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Ensuring The Highest Quality Microwave Measurements - Article
High frequencies and stringent application specifications drives a number of critical challenges to be addressed in this article.
專文 2013-04-22 |
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Faculty Spotlight Articles
Interesting news on universities that are using Agilent equipment to do unique and exciting things.
專文 2013-04-22 |
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Incremental Redundancy in EGPRS
Incremental redundancy is implemented in EGPRS systems to achieve maximum efficiency in over-the-air interface... WirelessDesignMagazine.com article by Paul Mercy. Feb 2005. Acrobat PDF.
專文 2013-04-02 |
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Enabling Simulation and Test of Custom OFDM Signals
Orthogonal frequency division multiplexing (OFDM) has become attractive for many current and emerging commercial applications because it provides a combination of data throughput, scalability, and robustness.
專文 2013-04-01 |
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Software, Connectivity Solutions
專文 2013-03-21 |
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Optimize Time Gating in Spectrum Analysis
Although various types of time gating exist, some applications are more appropriate for certain time-gating methods. Beyond making this determination, designers should know the latest techniques for gate triggering and measuring wide-bandwidth signals.
專文 2013-03-20 |
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White Paper : Current Activity in 5G
A white paper offering background on what is currently happening in the world of 5G —significant developments and major players.
專文 2013-03-05 |
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Automating Communications Measurement - Article
This article demonstrates how you can automate measurements, control instruments, develop GUI-based applications, and generate reports for the Agilent 33220A waveform generator using MATLAB software.
專文 2013-02-07 |
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Designing Multiple-Throw Switches in a MMIC Configuration
A Chip Design article by P. Sreenivasa Rao, design flow verification expert at Agilent Technologies.
專文 2013-01-31 |
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Agilent embraces GaN modeling in IC-CAP upgrade
EETimes Design Article highlights new capabilities in IC-CAP 2013.01.
專文 2013-01-09 |
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Spectrum Analyzer CW Power Measurements and the Effects of Noise - Article
This paper examines how to configure a spectrum analyzer to measure a low-power continuous wave (CW) signal so that the trade-off between measurement time and accuracy is optimized.
專文 2012-12-01 |
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386 KB
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EDN's 19th Annual Innovation Awards Finalists: Agilent's PNA-X NVNA
專文 2012-11-30 |
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Future Device Modeling Trends
Modeling the nonlinear device (basic nonlinear component) for circuit and system simulation downstream.
專文 2012-11-28 |
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6.08 MB
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Digital Baseband and RF Domain Integration Challenges in Radar Systems - Article Reprint
Reconfigurable radar systems employ digital technology in the form of FPGAs and DSPs.That digital technology is combined with RF technology to achieve a high level of flexibility.
專文 2012-11-01 |
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406 KB
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The Ins and Outs of Microwave Signal Capture and Playback - Article Reprint
Looks at capture and playback of microwave signals and the multitude of applications in the evaluation of communications, radar and electronic warfare systems.
專文 2012-11-01 |
PDF
758 KB
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The New Techniques Simplify Military Frequency-Converter Characterization - Article Reprint
This article is about a new technique that simplifies and reduces the cost of the measurement test set up.
專文 2012-11-01 |
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2.44 MB
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Radar, Electronic Warfare, and Electronic Intelligence Testing: Identifying Common Test Challenges
This article in Defense Technical Briefs covers common test challenges and radar basics. Radar, EW, and ELINT engineers make a variety of routine measurements. As highlighted earlier, pulse width and PRF or PRI provide important information about a radar system’s resolution and range.
專文 2012-11-01 |
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392 KB
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Carrying Microwave Precision Into the Field - Article Reprint
Microwave Journal, September 2012 FieldFox product feature.
專文 2012-10-22 |
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1.83 MB
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Testing Interference in a Wireless Environment - Article Reprint
Identification and reduction of interference has become essential to the proper operation in all wireless systems.
專文 2012-10-22 |
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202 KB
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Article: COTS Gear Generates Multi-Emitter Test Signals
This article discusses COTS test hardware and software being used to create multi-emitter test signals using ESL design simulation software and wideband AWGs
專文 2012-09-27 |
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Factory Test Technology License (FTTL) from Qualcomm
This FTTL License from Qualcomm granted Agilent a worldwide license to demonstrate and distribute products that leverage the Qualcomm technology for RF factory testing.
專文 2012-09-06 |
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Improving Coverage for ECU Outliers - Article Reprint
This article explores how to catch electronic faults that typically escape with traditional serial testing, by using a multiple-channel voltage acquisition method that can enable faster parallel test.
專文 2012-08-24 |
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191 KB
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Expanding Coverage with Boundary Scan - Article Reprint
Limited access tests can expand or leverage on boundary scan and provide more test coverage for a myriad of devices, beyond just boundary scan device coverage.
專文 2012-08-24 |
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206 KB
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ICT Total Cost of Ownership - Article Reprint
This article examines how the total cost of ICT ownership continues to change. It discusses the factors that a manufacturer should consider before making an investment.
專文 2012-08-24 |
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294 KB
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The Value of the in-Circuit Tester - Article Reprint
This article discusses how in-circuit testers for PCBAs can play a significant role to enhance product value and increase production efficiency for electronics manufacturers.
專文 2012-08-24 |
PDF
1.04 MB
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