Bit Error Ratio Test (BERT) Solutions
High-performance BERTs for accurate and efficient characterization up to 13.5 Gb/s
Agilent's Bit Error Ratio Test solutions allow the most accurate and efficient design verification, characterization and manufacturing test of high-speed communication ports for today's (semiconductor products) chips, components, modules and line-cards in the semiconductor, computation and communication industry.
Agilent offers the broadest portfolio with two BERT families that address a variety of speed classes, usability concepts, and flexibility as well as application specific stimulus and analysis tools. Both families provide cost-effective and efficient in-depth insight into critical measurement tasks for today's and next generation devices with gigabit interfaces, such as PCI Express®, SATA, Fibre Channel, FB-DIMM, XAUI/10Gb Ethernet, CEI, XFI/XFP, SONET/SDH, PON-OLTs.
| Clean Eye | Eye Contour |
|---|---|
![]() |
![]() |
| Spectral Jitter | BERT Scan |
![]() |
![]() |
In combination with Agilent 86100 Infinium DCA-J these BERTs are the most comprehensive and accurate jitter tolerance and analysis solution available. Infiniium DCA-J
J-BERT awards: J-BERT's technology leadership has been honored by our customers and key technical publications with several product awards. Read more
-
ParBERT 81250
ParBERT 81250
Modular BERT platform for accurate characterisation of multi-port gigabit devices
-
Serial BERTs
Serial BERTs
Parametric test capabilities for design verification and characterization of serial devices at frequency ranges from 150 Mb/s up to 13.5 Gb/s
-
Applications for BERTs and Pulse Pattern Generators
Applications for BERTs and Pulse Pattern Generators
Enabling the next generation of multi-gigabit links
-
Agilent BERT and Pulser Accessories
Agilent BERT and Pulser Accessories
Selected accessories for Agilent ParBERT 81250, N4900 Serial BERT Series and Pulser
-
Electrical and Optical Clock Data Recovery Solutions
Electrical and Optical Clock Data Recovery Solutions
Wide bandwidth instrumentation-grade clock data recovery for physical layer characterization and validation
Bit Error Ratio Test (BERT) Solutions [Discontinued]
Product information and resources for discontinued bit error ratio testers and accessories.
-
Subscribe to Latest News
Agilent Test & Measurement RSS Feeds -
Receive Email Updates
Stay current with customized product, support and application information -
Register Your Product
Register your products for service notifications, firmware update alerts, application notes and more… -
Why Buy Agilent
See how the Agilent Advantage adds value to your purchase.




