Technical Support
Test & Measurement
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E6706F 1xEV-DO Lab Application - Technical Overview
This technical overview provides the specifications for the E6706F 1xEV-DO lab application to verify and ensure the quality of RF performance of these devices.
Technical Overview 2013-04-26 |
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Precision source & measurement tips
These videos help you to make precision source & measurement more effective and efficient. Each video provides you with essential tips that should be useful at your bench-top.
Demo 2013-04-26 |
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M9381A PXIe Vector Signal Generator - Flyer
The M9381A PXIe vector signal generator is a compact modular solution that provides frequency coverage from 1 MHz to 3.0 GHz or 6.0 GHz. The M9381A accelerates test throughput with the industry's fastest frequency and amplitude switching speed.
Brochure 2013-04-26 |
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E1966A 1xEV-DO Terminal Test Application - Technical Overview
This technical overview provides the specifications for the E1966A 1xEV-DO test application to verify and ensure the quality of RF performance of these devices.
Technical Overview 2013-04-26 |
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EasyEXPERT for B1500A/B1505A
Various features of EasyEXPERT for B1500A/B1505A
Demo 2013-04-25 |
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N4962A Serial BERT 12.5 Gb/s - Data Sheet
The N4962A is a low cost 0.5 to 12.5 Gb/s pseudo-random bit sequence generator and bit error rate tester designed for automated production-line testing, manufacturing, and R&D use.
Data Sheet 2013-04-25 |
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Electronic Manufacturing Test Support eNews - April 2013
Latest information to help you with ICT, 5DX and Automotive Electronics Functional Test Systems Support
Newsletter 2013-04-25 |
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M9380A PXIe CW Source - Flyer
The M9380A PXIe CW source is a compact modular solution that provides frequency coverage from 1 MHz to 3.0 GHz or 6.0 GHz. A typical M9380A configuration includes three individual PXIe modules M9310A source output, M9301A synthesizer and the M9300A frequency reference designed for fast data interfaces and high-speed automated test systems.
Brochure 2013-04-25 |
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B2900A SMU Quick Pulsed Measurement on Easy-to-Use GUI
This video shows how to evaluate pulsed I-V measurement to minimize heating effect of device with Agilent B2900A Source Measure Unit (SMU). The easy-to-use graphical user interface (GUI) offers more flexible measurement without PC.
Demo 2013-04-25 |
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B2900A Source Measure Unit Capturing an IV Curve of an LED
This demo video shows you how to characterize an LED quickly and how to perform the IV sweep measurement easily.
Demo 2013-04-25 |
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B2900A SMU How to Use Quick IV Measurement Software
This video show how to use the Quick IV measurement software of Agilent B2900A Source Measure Unit (SMU). The easy-to-use free software expands the measurement capability of B2900A SMU.
Demo 2013-04-25 |
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B2900A SMU Quick Spot and Sweep Measurement of LED
This video shows how to evaluate I-V spot and sweep measurements of LED with Agilent B2900A Source Measure Unit (SMU). The easy-to-use graphical user interface (GUI) offers quick characterization of devices without programming on the PC.
Demo 2013-04-25 |
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N4963A Clock Synthesizer 13.5 GHz - Data Sheet
The N4963A Clock Synthesizer is designed to meet multiple clocking applications in one small box.
Data Sheet 2013-04-25 |
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Introduces High-Sensitivity Multiport Optical Power Meters
Meters Combine Highest Optical Performance and Large Data Storage in Compact Platform
Press Materials 2013-04-24 |
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Agilent Technologies to Showcase Bit Error Ratio Tester at OFC/NFOEC
New Options Enable 32-Gb/s ASIC Component and Optical Transceiver Designs
Press Materials 2013-04-24 |
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N4965A Multi-Channel BERT 12.5 Gb/s - Data Sheet
The N4965A Multi-Channel BERT is a cost effective solution for characterizing crosstalk susceptibility, backplanes, and multi-lane serial data systems.
Data Sheet 2013-04-24 |
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RF Emissions Testing – EMSEC Solutions Inc. (ESI)
RF Emissions Testing Solution from ESI and Agilent.
Solution Brief 2013-04-24 |
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Method of Implementation (MOI) for HDMI 1.4b Cable Assembly Test
Method of Implementation (MOI) for HDMI 1.4b Cable Assembly Test Using Agilent E5071C ENA Network Analyzer Option TDR.
Application Note 2013-04-24 |
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Agilent Technologies Updates Reference-Class Multiwavelength Meter
Extended Recalibration Intervals Reduce Downtime and Cost of Ownership
Press Materials 2013-04-24 |
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Simulation of Jittering Synchronization Signals for Video Interfaces - Technical Overview V2.0
This product note describes how R&D engineers in the communication industry use Agilent Technologies pulse generators for development of video interfaces for projection units.
Technical Overview 2013-04-24 |
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N2820A/21A High-Sensitivity, High Dynamic Range Current Probes - Data Sheet
The new N2820A Series high-sensitivity current probes address the need for high-sensitivity current measurements with a wide dynamic range.
Data Sheet 2013-04-24 |
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Industry-first solution for testing SD UHS-II receivers
Automated Solution Based on J-BERT Accelerates Testing of SD Memory Card Host and Device Receivers
Press Materials 2013-04-24 |
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Infiniium 9000 H-Series High-Definition Oscilloscopes - Data Sheet
The Infiniium 9000 H-Series high-definition oscilloscopes feature up to 12 bits of vertical resolution, the industry's deepest standard memory, and low noise.
Data Sheet 2013-04-24 |
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Data Converter Product - Selection Guide
The guide presents the Acqiris family of cards and modules currently available.
Technical Overview 2013-04-23 |
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Rack Mount Accessory Products Cross Reference Guide - Selection Guide
This cross reference provides mappings of instrument rack mount options to standalone rack mount products or parts.
Selection Guide 2013-04-23 |
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