Technical Support
Test & Measurement
Refine the List
By Application
By Type of Content
- Document Library
- Application Notes
- Application Note (942)
By Product Category
- Application Notes
1-25 of 942
|
USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the Agilent solution for the USB 2.0 test suite. The Agilent solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.
Application Note 2013-05-10 |
|
|
Using Microwave Switches When Testing High Speed Serial Digital Interfaces - Application Note
Many high speed digital interfaces use multiple lanes to achieve their system's throughput requirements. Most issues associated with this can be resolved with a switching network.
Application Note 2013-05-07 |
|
|
Increasing Manufacturing Throughput of Automotive Controllers - Application Note
This application note describes how automotive manufacturers can boost throughput using the Agilent TS-5400 Series 3 high performance PXI function test system for multiple devices under test.
Application Note 2013-04-18 |
|
|
Achieve Accurate Two Wire Resistance Measurements with the Agilent 34923A and 34924A Multiplexers -
This application note provides an overview of how to make an accurate two-wire resistance measurement with the Agilent 34980A and a multiplexer.
Application Note 2013-04-16 |
|
|
Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note
Noise figure is a key performance parameter in many RF systems. This application note covers many topics related to noise figure measurements including the Y-factor method.
Application Note 2013-04-12 |
|
|
Radar Distance Test to Airborne Planes - Application Note
Agilent pulse pattern generators are used for testing military radar communication systems, and as demonstrated in this publication, the aviation industry.
Application Note 2013-04-11 |
|
|
Tensile Testing of Fibers using Agilent T150 UTM Quasi-static Tensile Test
The Agilent T150 UTM is a specifically designed instrument to measure the tensile properties of wide range of fibers with small cross-sectional diameters. this application note discussed testing of various fibers
Application Note 2013-04-08 |
|
|
Three Compelling Reasons for Deep Acquisition Memory
This app note discusses deep memory's value. While acquisition memory depth is often used as a primary purchase consideration, the associated benefits require additional thought to fully appreciate.
Application Note 2013-03-14 |
|
|
How Much Indentation Testing is enough testing? - Application Note
Overview of how much testing is required to conclude a significant difference between two observation sets at a particular confidence level.
Application Note 2013-03-13 |
|
|
In Situ Young’s Modulus and Strain-Rate Sensitivity of Lead Free SAC 105 Solder - Application Note
Overview of how to improve the mechanical reliability of solder joints in integrated circuits, by instrumented indentation to measure the Young’s modulus (E) and strain-rate sensitivity (m) of a common lead-free solder alloy.
Application Note 2013-03-12 |
|
|
Evaluating Oscilloscope Fundamentals - Application Note
We will discuss oscilloscope applications and give you an overview of basic measurements and performance characteristics.
Application Note 2013-03-06 |
|
|
Graphene Studies: Utilization of Atomic Force Microscopy for Nanoscale Investigations of Graphene
Application Note 2013-03-04 |
|
|
Jitter Measurements on Long Patterns Using 86100DU-401 Advanced Waveform Analysis - Application Note
To overcome pattern length limitations found in many of today’s jitter analysis tools, Agilent developed a Microsoft Office Excel-based application called 86100DU Option 401 Advanced Waveform Analysis
Application Note 2013-02-21 |
|
|
Quality Measures for Complex Modulated Signals Reaching for Standardization - Application Note
Complex modulation is now being broadly accepted in optical data transmission. The app note investigates if the quality parameters are ready to be standardized and to replace traditional parameters.
Application Note 2013-02-19 |
|
|
Pulse Parameter Definitions - Application Note
Here you find the pulse parameter definitions of terms used in the instrument specifications of Pulse Pattern Generators. Model Nos: 81110A, 81111A, 81112A, 81150A, 81160A, 81130A, 81131A, 81132A, 81133A, 81134A, 81180B, M8190A
Application Note 2013-02-14 |
|
|
Optimize burn-in test with the Agilent 34980A multifunction switch/measure unit apnote overview
This application overview will discuss the complexities of burn-in test based on the Agilent 340980A switch/measure unit
Application Note 2013-01-31 |
|
|
Evolution of Dynamic Mechanical Properties of Nylon-PET Island-in-the-Sea Biocomponent Fibers
Study of mechanical properties of individual nylon-PET bicomponent IS fibers, with two different PET molecular weights, were characterized using the Agilent T150 UTM.
Application Note 2013-01-10 |
|
|
Rapid Hardness of Nano-Structured Metals - Application Note
A method to radiply characterize copper-nickel multilayers wherein inindividual layers vary in thickness between 1nm and 100nm is demonstrated and discussed.
Application Note 2013-01-03 |
|
|
34980A Measurements Made Easy
This document includes examples with the few steps needed to make measurements using the 34980A's 1) front panel, 2) built-in web interface, and 3) Command Expert software.
Application Note 2012-12-26 |
|
|
USB Coaxial Switches for RF & Microwave Test and Measurement Applications - Application Note
This application note describes features and application examples for the U1810B USB coaxial switch, with options for measuring multiple DUT or performing multiple tasks with a single connection.
Application Note 2012-11-28 |
|
|
Technical Paper for Kalman Filter Based Modulation Analysis
Technical paper for Kalman Filter Based Modulation Analysis.
Application Note 2012-11-28 |
|
|
Statistical Variation and Strain-Rate Sensitivity of the Mechanical Properties of Individual PET Fib
Overview of strain rate and sensitivity of PET fibers
Application Note 2012-11-14 |
|
|
Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity
Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity: How to Make the Most Accurate Digital Measurements When you select an oscilloscope for accurate, high-speed digital measurements, sampling fidelity can often be more important than maximum sample rate.
Application Note 2012-11-11 |
|
|
Potential of Low Voltage Scanning Electron Microscopy Use in Archaeology and History of Art
Application Note 2012-11-08 |
|
|
Evaluating Oscilloscope Bandwidths for your Application
This application note provides some helpful hints on how to select an oscilloscope with the appropriate bandwidth for analog and digital applications.
Application Note 2012-11-08 |
