In-circuit Test > Medalist i3070

The E9903E offers max 5184 nodes testing plus the new Series 5 infrastructure for flexible external electronics connection and higher analog testing throughput

The E9902E offers max 2592 nodes testing plus the new Series 5 infrastructure for flexible external electronics connection and higher analog testing throughput

The E9905E offers max 2592 nodes testing plus the new Series 5 infrastructure for flexible external electronics connection and higher analog testing throughput

The E9901E offers max 1296 nodes testing plus the new Series 5 infrastructure for flexible external electronics connection and higher analog testing throughput

A 4-module ICT system that provide the highest node count coverage of the i3070 family for today’s complex electronic assemblies.

A two module option of the i3070 ideal for customers who require less node count capability. Easily upgradeable to a full 4 module system.

A small footprint version of the i317x suited for customers who have space constraints. Power supply is fitted internally for maximum space savings.

For customers who want the best ICT solution for small node count boards.

Agilent Test Coverage Consultant reads CAD layout files to generate a predictive test coverage report with PCOLA-SOQ metrics, doing away with the need of completing the tedious test development process before determining what is tested.

TestSight Developer is the most cost effective CAD conversion solution in the market for Agilent Medalist i3070 and Medalist i1000. It offers fast and accurate CAD conversion, and supports numerous CAD formats.

Professional, localized uptime support and end-to-end services that address real-world manufacturing challenges.