J-BERT N4903A High-Performance Serial BERT with complete jitter tolerance testing

J-BERT N4903B High-performance Serial BERT The only complete jitter tolerance test – now for next generation of forwarded and embedded clock designs such as QPI, HyperTransport, PCIe, DisplayPort, SATA, USB, FB-DIMM, Fibre Channel, 10GbE.

The Agilent J-BERT N4903A High-Performance Serial BERT provides the only complete jitter tolerance test solution for characterization of serial gigabit devices.

The J-BERT offers complete, integrated and calibrated jitter composition for stressed eye testing of receivers up to 12.5 Gb/s.

Automated and compliant jitter tolerance testing allows quick and accurate characterization for all popular serial bus standards, such as PCIe^TM, SATA, FB-DIMM, Fibre Channel, CEI, Gigabit Ethernet and XFP/XFI.

The J-BERT matches to latest serial bus interfaces perfectly with its ability to analyze undeterministic traffic, generate complex pattern sequences, subrate clock outputs. Clockless and differential interfaces can be tested.

The J-BERT is an expandable, future-proof BERT platform where all options can be configured to the current test needs and upgraded later when those needs change.

It is the ideal choice for R&D and validation teams who characterize and stress chips and transceiver modules with serial I/O ports up to 12.5 Gb/s.

Read the latest press releases

Clean Eye	Eye Diagram/Contour/Mask

Stressed Eye	Automated Jitter Tolerance

Fastest Total Jitter	Jitter Composition

Have a look at the Animated J-BERT Overview

• Operating range 150 Mb/s to 7 Gb/s or to 12.5 Gb/s provides enough margin for today’s and tomorrows serial interfaces
• >0.5 UI jitter injection. Calibrated and integrated jitter injection (opt. J10, J20). All in one box: PJ, SJ, RJ, BUJ, ISI and sinusoidal interference for stressed eye test of a receiver
• Cleanest eyes with transition times <20 ps and <9 ps pp jitter for accurate measurements
• Pattern generator options for 7Gb/s and 12.5Gb/s
• Best match for serial interfaces: Built-in CDR, differential I/Os
• Clock data recovery (CDR) operates at 1Gb/s to 12.5 Gb/s and tunable loop bandwidth (option CTR) for compliant measurements
• Subrate clocks with any ratio 1:n
• Bit recovery mode (opt. A01) to analyze undeterministic traffic
• Pattern sequencer and capture to simplify handling of complex data patterns
• External Delay Control Input for injection of any external jitter
• Automated jitter tolerance characterization and compliance tests
• SSC - Spread Spectrum Clocking (opt. J11)
• Jitter tolerance compliance (opt. J12) testing : PCIe^TM, SATA, Fibre Channel, FB-DIMM, CEI, 10 GbE, XFP/XFI
• Fast Total Jitter measurement
• All options upgradeable

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