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Tips to Achieve PCIe Connectivity with your Agilent AXIe or PXIe Chassis - Application Note
Agilent's AXIe and PXIe chassis use PCIe as their primary communications link. Using the PCIe bus has many advantages such as availability of standard hardware, signaling methods and debug tools.

Application Note 2012-07-07

PDF PDF 876 KB
Spectrum and Signal Analysis Pulsed RF Application Note 150-2
This application note is intended as an aid for the operation of spectrum and signal analyzers and the interpretation of the displayed pulse spectra.

Application Note 2012-07-05

Testing a Low-Noise Block Downcoverter-Feedhorn Application Note
This application note provides an example of a LNBF test configuration using a CXA signal analyzer and illustrates how easy it is to perform tests and make measurements.

Application Note 2012-07-05

PDF PDF 2.05 MB
U1051A Time to Digital Converter
Application Note - Absolute Time Recovery

Application Note 2012-07-01

PDF PDF 1.19 MB
Solutions for Minimizing Measurement Uncertainty and Quick and Easy Estimation of Uncertainty Due to
This application note presents a number of techniques that can be used to minimize mismatch uncertainty.

Application Note 2012-06-29

Accelerate Program Development using Agilent Command Expert with Labview
This application note describes how to accelerate program development using Command Expert with LavbVIEW.

Application Note 2012-06-29

PDF PDF 1.32 MB
Graphene Oxide & Its Applications Revealed by Atomic Force Microscopy

Application Note 2012-06-27

PDF PDF 305 KB
8 Hints for Making Better Measurements Using RF Signal Generators Application Note
This application provides 8 hints for improving the accuracy of your measurements using RF signal generators.

Application Note 2012-06-27

PDF PDF 1.35 MB
Imaging Organic & Biological Materials with Low Voltage Scanning Electron Microscopy

Application Note 2012-06-27

PDF PDF 666 KB
Imaging Graphene via low-voltage Field Emission Scanning Electron Microscopy

Application Note 2012-06-26

PDF PDF 1007 KB
Different Contrast Mechanisms in SEM Imaging of Graphene

Application Note 2012-06-26

PDF PDF 380 KB
Simulating Power Supply Transients and Noise in the Satellite and Defense
5991-0655EN,satellite,defense,power supply transients and noise,aerospace/defense,defense,A/D

Application Note 2012-06-19

Establishing Traceability for Quantities Derived from Multiple Traceable Quantities by Jian Liu
Provides method of developing traceability for measurements (eg. phase noise) that have no SI units.

Application Note 2012-06-15

PDF PDF 1.83 MB
Best Practices For Making The Most Accurate Radar Pulse Measurements - Application Note
Learn how to make the most accurate radar pulse measurements. This article also covers real-world scenarios that demonstrate how to carry out these tips with Agilent power meters and sensors.

Application Note 2012-06-14

PDF PDF 586 KB
802.11ac Power Measurement and Timing Analysis - Application Note
This technical article illustrates how Agilent 8990B peak power analyzer able to help technicians and engineers perform some of the test requirements when developing 802.11ac power amplifier module

Application Note 2012-06-14

PDF PDF 441 KB
Low Voltage Scanning Electron Microscopy: Promises and Challenges

Application Note 2012-06-13

PDF PDF 426 KB
Rapid Mechanical Characterization of Low-Dielectric-Constant Films - Application Note
This application note demonstrates the cumulative benefit of CSM and Express Test for Nanoindentation testing for in the semiconductor industry.

Application Note 2012-06-12

PDF PDF 448 KB
Accelerate Program Development using Agilent Command Expert with MATLAB - Application Note
Command Expert is a free software tool that enables fast and easy instrument control from PC applications. This application note focuses on the integration with MATLAB.

Application Note 2012-06-05

PDF PDF 3.44 MB
WiMAX Receiver Basics: Operation of a Dual Channel WiMAX Receiver
The diagram shows a simplified version of a typical WiMAX™ mobile station (MS) receiver. The bold dashed lines indicate the major feedback loops. As we work through the design, we can identify how these impact testing.

Application Note 2012-06-05

Conducting Site Surveys Using the N934xC Series Handheld Spectrum Analyzers
This brief application note explains how the N9344C, N9343C, and N9342C handheld spectrum analyzers are an effective tool for measuring signal strength and performing a site survey.

Application Note 2012-06-01

Testing New-generation Wireless LAN - Application Note
This application note introduces the new WLAN new-generation testing technology of 802.11ac. Agilent's 802.11ac software allows engineers to view and troubleshoot all 802.11ac modulation formats.

Application Note 2012-05-22

PDF PDF 881 KB
SMM Imaging of Dopant Structures of Semiconductor Devices

Application Note 2012-05-21

PDF PDF 434 KB
Ten things to Consider when Selecting your Next Oscilloscope - Application Note
You rely on your oscilloscope every day, so selecting the right one to meet your needs is an important task. Comparing specs and features of scopes made by different manufacturers can be time-consuming and confusing. The concepts outlined here are intended to speed your selection process and help you avoid some common pitfalls. No matter who makes the scopes you are considering, carefully analyzing each one in relation to the 10 issues discussed here will help you evaluate the instruments objectively.

Application Note 2012-05-15

Innovative Passive Intermodulation (PIM) and S-parameter Measurement Solution with the ENA
This application note introduces the solution that combines PIM and S-parameter measurements by using the vector network analyzer.

Application Note 2012-05-09

PDF PDF 2.28 MB
Test-System Development Guide: A Comprehensive Handbook for Test Engineers
Test-System Development Guide

Application Note 2012-05-07

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