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85070M Dielectric Probe Measurement System, 3 GHz [Obsolete]
The Agilent 85070M is a fully configured materials measurement system consisting of the Agilent 85070B dielectric probe kit, network analyzer, cable, probe stand, and pre-configured Agilent Vectra PC.
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Accessories and supplementary products for BERTs and Pulse Pattern Generators
Selected accessories for Agilent ParBERT 81250, N4900 Serial BERT Series and Pulser
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AXIe Chassis & Controllers
Build high-performance AXIe test systems by starting with Agilent AXIe chassis and controllers.
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B2900A Series Precision Source/Measure Units (SMU)
B2900A Series Precision Source / Measure Units are cost-effective source/measurement solution offering superior performance and a best-in-class graphical user interface. Their broad range, excellent precision and usability enable quick test, debug...
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Calibration Solutions
Agilent offers many types of calibration solutions: complete calibration systems for RF and microwave instruments, calibration software, and in-line calibration correction systems
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Handheld Digital Multimeter, Clamp and Calibrator Meters
Agilent handheld multimeter and clamp meter products enable you to check more wide measurement ranges and delivers more value than any other in its class.
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Oscilloscope passive probes
Oscilloscope passive probes
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P-Series Power Meters
The Agilent P-Series power meters provide wideband (30 MHz video bandwidth) peak, average, peak-to-average ratio, maximum power, minimum power, rise time, fall time and statistical (CCDF, PDF) measurements.
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PXI Multiplexers
Deliver high-speed signal routing of many different channels to a single point
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10780C Receiver
A highly-sensitive, low-cost receiver used with laser interferometer positioning systems.
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10780F Remote Receiver
Remote receiver offers fiber-optics pickups for maximum layout flexibility in laser interferometer positioning systems.
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10790B Receiver Cable (10 m)
10 meter Receiver cable connects 10780C/F receiver to 10895A laser axis board for VME bus and 5527B laser positioning transducer system.
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5530 Laser Calibration System
The Agilent 5530 Laser Calibration System offers the highest accuracy available for measuring, calibrating and validating precision machine tool and coordinate-measuring-machine (CMM) equipment.
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83018A Microwave System Amplifier, 2 GHz to 26.5 GHZ
The Agilent 83018A microwave system amplifier is a compact, off-the-shelf amplifier designed for systems designers and integrators.
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83496B Optical/Electrical Clock Recovery Module With Phase Noise Analysis Capability
The 83496B Clock Recovery Module with Phase Noise Analysis provides increased eye-mask and jitter measurement accuracy with breakthrough performance in clock recovery circuitry.
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85056KE01 Standard Mechanical Calibration Kit, DC to 40 GHz, 2.92 mm
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85056KE02 Economy Mechanical Calibration Kit, DC to 40 GHz, 2.92 mm
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86100DU-400 Phase Locked Loop (PLL) and Jitter Spectrum Measurement Software
Phase Locked Loop (PLL) and Jitter Spectrum Measurement Software
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8762F Coaxial Switch, DC to 4 GHz, SPDT, 75 Ohms
The Agilent 8762F brings a new standard of performance to 75-ohm coaxial components.
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8765F Coaxial Switch, DC to 4 GHz, SPDT, 75 Ohms
The 8765F brings a new standard of performance to 75-ohm coaxial components and is designed for ATE switching systems.
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88000 HS-100 High Speed and Sensitivity Array Test System
Provides full thin film transistor (TFT) array testing of LTPS LCDs AM-OLEDs used in manufacturing FPDs. Proven solution for leading FPD manufacturers
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B1505AP Pre-configured Power Device Analyzer / Curve Tracer (B1505A with modules and fixture)
B1505AP provides eight different pre-configured packages that satisfy a wide variety of power device measurement requirements. The package can be selected according to voltage / current range and the requirement for capacitance measurement.
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B2200A fA Leakage Switch Mainframe
High-performance switching matrix, located between the semiconductor parameter analyzer and the wafer, reduces cost of test through characterization test automation.
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B2201A 14ch Low Leakage Switch Mainframe
High-performance switching matrix, located between the semiconductor parameter analyzer and the wafer, reduces cost of test through characterization test automation.
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E1708A Remote Dynamic Receiver
The Agilent E1708A Remote Dynamic Receiver is designed for use in demanding applications requiring sub-nanometer resolution of systems in motion...
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