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Agilent Technologies to Showcase Custom OFDM Waveform Design at 2010 Wireless Innovation Forum
Agilent Technologies will demonstrate the latest design and test innovations for software-defined radio (SDR) at the 2010 Wireless Innovation Forum, Dec.1-2, in Washington, D.C.

Dossier de presse 2010-12-01

Agilent Technologies Wins Informa LTE North America Award
Moray Rumney, the lead technologist specializing in LTE at Agilent, has won the Informa LTE North America 2010 award for individual contribution to LTE development.

Dossier de presse 2010-11-17

Understanding Emerging Measurement Requirements for Battery-Powered Devices
Backgrounder

Dossier de presse 2010-11-09

Agilent Expands Source Measure Unit Offering to Meet Emerging Market Requirements
Press Release

Dossier de presse 2010-11-09

Agilent Technologies and Nomor Research GmbH Generate LTE Uplink Inter-cell Interference Signals
Agilent Technologies Inc. (NYSE: A) and Nomor Research GmbH today announced the availability of a simple, cost-effective method for generating realistic LTE uplink inter-cell interference signals using Agilent's MXG signal generators.

Dossier de presse 2010-10-22

Analysis software sets stage for next-gen communications schemes

Dossier de presse 2010-10-12

Agilent’s New Option for RF and Microwave Signal Generators
Offers Industry's Lowest Close-in, Pedestal Phase Noise

Dossier de presse 2010-10-04

Agilent Now Supports Real-Time Fading with PXB and Wireless Communications Test Set

Dossier de presse 2010-10-01

Agilent Technologies Now Supports Real-Time Fading with PXB and Wireless Communications Test Set
Agilent Technologies Inc. (NYSE: A) today introduced a real-time 2G/3G fading solution that features a direct digital connection between the N5106A PXB baseband generator and channel emulator and E5515C 8960 wireless communications test set.

Dossier de presse 2010-09-28

Agilent Introduces Next-Generation Vector Signal Analysis Software

Dossier de presse 2010-09-28

Agilent’s New X-Series Options Deliver Wider Bandwidth, Faster Speed, More Measurement Capabilities

Dossier de presse 2010-09-28

Agilent Technologies Begins Unveiling ADS 2011 for Multi-Technology
Agilent Technologies Inc. announces the highly anticipated next release of its Advanced Design System (ADS) flagship RF design software.

Dossier de presse 2010-09-22

Agilent | Agilent Technologies and Innofidei Announce Joint Development of RF Tests for TD-LTE Chips
The test development is based on the 3GPP LTE specifications, Innofidei’s TD-LTE test requirements, included Agilent’s N5182A signal generator and N9020A signal analyzer and followed the 3GPP LTE standard chapter 6 and 7 TX / RX characteristics.

Dossier de presse 2010-09-15

U7246A Press Release
U7246A Press Release

Dossier de presse 2010-09-14

Agilent E2980A ASI Protocol Exerciser/Analyzer - joins the ASI-SIG World Tour
Agilent E2980A ASI Protocol Exerciser/Analyzer – joins the ASI-SIG World Tour for an additional 4 stops

Dossier de presse 2010-09-09

Agilent Technologies Receives Global Award for Product Line Strategy in the Microwave Test Equipment
Agilent Technologies Inc. (NYSE: A) today announced it's being named the recipient of the Frost & Sullivan's 2010 Global Award for Product Line Strategy in the Microwave Test Equipment Market.

Dossier de presse 2010-09-08

Agilent Technologies Launches Measurement Applications, Expands LTE Leadership
Agilent Technologies Inc. (NYSE: A) today introduced eight new measurement applications for its PXA X-Series signal analyzer.

Dossier de presse 2010-09-01

Agilent Technologies' New LTE Base-Station Emulator Speeds Development and Verification of LTE User
Agilent Technologies Inc. (NYSE: A) today announced the PXT Wireless Communications Test Set, a powerful, common hardware test platform for use across the LTE development lifecycle.

Dossier de presse 2010-09-01

Agilent Press Releases

Dossier de presse 2010-08-31

Agilent Introduces IC-CAP WaferPro Software for Automating Complex Device Modeling Applications
IC-CAP WaferPro provides a multi-site, multi-wafer, automated DC and RF measurement solution for semiconductor device modeling applications.

Dossier de presse 2010-08-19

WIN Semiconductors Announces updated ADS Desktop DRC support in its PDKs for ADS
WIN Semiconductors Press Release

Dossier de presse 2010-08-13

Handheld Spectrum Analyzer Makes Infield Measurements Easier, Faster

Dossier de presse 2010-08-02

Agilent Introduces Industry's First Pre-compliance Test Solution to Reduce Test Margins

Dossier de presse 2010-07-16

Introduces Industry's First Pre-compliance Test Solution to Reduce Test Margins
Agilent Introduces Industry's First Pre-compliance Test Solution to Reduce Test Margins, Ensure Devices Meet Regulatory Limits

Dossier de presse 2010-07-15

Boundary Scan Press Releases

Dossier de presse 2010-07-14

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