorganic thin films on flexible substrates.

Application Note 2012-08-28

PDF PDF 634 KB
1500 A and 10 kV MOSFET Characterization using the Agilent B1505A - Application Note
This application note explains how to use the B1505A Power Device Analyzer / Curve Tracer to measure typical DC parameters of high-power MOSFETs.

Application Note 2012-08-27

33500B Series Complex Modular Generation with Low-Cost Arbitrary Waveform Generators - White Paper
This white paper illustrates how the Agilent 33500 Series waveform generators with Trueform technology can be applied to generate complex modulated signals.

Application Note 2012-08-27

Achieve Measurement Accuracy and Flexibility in Your Microwave Test System Ap Note
The application note describes how to enhance measurement accuracy and flexibility in signal analysis by using the M9168C PXI programmable step attenuator module.

Application Note 2012-08-24

Simplify the Generation of High-Quality IQ Signals - Application Note
Topics include Trueform technology, moving IQ signals from software to a 33500B Series waveform generator for play back, and built-in features for simulating conditions on an IQ signal for testing.

Application Note 2012-08-24

PDF PDF 620 KB
S-parameter Series: Practical Application of the InfiniiSim Waveform Transformation Toolset Applicat
Presents and addresses five of the most common problems that confront engineers when trying to measure performance on high speed links, using an oscilloscope.

Application Note 2012-08-21

Bandwidth and Rise Time Requirements for Making Accurate Oscilloscope Measurements
How much oscilloscope bandwidth do you need and how fast does the rise time need to be to measure your signals accurately?

Application Note 2012-08-17

PDF PDF 942 KB
Accelerate Program Development using Agilent Command Expert with Agilent VEE - Application Note
Command Expert is a free software tool that enables fast and easy instrument control from PC applications. This application note focuses on the integration with Agilent VEE Pro.

Application Note 2012-08-16

PDF PDF 1.41 MB
81150A and 81160A Pulse Function Arbitrary Noise Generators - Application Note
The Agilent 81150A and 81160A are pulse function arbitrary noise generators in different speed classes. They permit maximum test efficiency in a wide spectrum of applications.

Application Note 2012-08-13

Friction, Phase and KFM Characterization of Functionalized Graphene Oxide

Application Note 2012-08-09

PDF PDF 443 KB
Using a Compact Low Voltage FE-SEM in Evaluating Materials Nano-Porosity Application Note

Application Note 2012-08-02

PDF PDF 470 KB
EXT Wireless Communications Test Set Non-signaling Test Overview
This application note explains how non-signaling test methods make it possible for manufacturers to reduce both test times and test equipment costs across a range of wireless technologies

Application Note 2012-08-01

PDF PDF 290 KB

Previous ... 11 12 13 14 15 16 17 18 19 20 ... Next