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安捷伦参数分析仪与器件分析仪、曲线追踪仪

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使用 B1505A 评估 GaN 电流崩塌效应
使用 B1505A 评估 GaN 电流崩塌效应

应用说明 2014-02-12

The Impedance Measurement Handbook-4th Edition - Application Note
This 140 page handbook is Agilent Technologies's most detailed information on the basics of impedance measurements using Agilent Technologies's LCR meters and impedance analysers. It provides the theory, test set-upinformation, error discussion, etc.

应用说明 2013-09-10

Agilent B1505A 支持高达 1500 A和 10 kV 的 IGBT 表征
This application note explains how to use the B1505A Power Device Analyzer / Curve Tracer to measure typical DC parameters found in IGBT specifications.

应用说明 2012-10-20

1500 A and 10 kV MOSFET Characterization using the Agilent B1505A - Application Note
This application note explains how to use the B1505A Power Device Analyzer / Curve Tracer to measure typical DC parameters of high-power MOSFETs.

应用说明 2012-08-27

Measuring Power BJT Electrical Characteristics using the B1505A - Application Note
B1505A can measure the typical DC and capacitance parameters of power BJT devices.

应用说明 2011-08-30

PDF PDF 493 KB
Measuring Power MOSFET Electrical Characteristics using the B1505A
This application note explains how to use the B1505A to measure the typical DC and capacitance parameters of power MOSFET devices.

应用说明 2011-08-22

PDF PDF 651 KB
CMOS图像传感器中的随机噪声特征分析 应用指南B1500-11
该应用指南介绍了如何利用B1500A的WGFMU模组测量RTS噪声

应用说明 2011-04-27

使用Agilent B1500A之WGFMU模组在极速1μs瞬间对负偏压温度不稳定性(NBTI)进行特征分析 应用指南B1500-10
该应用指南介绍了如何使用Agilent B1500A之WGFMU模组在极速1μs瞬间对负偏压温度不稳定性(NBTI)进行特征分析

应用说明 2011-04-27

CMOS可靠性测试完全解决方案 应用指南B1500-17
CMOS可靠性测试完全解决方案 应用指南B1500-17

应用说明 2011-04-27

使用Agilent B1500A 分析仪测试CNT FET和CNT SET 应用指南 B1500-1
使用Agilent B1500A 分析仪测试CNT FET和CNT SET 应用指南 B1500-1

应用说明 2011-01-28

AN B1505A-4 Direct Power MOSFET Capacitance Measurement at 3,000 V
This application note describes direct capacitance measurement at a 3,000 V bias voltage by using the Agilent B1505A.

应用说明 2011-01-10

PDF PDF 1.14 MB
超低直流电流MOSFET晶圆级表征 应用指南 B1500-15
此应用指南描述了如何利用 B1500A 的超低电流测量能力,对 MOSFET 器件的亚阈值特性进行精确测量。

应用说明 2010-12-09

使用Agilent B1500A EasyEXPERT 软件创建测试序列
此应用指南通过 12 页的说明,展示了如何使用 CMOS 类别的测试创建测试序列。文中使用了完整的 EasyEXPERT“Id-VD”和“Vth gmMax”应用测试定义作为示例。

应用说明 2010-12-01

用Agilent B1500A MFCMU和SCUU进行IV 和CV 测量应用指南
用Agilent B1500A MFCMU和SCUU进行IV 和CV 测量应用指南

应用说明 2010-06-01

用带纳米探针的Agilent B1500A 进行失效分析 应用指南B1500-7
用带纳米探针的Agilent B1500A 进行失效分析 应用指南B1500-7

应用说明 2010-06-01

B1500A: CMOS 器件电性表征的全面解决方案
B1500A: CMOS 器件电性表征的全面解决方案

应用说明 2010-06-01

用Agilent B1530A表征闪存单元的1 μs IV 特性 应用指南B1500-12
用Agilent B1530A表征闪存单元的1 μs IV 特性 应用指南B1500-12

应用说明 2010-06-01

AN B1500A-2 Migrating from the Agilent 4155C and 4156C to the Agilent B1500A
This application note presents the B1500A's major features with EasyEXPERT 4.0 software and explains the differences and similarities with respect to the 4155C and 4156C.

应用说明 2010-04-02

使用 B1500A 对太阳能/光伏电池进行 B1500-14 IV 和 CV 表征
本应用指南介绍了如何使用 B1500A 测量各种太阳能电池的特征。

应用说明 2010-04-01

AN B1505-3 Precision Power Device Evaluation at 40 Amps
This application note introduces 40A IV measurement application for power devices by using two HCSMUs installed in the B1505A.

应用说明 2010-02-24

AN B1505-2 Next Generation Curve Tracer Revolutionizes Failure Analysis
This application note describes how the B1505A enable for checking device operation and failure analysis using curve tracer mode.

应用说明 2010-01-08

AN B1505-1 Accurate and Efficient Characterization of Power Devices at 3000 V/20 A
This application note describes how to perform accurate and efficient characterization of power devices up to 3000 V/20 A by using the B1505A.

应用说明 2009-11-18

PN B1500-1 Pulse/arbitrary waveform generator with integrated measurement capabilities
The Agilent B1530A WGFMU is a pulse/arbitrary waveform generator with fast current or voltage sampling capabilities. This product note introduces various measurement applications enabled by unique features of the WGFMU.

应用说明 2009-10-16

Product Note B1505A-1 Creating Custom Socket Modules
This product note describes the procedure to develop custom socket modules for B1505A Power Device Analyzer/Curve Tracer to measure packaged power devices such as SMD which are not supported by an inline package.

应用说明 2009-09-09

AN B1500-13 Measuring Pulsed/Transient Electrical Properties of OTFTs
This 12-page application note describes how to measure pulsed / transient electrical property of OTFT without additional measurement instruments.

应用说明 2009-05-18

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