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Description
Agilent's Medalist i3070 in-circuit testers offer a suite of Boundary Scan test capabilities that support the testing of IEEE 1149.6-compliant devices.
Boundary Scan relies on the IEEE 1149.x/JTAG standards to address limited test access to increasingly dense and complex printed circuit boards (PCB). With Integrated Circuit (IC) chips becoming larger as well, tight routing and breakout areas have become the norm. Test access with the traditional method of creating test points has just become almost impossible without compromising signal integrity. Boundary Scan helps to answer this challenge.
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