Passive Optical Network (PON) Test Solution

Product Status:	Currently Orderable \| Currently Supported

Key Specifications

Sequence Editor to generate and control burst packages
Exact burst timing control for e.g. TDMA
Controllable pre-amble state
Adjustable signal delay
Automatic cell synchronization
Operating range: 20.8 Mb/s to 3.3 Gb/s
True differential data generation and analysis (incl. LVDS)
Superior waveform and signal quality

Data Sheet
2008-12-04 | PDF 11.71 MB

Description

Fully flexible and cost-effective test solution for PON transceivers

The expansion of passive optical networks (PON) leads to an increasing demand on components for FTTx and triggered the need for cost-effective testing.

PON Image

Exact timing of data burst is essential for standard compliant testing of OLTs and ONUs, e.g. to control the laser timing or the upstream broadcast with time division multiple access (TDMA) used by GPON and BPON. Agilent’s ParBERT 81250 provides with its pattern sequencer an exact burst timing control for multiple channels.

ParBERT 81250 in combination with Agilent’s Lightwave Multimeter System (LMS) 8163B/8164B and Digital Communication Analyzer (DCA) 81600C is a fully flexible test system configuration for electrical and optical testing. PnP drivers provided with these instruments allow an easy and comfortable programming of a wide range of measurements from optical power vs. BER to mask tests and jitter measurements.

The Application Note “Physical Layer Testing of Passive Optical Network (PON) Modules” describes PON testing with ParBERT 81250, LMS 8163B and 81600C DCA-J in detail. It is available for download in the library section.