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Parameter & Device Analyzer, Curve Tracer

The Agilent Device Analyzer Series provides both traditional and task-oriented approaches to device characterization to meet the complex challenges faced by modern users. Able to completely replace our older 4145, 4155 and 4156 parameter analyzers, the B1500A has additional hardware and software features that enable both novice and advanced users to efficiently and effectively characterize advanced semiconductor processes and devices. For high-power device testing needs, the B1505A provides a one-box solution for high-current, high-voltage and high DC bias capacitance measurement.

In addition, both the B1500A and B1505A support a curve tracer mode with true knob sweep control for real-time interactive device measurement.

  • B1500A Semiconductor Device Analyzer B1500A Semiconductor Device Analyzer 

    B1500A Semiconductor Device Analyzer

    In addition to IV measurement of parameter analyzer, semiconductor device analyzer provides integrated CV and pulse measurements from a touch-screen interface.

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  • B1505A Power Device Analyzer / Curve Tracer B1505A Power Device Analyzer / Curve Tracer 

    B1505A Power Device Analyzer / Curve Tracer

    A single box solution for power device evaluation from sub-pA to 10 kV & 1500 A. Precise measurement capabilities with 10 µs pulse and µΩon-resistance measurements.

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  • B1505AP Pre-configured Power Device Analyzer / Curve Tracer (B1505A with modules and fixture) [Preliminary] B1505AP Pre-configured Power Device Analyzer / Curve Tracer (B1505A with modules and fixture) [Preliminary] 

    B1505AP Pre-configured Power Device Analyzer / Curve Tracer (B1505A with modules and fixture) [Preliminary]

    Pre-configured package solutions for various power device characterization solutions.

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  • Modular SMU Series (E5270B, E5260A, E5262A and E5263A) Modular SMU Series (E5270B, E5260A, E5262A and E5263A) 

    Modular SMU Series (E5270B, E5260A, E5262A and E5263A)

    A flexible family of products, with solutions for both precise parametric measurement of semiconductor devices and high speed testing of components (E5260A, E5262A, E5263A and E5270B).

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  • Low-leakage Switch Matrix Mainframes (B2200A/B2201A/E5250A) Low-leakage Switch Matrix Mainframes (B2200A/B2201A/E5250A) 

    Low-leakage Switch Matrix Mainframes (B2200A/B2201A/E5250A)

    Low-leakage switch mainframe solutions, positioned between the semiconductor parameter analyzer and the wafer, reduce cost of test through characterization test automation (B2200A, B2201A and E5250A).

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  • EasyEXPERT software and Desktop EasyEXPERT software EasyEXPERT software and Desktop EasyEXPERT software 

    EasyEXPERT software and Desktop EasyEXPERT software

    EasyEXPERT software & Desktop EasyEXPERT software provide powerful new parametric measurement capabilities. The latest version of EasyEXPERT software now includes over 230 application tests, conveniently organized by device type and function.

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  • B1505A Power Device Analyzer / Curve Tracer Series B1505A Power Device Analyzer / Curve Tracer Series 

    B1505A Power Device Analyzer / Curve Tracer Series

    A single box solution for power device evaluation from sub-pA to 10 kV & 1500 A. Precise measurement capabilities with 10 µs pulse and µΩon-resistance measurements.

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Discontinued and Obsolete Parametric Test Equipment [Discontinued]
4155C, 4156C, 41000 Series, N9201A, 4070 Series, 4140B, 4142B, 4145A/B, 4155A, 4156A, 41501A, 4155B, 4156B, 4157A, 4157B,4280A, E5270A, E5272A, and E5273A

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