Limited Access Test Products The Super 7 Suite

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CET awards

The world of electronics assembly continues to see complex packages, connectors and new high speed devices piled onto shrinking PCB real estate. It's more critical than ever to take stock of your In-Circuit Test needs to prepare for the future. Agilent's Super 7 suite of award-winning, limited-access test innovations are tools that can help you stay competitive:

  1. Cover-Extend Technology
  2. Bead Probe Technology
  3. IEEE 1149.1 InterconnectPlus Boundary Scan
  4. IEEE 1149.6 Boundary Scan
  5. Silicon Nails
  6. DriveThru
  7. Access Consultant

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Still using Agilent's old TestJet technology? It's time to upgrade to the highly versatile and powerful VTEP v2.0 Powered vectorless test suite!

Looking for a low-cost In-Circuit tester with digital capability? See our latest test system i1000D

click to collapse this panelMore Information

  • Access Consultant Access Consultant
    Software that ties all the different limited-access tools together to let you better manage which strategy suits your needs better
  • Bead Probe Technology Bead Probe Technology
    Increase test access even on high-speed traces and space-constrain PCBAs. Its layout independent nature means that trace-routing is not disrupted with the addition of bead probes unlike how test pads do
  • Cover-Extend Technology Cover-Extend Technology
    Hybrid technology between the VTEP vectorless capacitive coupling technology and boundary scan.
  • DriveThru DriveThru
    Used in conjunction with VTEP, DriveThru gives the user the ability to test both a device pin and the passive component leading to the device pin with just 1 test point
  • IEEE 1149.1 InterconnectPlus Boundary Scan IEEE 1149.1 InterconnectPlus Boundary Scan
    Compliant to the IEEE 1149.1 standard, this Agilent boundary-scan solution provide a fast, automated pass/fail test along with pin-level diagnostics for speedy repair.
  • IEEE 1149.6 Boundary Scan IEEE 1149.6 Boundary Scan
    Extend boundary scan to test high-speed AC-coupled differential signals in accordance to IEEE
  • Silicon Nails Silicon Nails
    Test non-boundary scan devices by using devices which are boundary scan-enabled to act as driver/receivers.