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Additional Test & Measurement Products

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3070 Boundary Scan
Learn concepts of Boundary-Scan technology. TAP (test access port), the functionality of registers (BYPASS, boundary, IDCODE), and the structure of the "boundary-cell" are described.

Classroom Training

3070 Family Multiplexed User Fundamentals Class I
Learn the basics needed to develop a Board Test program with the i3070 Multiplexed Board Test system. Design, develop, turn-on and debug tests. Typically, Class I and II are taken consecutively.

Classroom Training

Agilent TS-5400 Series II Developers Training
This class is an introduction to TestExec SL and the TS5400 series library’s. Topics covered include hardware and software architecture, built in diagnostic routines and hands on use of the TS5400 series platform.

Classroom Training

Evénements Agilent en France
Bienvenue sur la page des événements auxquels participe Agilent en France

Seminar

Formation Agilent VEE
Le contenu des modules de formation VEE est destiné aux ingénieurs et techniciens débutants avec le logiciel VEE ou les utilisateurs plus expérimentés voulant consolider leurs connaissances.

Classroom Training

i3070 Family Multiplexed User Fundamentals Class II
Enhanced training to take the programmer beyond the basics into custom test generation. Get more performance and coverage from your i3070. Typically, Class I and II are taken consecutively.

Classroom Training

Journée Marquage CE - Réglementation & Essais
Venez profiter des savoir-faire et technologies de professionnels capables de vous guider sur la réglementation et les essais relatifs au marquage CE, lors de cette conférence organisée par EMITECH, MB Electronique, et Agilent Technologies.

Seminar

Solutions innovantes d’analyse et de génération vectorielles
1 journée de séminaire pour présenter les dernières solutions innovantes d’analyse et de génération vectorielles.

Seminar

Séminaires ‘High Speed Digital’ France
Agilent’s high-speed digital solution is a range of simulation and measurement tools that help you cut through the challenges of gigabit digital designs to visualize SI issues from both sides of the design-and-test flow.

Seminar

Test and Measurement Course Calendar for Europe
Calendar of Test and Measurement courses scheduled in Europe. Course details, dates, locations, and costs.

Classroom Training

Tour de France – Caen, le 26 mars 2012 : La conception et l’analyse de liens rapides
Tour de France – Caen, le 26 mars 2012 : La conception et l’analyse de liens rapides

Seminar

Tour de France – Caen, le 7 février 2012 : L’analyse de spectre et l’analyse de réseaux
Tour de France – Caen, le 7 février 2012 : L’analyse de spectre et l’analyse de réseaux

Tradeshow

Tour de France – Massy, le 16 février 2012 : Le futur du Wireless
Tour de France – Massy le 16 février 2012 : Le futur du Wireless

Seminar

Tour de France – Nice le 19 avril 2012 : Conception et analyse de liens rapides
Tour de France – Nice Sophia Antipolis, le 19 avril 2012 : Innovations en techniques de conception et de mesure selon Agilent

Seminar

.All Webcast On-Demand Recordings
Access the free, On-Demand (recorded) webcasts

Webcast

10-Steps to Determine 3G/4G IP Data Throughput
10-Steps to Determine 3G/4G IP Data Throughput

Webcast - recorded

10-Steps to Determine 3G/4G IP Data Throughput
Original broadcast September 27, 2012

Webcast - recorded

100G TX Designs - Tips & Techniques for Accurate Characterization Webcast
Original broadcast on February 27, 2013

Webcast - recorded

2012 Wireless Seminar
2012 Wireless Seminar

Seminar

3G Technology Overview
This 2-day course will introduce engineers to the concepts of third generation cellular technologies.

Classroom Training

3GPP LTE Standards Update: Release 11, 12 and Beyond
Original broadcast October 25, 2012

Webcast - recorded

60 GHz Power Amplifier Design for Wireless HDMI
Originally broadcast Oct 13, 2009 - Access the .pdf file of the presentation

Webcast - recorded

86100C/83496B and E5052B SSA-J Phase Noise e-Seminar
You've Measured The Jitter, Now How Do You Reduce It? (1 hour, recorded April 26, 2007)

Seminar Materials 2007-04-26

8x8 MIMO and Carrier Aggregation Test Challenges for LTE Webcast
Original broadcast April 25, 2013

Webcast - recorded

A Practical Approach to Verifying RFICs with Fast Mismatch Analysis
Originally broadcast October 28, 2010

Webcast - recorded

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