|
B2201A 14ch Low Leakage Switch Mainframe |
10 fA
|
8 / 6 |
48
|
Under 300 fA in 2 seconds |
30 MHz
|
Making parametric measurements on a semi-automatic wafer prober with a probecard |
• Front panel operation • Lighted relay status display • 14 internal paths • 4-SMU Kelvin support |
|
E5250A Low-Leakage Switch Mainframe (using E5255A cards) |
20 fA
|
6 / 3 (per card) |
96
|
n/a |
n/a
|
Performing long-term stress testing |
• 6 internal paths |
|
E5250A Low-Leakage Switch Mainframe (using E5252A cards) |
20 fA
|
6 / 4 |
48
|
Under 400 fA in 3.5 seconds |
10 MHz
|
Making parametric measurements on a semi-automatic wafer prober with a probecard |
• 6 internal paths |
|
B2200A fA Leakage Switch Mainframe |
1 fA
|
8 / 6 |
48
|
Under 50 fA in 2 seconds |
30 MHz
|
Making parametric measurements on a semi-automatic wafer prober with a probecard |
• Front panel operation • Lighted relay status display • 14 internal paths • 4-SMU Kelvin support |
