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Additional Test & Measurement Products

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3070 Boundary Scan
Learn concepts of Boundary-Scan technology. TAP (test access port), the functionality of registers (BYPASS, boundary, IDCODE), and the structure of the "boundary-cell" are described.

Classroom Training

3070 Family Multiplexed User Fundamentals Class I
Learn the basics needed to develop a Board Test program with the i3070 Multiplexed Board Test system. Design, develop, turn-on and debug tests. Typically, Class I and II are taken consecutively.

Classroom Training

Agilent EEsof MMIC Design Symposium - Tuesday 8th November 2011
Agilent EEsof MMIC Design Symposium

Seminar

Agilent TS-5400 Series II Developers Training
This class is an introduction to TestExec SL and the TS5400 series library’s. Topics covered include hardware and software architecture, built in diagnostic routines and hands on use of the TS5400 series platform.

Classroom Training

Cable and Connector Care
Accelerated Education Curriculum: Training for fundamentals of connector care

Classroom Training

Electronic Measurement Course Calendar for Europe
Calendar of Electronic Measurement courses scheduled in Europe. Course details, dates, and locations.

Classroom Training

Eventi di Agilent Italia
Benvenuti nella pagina degli eventi di Agilent Italia

Seminar

i3070 Family Multiplexed User Fundamentals Class II
Enhanced training to take the programmer beyond the basics into custom test generation. Get more performance and coverage from your i3070. Typically, Class I and II are taken consecutively.

Classroom Training

Seminari Finmeccanica
Radar, EW and ELINT signal analysis and simulation Wideband Solutions for Radar/EW Millimeter Signal Measurements: Techniques, Solutions and Best Practices Repair and Calibration challenges for latest and next generation instruments

Seminar

Seminari Finmeccanica
Radar, EW and ELINT signal analysis and simulation Wideband Solutions for Radar/EW Millimeter Signal Measurements: Techniques, Solutions and Best Practices Repair and Calibration challenges for latest and next generation instruments

Seminar

VSA WORKSHOP
L’evento e’ rivolto a progettisti, tecnici ed enti di certificazione e controllo chiamati a valutare le prestazioni dei sistemi di trasmissione wireless con modulazioni numeriche .Saranno in evidenza gli standard piu’ attuali dal DVBT-2 all’LTE

Seminar

10-Steps to Determine 3G/4G IP Data Throughput
10-Steps to Determine 3G/4G IP Data Throughput

Webcast - recorded

10-Steps to Determine 3G/4G IP Data Throughput
Original broadcast September 27, 2012

Webcast - recorded

2012 Wireless Seminar
2012 Wireless Seminar

Seminar

3G Technology Overview
This 2-day course will introduce engineers to the concepts of third generation cellular technologies.

Classroom Training

3GPP LTE Standards Update: Release 11, 12 and Beyond
Original broadcast October 25, 2012

Webcast - recorded

86100C/83496B and E5052B SSA-J Phase Noise e-Seminar
You've Measured The Jitter, Now How Do You Reduce It? (1 hour, recorded April 26, 2007)

Seminar Materials 2007-04-26

8x8 MIMO and Carrier Aggregation Test Challenges for LTE Webcast
Original broadcast April 25, 2013

Webcast - recorded

A Practical Approach to Verifying RFICs with Fast Mismatch Analysis
Originally broadcast October 28, 2010

Webcast - recorded

Accelerating USB 3.0 Product Development
Super speed USB presents new challenges for designers and developers. Whether you are designing host, hub or device, Electrical or protocol, Agilent offers a complete solution for debug and validate your design.

Webcast - recorded

Addressing Measurement Challenges of 160 MHz 802.11ac MIMO
Original broadcast August 9, 2012

Webcast - recorded

ADS Learning Week in France (Grenoble)
ADS Learning Week Grenoble October 2013

Classroom Training

ADS Learning Week in France (LesUlis)
ADS Learning Week Les Ulis 2013

Classroom Training

ADS Learning Week in Germany
ADS Learning Week Munich May 2013

Classroom Training

ADS Learning Week in Israel
ADS Learning Week Israel 2013

Classroom Training

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