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USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the Agilent solution for the USB 2.0 test suite. The Agilent solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.
应用说明 2013-05-10 |
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2.02 MB
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Using Microwave Switches When Testing High Speed Serial Digital Interfaces - Application Note
Many high speed digital interfaces use multiple lanes to achieve their system's throughput requirements. Most issues associated with this can be resolved with a switching network.
应用说明 2013-05-07 |
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2.90 MB
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Radar Distance Test to Airborne Planes - Application Note
Agilent pulse pattern generators are used for testing military radar communication systems, and as demonstrated in this publication, the aviation industry.
应用说明 2013-04-11 |
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904 KB
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Three Compelling Reasons for Deep Acquisition Memory
This app note discusses deep memory's value. While acquisition memory depth is often used as a primary purchase consideration, the associated benefits require additional thought to fully appreciate.
应用说明 2013-03-14 |
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1.71 MB
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Jitter Measurements on Long Patterns Using 86100DU-401 Advanced Waveform Analysis - Application Note
To overcome pattern length limitations found in many of today’s jitter analysis tools, Agilent developed a Microsoft Office Excel-based application called 86100DU Option 401 Advanced Waveform Analysis
应用说明 2013-02-21 |
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3.47 MB
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Pulse Parameter Definitions - Application Note
Here you find the pulse parameter definitions of terms used in the instrument specifications of Pulse Pattern Generators. Model Nos: 81110A, 81111A, 81112A, 81150A, 81160A, 81130A, 81131A, 81132A, 81133A, 81134A, 81180B, M8190A
应用说明 2013-02-14 |
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793 KB
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Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity
Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity: How to Make the Most Accurate Digital Measurements When you select an oscilloscope for accurate, high-speed digital measurements, sampling fidelity can often be more important than maximum sample rate.
应用说明 2012-11-11 |
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Bandwidth and Rise Time Requirements for Making Accurate Oscilloscope Measurements
How much oscilloscope bandwidth do you need and how fast does the rise time need to be to measure your signals accurately?
应用说明 2012-08-17 |
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942 KB
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正确理解测评示波器质量过程中所用的指标
For scopes with bandwidth in the GHz range, a quality metric involves characterizing the analog-to-digital converter (ADC) using effective number of bits (ENOB). How important is ENOB?
应用说明 2012-02-03 |
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为您的应用评测示波器带宽
This application note provides some helpful hints on how to select an oscilloscope with the appropriate bandwidth for analog and digital applications.
应用说明 2012-02-02 |
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SATA II Drive TX/RX Testing & Cable SI Testing Using the 86100C DCA-J (PN 86100-8)
Due to the inherent limitations of parallel
technology, SATA is expected to replace parallel ATA everywhere, and expand the use of ATA-based technology in the entry server and network storage market segments.
应用说明 2012-01-31 |
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2.73 MB
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Techniques to Reduce Manufacturing Cost-of-Test of Optical Transmitters, Flex DCA Interface
Agilent continues innovating test methodologies to assist manufacturing engineers in meeting or beating cost-of-test reduction goals.
应用说明 2011-12-22 |
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1.10 MB
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Techniques to Reduce Manufacturing Cost-of-Test of Optical Transmitters
Pressures to reduce costs as data rates rise means manufacturing engineering managers and their engineers must be more creative in how to reduce costs before their competitors do.
应用说明 2011-12-22 |
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1.20 MB
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How to Pass Receiver Test According to PCI Express® 3.0 CEM Specification
This paper provides insight into the calibration method and tests, as well as the tools available. The biggest change between PCIe 2.x and rev. 3.0 is that RX test on cards will now be normative.
应用说明 2011-11-30 |
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3.22 MB
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PCI Express Transmitter Electrical Validation and Compliance Testing - Application Note
This application note is intended for digital designers and developers validating electrical
performance of PCI Express-based designs and working toward electrical compliance of PCI Express products.
应用说明 2011-10-28 |
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1.01 MB
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Understanding The Oscilloscope Jitter Specifi cation
Jitter is defined as the unwanted phase modulation of a digital signal, and is considered one of the most important specifications for measuring a device's quality.
应用说明 2011-09-30 |
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581 KB
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Techniques for Higher Accuracy Optical Measurements
Learn techniques for high accuracy optical measurements using System Impulse Response Correction
应用说明 2011-09-21 |
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6.06 MB
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Advanced Techniques for PCIe 3.0 Receiver Testing-Paper
Advanced Techniques for PCIe 3.0 Receiver Testing-Paper
应用说明 2011-09-01 |
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2.20 MB
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Probing High-Speed Signals with the 86100 Series of Wide-Bandwidth Sampling Oscilloscopes (86100-6)
Product Note 86100-6 discusses three important measurement accessories that help make probe-based measurements both simple and accurate for the Agilent 86100 Wide-Bandwidth Oscilloscope.
应用说明 2011-07-28 |
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Accurate Calibration of Receiver Stress Test Signals for PCI Express® Rev. 3.0
This paper describes the calibration of the receiver-stress signal according to the base specification of PCIe3. The calibration of the RX test signal is different from PCIe 2.0.
应用说明 2011-06-22 |
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4.82 MB
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Eight Hints for Better Scope Probing
Probing is critical to making quality oscilloscope measurements, and often the probe is the
fi rst link in the oscilloscope measurement chain.
应用说明 2011-05-24 |
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Optimizing Oscilloscope Measurement Accuracy on High-Performance Systems with Agilent Active...
To keep high-speed devices supplied with data so they are not sitting idle, designers have been
inventing techniques to increase the bandwidth of external buses in order to move large amounts of
data between devices on circuit boards.
应用说明 2011-05-20 |
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An Overview of the Electrical Validation of 10BASE-T, 100BASE-TX, and 1000BASE-T
The technology used in these ports, commonly known as “LAN” or “NIC” ports, is usually one of the 10BASE-T, 100BASE-TX, and 1000BASE-T standards or a combination of them.
应用说明 2011-01-11 |
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1.21 MB
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Error Detection Up to 28.4 Gb/s During Receiver Test with the Agilent J-BERT
J-BERT N4903B pattern generation is extended up to 28.4 Gb/s with second channel Option 002 and N4876A 2:1 Mux. The single 12.5 Gb/s ED can easily be used during RX test utilizing under-sampling.
应用说明 2010-09-16 |
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3.32 MB
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MOI for SATA RSG Tests, SATA Interoperability Program rev. 1.4 - Sep 2009
MOI for SATA RSG Tests, SATA Interoperability Program rev. 1.4 - Sep 2009
应用说明 2009-09-17 |
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2.12 MB
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