Technical Support

Test & Measurement

Refine the List

By Application

Basics (271)
- Metrology (29)
- Instrument Security (2)
- Fundamentals (168)
- Instrument OS & Software (65)
Cellular (153)
- Long Term Evolution - LTE (26)
- LTE-Advanced (LTE-A) (5)
- HSPA & HSPA+ (11)
- W-CDMA (27)
- TD-SCDMA (2)
- GSM, GPRS, EGPRS & Evolved Edge (38)
- 1xEV-DO (9)
- cdma2000 / CDMA (16)
- Mobile Computing - MIPI (4)
- Femtocell (5)
- GNSS & A-GNSS (3)
- TDMA (13)
- 1G - Analog Technologies (24)
Wireless Connectivity (104)
- WiMAX™ (24)
- MIMO (16)
- Bluetooth (11)
- 802.11 WLAN (30)
- NFC / RFID Test (3)
- Ultra-Wideband (UWB) (7)
- ZigBee (1)
- Digital Video (12)
Aerospace & Defense (153)
- Radar Test & Electronic Warfare (EW) Test (40)
- Military Communications (23)
- Satellites (39)
- Signals Intelligence (SIGINT) (15)
- Avionics, Guidance, Navigation & GPS (9)
- ATE Applications (33)
- Operational Test (10)
Components & Specific Devices (217)
- Automotive (14)
- Fuel Cell Electrical Test (2)
- Solar Micro Inverter Testing (2)
- Solar Cells & Modules (5)
- Amplifiers (25)
- Batteries (14)
- Printed Circuit Boards (104)
- Antennas (11)
- Device Modeling and Characterization (1)
- Filters (1)
- Mixers, Frequency Converters (25)
- Oscillators (3)
Control & Automation (184)
- Manufacturing & Production Test (116)
- Build Your Own Test System (47)
- LXI - LAN eXtensions for Instruments (23)
Digital Design & Interconnect Standards (165)
- High-Speed Digital (102)
- DDR Memory (12)
- DisplayPort (6)
- Ethernet (4)
- Fibre Channel (3)
- HDMI (4)
- MHL (2)
- PCI Express® (18)
- Serial ATA (SATA) (13)
- Serial Attached SCSI (SAS) (6)
- USB (2.0/3.0/Wireless) (12)
RF & Microwave (211)
- RF & Microwave Design (15)
- X-parameters (4)
- Passive Intermodulation (PIM) (1)
- Noise Figure Measurements (18)
- Design & Test Integration (20)
- Pulsed-RF Measurements (12)
- EMI & EMC (9)
- Signal Monitoring, Geolocation (1)
- Impedance (30)
- ESL Design (16)
- Phase-Locked Loops (10)
Research & University (8)
- Advanced Research (3)
- Educator's Corner (4)
Optical & Photonic (59)
- Optical & Photonic (59)

By Type of Content

Document Library
- Application Notes
  - Application Note (2648)
  - Analysis Tool (11)
By Product Category
- Oscilloscopes, Analyzers, Meters (988)
  - Oscilloscopes (170)
  - Spectrum Analyzers (Signal Analyzers) (237)
  - Network Analyzers (200)
  - Handheld Oscilloscopes, Analyzers, Meters (24)
  - Logic Analyzers (61)
  - Protocol Analyzers and Exercisers (25)
  - EMI/EMC, Phase Noise, Physical Layer Test Systems (60)
  - Bit Error Ratio Test (BERT) Solutions (49)
  - Digital Multimeters (DMM) (68)
  - Power Meters & Power Sensors (42)
  - Frequency Counter Products (44)
  - Noise Figure Analyzers & Noise Sources (16)
  - LCR Meters & Impedance Measurement Products (85)
  - Digitizers (30)
  - DC Power Analyzers (25)
  - Dynamic Signal Analyzers, Materials Measurement (29)
  - Parameter & Device Analyzers, Curve Tracer (46)
- Generators, Sources, Supplies (406)
  - Signal Generators (Signal Sources) (145)
  - Function / Arbitrary Waveform Generators (60)
  - Pulse Generator Products (59)
  - Data Generators & Analyzers (56)
  - DC Power Supplies (104)
  - Source Measure Units (73)
  - DC Electronic Loads (16)
  - AC Power Sources / Power Analyzers (15)
- Software (387)
  - Agilent EEsof EDA Software (121)
  - Application Software for Instruments (239)
  - Instrument Control Software (26)
  - 89600 VSA Software (14)
  - Agilent VEE (19)
  - Wireless Test Managers (6)
  - EasyEXPERT software and Desktop EasyEXPERT software (2)
- PXI, AXIe, DAQ & Modular Solutions (204)
  - PXI Products & Solutions (64)
  - AXIe Products & Solutions (13)
  - Data Acquisition Modules - DAQ (71)
  - PCI/PCIe/cPCI/VME Digitizers (16)
  - USB Products & Solutions (27)
  - VXI Products & Solutions (58)
- Additional Test & Measurement Products (942)
  - Wireless Device Test Sets & Wireless Solutions (100)
  - In-circuit Test Systems - 3070 ICT (79)
  - Application-Specific Test Systems & Components (124)
  - Parametric Test Systems (40)
  - Photonic Test & Measurement Products (185)
  - Atomic Force Microscopes, FE-SEM, Nanoindenters, UTM (135)
  - Laser Interferometers & Calibration Systems (21)
  - GPIB, USB, Accessories, Racks (90)
- Services (30)
  - Calibration Services & Repair (29)
  - Application Engineering Services (1)

201-225 of 2659

Tips to Achieve PCIe Connectivity with your Agilent AXIe or PXIe Chassis Agilent's AXIe and PXIe chassis use PCIe as their primary communications link. Using the PCIe bus has many advantages such as availability of standard hardware, signaling methods and debug tools. Application Note 2012-07-07	PDF 876 KB
Spectrum and Signal Analysis Pulsed RF Application Note 150-2 This application note is intended as an aid for the operation of spectrum and signal analyzers and the interpretation of the displayed pulse spectra. Application Note 2012-07-05	PDF 12.46 MB Languages English \| 2012-07-05 \| PDF 12.46 MB 日本語 \| 2006-05-08 \| PDF 8.48 MB
Testing a Low-Noise Block Downcoverter-Feedhorn Application Note This application note provides an example of a LNBF test configuration using a CXA signal analyzer and illustrates how easy it is to perform tests and make measurements. Application Note 2012-07-05	PDF 2.05 MB
PXI Interoperability-How to Achieve Multi-Vendor Interoperability in PXI Systems The purpose of this application note is to impart confidence through knowledge, discussions,and demonstrations of smooth implementations amd coexistence of PXI HW, SW and related tools Application Note 2012-07-04	PDF 1.18 MB
U1051A Time to Digital Converter Application Note - Absolute Time Recovery Application Note 2012-07-01	PDF 1.19 MB
Accelerate Program Development using Agilent Command Expert with Labview This application note describes how to accelerate program development using Command Expert with LavbVIEW. Application Note 2012-06-29	PDF 1.32 MB
Solutions for Minimizing Measurement Uncertainty and Quick and Easy Estimation of Uncertainty Due to This application note presents a number of techniques that can be used to minimize mismatch uncertainty. Application Note 2012-06-29	PDF 3.25 MB Languages English \| 2012-06-29 \| PDF 3.25 MB 中文（简体） \| 2012-09-26 \| PDF 3.31 MB
Imaging Organic & Biological Materials with Low Voltage Scanning Electron Microscopy Application Note 2012-06-27	PDF 666 KB
Graphene Oxide & Its Applications Revealed by Atomic Force Microscopy Application Note 2012-06-27	PDF 305 KB
8 Hints for Making Better Measurements Using RF Signal Generators Application Note This application provides 8 hints for improving the accuracy of your measurements using RF signal generators. Application Note 2012-06-27	PDF 1.35 MB
Imaging Graphene via low-voltage Field Emission Scanning Electron Microscopy Application Note 2012-06-26	PDF 1007 KB
Different Contrast Mechanisms in SEM Imaging of Graphene Application Note 2012-06-26	PDF 380 KB
Simulating Power Supply Transients and Noise in the Satellite and Defense 5991-0655EN,satellite,defense,power supply transients and noise,aerospace/defense,defense,A/D Application Note 2012-06-19	PDF 1.24 MB Languages English \| 2012-06-19 \| PDF 1.24 MB 中文（简体） \| 2012-11-27 \| PDF 1.36 MB
Establishing Traceability for Quantities Derived from Multiple Traceable Quantities by Jian Liu Provides method of developing traceability for measurements (eg. phase noise) that have no SI units. Application Note 2012-06-15	PDF 1.83 MB
802.11ac Power Measurement and Timing Analysis - Application Note This technical article illustrates how Agilent 8990B peak power analyzer able to help technicians and engineers perform some of the test requirements when developing 802.11ac power amplifier module Application Note 2012-06-14	PDF 441 KB
Low Voltage Scanning Electron Microscopy: Promises and Challenges Application Note 2012-06-13	PDF 426 KB
Rapid Mechanical Characterization of Low-Dielectric-Constant Films This application note demonstrates the cumulative benefit of CSM and Express Test for Nanoindentation testing for in the semiconductor industry. Application Note 2012-06-12	PDF 448 KB
Accelerate Program Development using Agilent Command Expert with MATLAB Command Expert is a free software tool that enables fast and easy instrument control from PC applications. This application note focuses on the integration with MATLAB. Application Note 2012-06-05	PDF 3.44 MB
WiMAX Receiver Basics: Operation of a Dual Channel WiMAX Receiver The diagram shows a simplified version of a typical WiMAX™ mobile station (MS) receiver. The bold dashed lines indicate the major feedback loops. As we work through the design, we can identify how these impact testing. Application Note 2012-06-05
Conducting Site Surveys Using the N934xC Series Handheld Spectrum Analyzers This brief application note explains how the N9344C, N9343C, and N9342C handheld spectrum analyzers are an effective tool for measuring signal strength and performing a site survey. Application Note 2012-06-01	PDF 1.36 MB Languages English \| 2012-06-01 \| PDF 1.36 MB 日本語 \| 2012-10-31 \| PDF 4.12 MB
Testing New-generation Wireless LAN - Application Note This application note introduces the new WLAN new-generation testing technology of 802.11ac. Agilent's 802.11ac software allows engineers to view and troubleshoot all 802.11ac modulation formats. Application Note 2012-05-22	PDF 881 KB
SMM Imaging of Dopant Structures of Semiconductor Devices Application Note 2012-05-21	PDF 434 KB
Getting the Calibration You Need Test equipment calibration is an important part of ensuring the quality and performance of your end products. Application Note 2012-05-16	PDF 674 KB Languages English \| 2012-05-16 \| PDF 674 KB 中文（简体） \| 2012-08-19 \| PDF 391 KB 中文（繁體） \| 2012-09-20 \| PDF 888 KB 한국어 \| 2012-09-14 \| PDF 3.28 MB
Ten things to Consider when Selecting your Next Oscilloscope - Application Note You rely on your oscilloscope every day, so selecting the right one to meet your needs is an important task. Comparing specs and features of scopes made by different manufacturers can be time-consuming and confusing. The concepts outlined here are intended to speed your selection process and help you avoid some common pitfalls. No matter who makes the scopes you are considering, carefully analyzing each one in relation to the 10 issues discussed here will help you evaluate the instruments objectively. Application Note 2012-05-15	PDF 755 KB Languages English \| 2012-05-15 \| PDF 755 KB 中文（简体） \| 2004-03-01 \| PDF 906 KB 日本語 \| 2004-03-09 \| PDF 952 KB 한국어 \| 2004-06-18 \| PDF 1.50 MB Português \| 2010-07-31 \| PDF 939 KB
Innovative Passive Intermodulation (PIM) and S-parameter Measurement Solution with the ENA This application note introduces the solution that combines PIM and S-parameter measurements by using the vector network analyzer. Application Note 2012-05-09	HTML

Previous 1 2 3 4 5 6 7 8 9 10 ... Next

Technical Support

Test & Measurement

Refine the List

By Application

By Type of Content

By Product Category

201-225 of 2659

Products & Services

Technical Support

Applications & Solutions

About Agilent